{"id":"https://openalex.org/W2024498377","doi":"https://doi.org/10.1145/1391469.1391696","title":"DFM in practice","display_name":"DFM in practice","publication_year":2008,"publication_date":"2008-06-08","ids":{"openalex":"https://openalex.org/W2024498377","doi":"https://doi.org/10.1145/1391469.1391696","mag":"2024498377"},"language":"en","primary_location":{"id":"doi:10.1145/1391469.1391696","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1391469.1391696","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 45th annual Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088893002","display_name":"Juan C. Rey","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]},{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]}],"countries":["HU","US"],"is_corresponding":true,"raw_author_name":"Juan C. Rey","raw_affiliation_strings":["Mentor Graphics Corporation, San Jose, CA","Mentor Graphics Corporation, San Jose, CA#TAB#"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, San Jose, CA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics Corporation, San Jose, CA#TAB#","institution_ids":["https://openalex.org/I105695857"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113645794","display_name":"N.S. Nagaraj","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"NS Nagaraj","raw_affiliation_strings":["Texas Instruments, Dallas, Texas","[Texas Instruments, Dallas, Texas]"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Dallas, Texas","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"[Texas Instruments, Dallas, Texas]","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073558386","display_name":"Andrew B. Kahng","orcid":"https://orcid.org/0000-0002-4490-5018"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew Kahng","raw_affiliation_strings":["UCSD, San Diego, CA"],"affiliations":[{"raw_affiliation_string":"UCSD, San Diego, CA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021465692","display_name":"F. Klass","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Fabian Klass","raw_affiliation_strings":["P. A. Semi, Santa Clara, CA"],"affiliations":[{"raw_affiliation_string":"P. A. Semi, Santa Clara, CA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110824648","display_name":"Rob Aitken","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156213","display_name":"American Rock Mechanics Association","ror":"https://ror.org/05vfrxy92","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210156213"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rob Aitken","raw_affiliation_strings":["ARM, Sunnyvale, CA"],"affiliations":[{"raw_affiliation_string":"ARM, Sunnyvale, CA","institution_ids":["https://openalex.org/I4210156213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041821882","display_name":"Cliff Hou","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]},{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Cliff Hou","raw_affiliation_strings":["TSMC, Hsinchu, Taiwan","[TSMC, HsinChu, Taiwan]"],"affiliations":[{"raw_affiliation_string":"TSMC, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"[TSMC, HsinChu, Taiwan]","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002751928","display_name":"Luigi Capodieci","orcid":null},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]},{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Luigi Capodieci","raw_affiliation_strings":["AMD, Sunnyvale, CA","AMD, Sunnyvale, CA#TAB#"],"affiliations":[{"raw_affiliation_string":"AMD, Sunnyvale, CA","institution_ids":["https://openalex.org/I4210137977"]},{"raw_affiliation_string":"AMD, Sunnyvale, CA#TAB#","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103138493","display_name":"Vivek K. Singh","orcid":"https://orcid.org/0000-0002-2964-4817"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Vivek Singh","raw_affiliation_strings":["INTEL, Hillsboro, Oregon"],"affiliations":[{"raw_affiliation_string":"INTEL, Hillsboro, Oregon","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5088893002"],"corresponding_institution_ids":["https://openalex.org/I105695857","https://openalex.org/I4210156212"],"apc_list":null,"apc_paid":null,"fwci":0.8249,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.76834862,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"898","last_page":"899"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9606000185012817,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9606000185012817,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/design-for-manufacturability","display_name":"Design for manufacturability","score":0.9769928455352783},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.5683631896972656},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.559495210647583},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.513083815574646},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.484971284866333},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.3865291476249695},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3691686987876892},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.319305419921875},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2006063163280487},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.14365911483764648},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.07916402816772461}],"concepts":[{"id":"https://openalex.org/C62064638","wikidata":"https://www.wikidata.org/wiki/Q553878","display_name":"Design for manufacturability","level":2,"score":0.9769928455352783},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.5683631896972656},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.559495210647583},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.513083815574646},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.484971284866333},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.3865291476249695},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3691686987876892},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.319305419921875},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2006063163280487},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.14365911483764648},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.07916402816772461},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1391469.1391696","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1391469.1391696","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 45th annual Design Automation Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2094969048","https://openalex.org/W994558755","https://openalex.org/W2010746423","https://openalex.org/W3035935536","https://openalex.org/W2099437566","https://openalex.org/W1974863168","https://openalex.org/W3166333355","https://openalex.org/W2092537898","https://openalex.org/W2379140921","https://openalex.org/W2023011715"],"abstract_inverted_index":{"DFM":[0,65],"has":[1],"taken":[2],"shape":[3],"by":[4],"virtue":[5],"of":[6,11,69,96,98,109],"manufacturers":[7],"defining":[8],"a":[9],"series":[10],"\"DFM":[12],"activities\",":[13],"related":[14],"to":[15,26,72,101],"parametric":[16],"and":[17,21,45,59],"stochastic":[18],"yield":[19],"analysis":[20],"recommendations":[22],"for":[23],"design":[24],"changes":[25],"improve":[27],"yield.":[28],"The":[29,92],"picture":[30],"is":[31,49],"made":[32],"more":[33],"complex":[34],"because":[35],"the":[36,52,77,86,89,107,121],"view":[37],"from":[38,67,106],"integrated":[39],"device":[40],"manufacturers,":[41],"pure":[42],"play":[43],"foundries,":[44],"fabless":[46],"semiconductor":[47],"companies":[48],"not":[50],"necessarily":[51],"same":[53],"as":[54,83,85,116,118],"they":[55,126],"have":[56,112],"different":[57],"needs":[58],"constrains.":[60],"This":[61],"panel":[62,93],"brings":[63],"together":[64],"practitioners":[66],"each":[68],"these":[70],"communities":[71],"discuss":[73],"real":[74],"experiences":[75],"on":[76],"adoption":[78],"level":[79],"achieved":[80],"so":[81],"far":[82],"well":[84,117],"impact":[87],"in":[88,120],"manufactured":[90],"products.":[91],"should":[94],"be":[95],"interest":[97],"designers":[99],"moving":[100],"advanced":[102],"nodes":[103],"(to":[104],"learn":[105],"experience":[108],"those":[110,119],"that":[111,125],"\"done":[113],"it":[114],"already\")":[115],"leading":[122],"edge":[123],"(such":[124],"can":[127],"compare":[128],"experiences).":[129]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}