{"id":"https://openalex.org/W2133850121","doi":"https://doi.org/10.1145/1391469.1391539","title":"Technology exploration for graphene nanoribbon FETs","display_name":"Technology exploration for graphene nanoribbon FETs","publication_year":2008,"publication_date":"2008-06-08","ids":{"openalex":"https://openalex.org/W2133850121","doi":"https://doi.org/10.1145/1391469.1391539","mag":"2133850121"},"language":"en","primary_location":{"id":"doi:10.1145/1391469.1391539","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1391469.1391539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 45th annual Design Automation Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059471428","display_name":"Mihir Choudhury","orcid":null},"institutions":[{"id":"https://openalex.org/I74775410","display_name":"Rice University","ror":"https://ror.org/008zs3103","country_code":"US","type":"education","lineage":["https://openalex.org/I74775410"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mihir Choudhury","raw_affiliation_strings":["Rice University, Houston","Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rice University, Houston","institution_ids":["https://openalex.org/I74775410"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX#TAB#","institution_ids":["https://openalex.org/I74775410"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047049617","display_name":"Youngki Yoon","orcid":"https://orcid.org/0000-0003-4910-572X"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Youngki Yoon","raw_affiliation_strings":["University of Florida, Gainesville"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Florida, Gainesville","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060072039","display_name":"Jing Guo","orcid":"https://orcid.org/0000-0003-4009-3056"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jing Guo","raw_affiliation_strings":["University of Florida, Gainesville"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Florida, Gainesville","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021693439","display_name":"Kartik Mohanram","orcid":null},"institutions":[{"id":"https://openalex.org/I74775410","display_name":"Rice University","ror":"https://ror.org/008zs3103","country_code":"US","type":"education","lineage":["https://openalex.org/I74775410"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kartik Mohanram","raw_affiliation_strings":["Rice University, Houston"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rice University, Houston","institution_ids":["https://openalex.org/I74775410"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":37,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"272","last_page":"277"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nanoelectronics","display_name":"Nanoelectronics","score":0.8435037136077881},{"id":"https://openalex.org/keywords/graphene","display_name":"Graphene","score":0.7128531336784363},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.709114134311676},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6711102724075317},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.5836576223373413},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5604041814804077},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5413373112678528},{"id":"https://openalex.org/keywords/semiconductor-device-modeling","display_name":"Semiconductor device modeling","score":0.5307597517967224},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.509128749370575},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.48130977153778076},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4523804783821106},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.44843995571136475},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42646411061286926},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39799439907073975},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2736217975616455},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22286197543144226},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2166609764099121},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1266825795173645},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10979369282722473}],"concepts":[{"id":"https://openalex.org/C141400236","wikidata":"https://www.wikidata.org/wiki/Q1479544","display_name":"Nanoelectronics","level":2,"score":0.8435037136077881},{"id":"https://openalex.org/C30080830","wikidata":"https://www.wikidata.org/wiki/Q169917","display_name":"Graphene","level":2,"score":0.7128531336784363},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.709114134311676},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6711102724075317},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.5836576223373413},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5604041814804077},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5413373112678528},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.5307597517967224},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.509128749370575},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.48130977153778076},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4523804783821106},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.44843995571136475},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42646411061286926},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39799439907073975},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2736217975616455},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22286197543144226},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2166609764099121},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1266825795173645},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10979369282722473},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1391469.1391539","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1391469.1391539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 45th annual Design Automation Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.156.664","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.156.664","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ece.rice.edu/~kmram/publications/gnrDAC08.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8899999856948853,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2123218135","display_name":null,"funder_award_id":"CCF-0701547","funder_id":"https://openalex.org/F4320337387","funder_display_name":"Division of Computing and Communication Foundations"}],"funders":[{"id":"https://openalex.org/F4320337387","display_name":"Division of Computing and Communication Foundations","ror":"https://ror.org/01mng8331"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W656433898","https://openalex.org/W1492933538","https://openalex.org/W1651707596","https://openalex.org/W1982627241","https://openalex.org/W1983208835","https://openalex.org/W1999421581","https://openalex.org/W2014935324","https://openalex.org/W2044780596","https://openalex.org/W2058122340","https://openalex.org/W2061557594","https://openalex.org/W2087638855","https://openalex.org/W2092831789","https://openalex.org/W2093695000","https://openalex.org/W2102415385","https://openalex.org/W2118492507","https://openalex.org/W2119882629","https://openalex.org/W2186385097","https://openalex.org/W3102766849","https://openalex.org/W3172772885"],"related_works":["https://openalex.org/W2584544613","https://openalex.org/W3210903312","https://openalex.org/W3093401165","https://openalex.org/W2161058820","https://openalex.org/W2303515603","https://openalex.org/W2108396330","https://openalex.org/W3102455408","https://openalex.org/W1817913304","https://openalex.org/W2167104768","https://openalex.org/W2150799356"],"abstract_inverted_index":{"Graphene":[0],"nanoribbon":[1],"FETs":[2],"(GNRFETs)":[3],"are":[4,88],"promising":[5],"devices":[6],"for":[7,19,39],"beyond-CMOS":[8],"nanoelectronics":[9],"because":[10],"of":[11,45,48,57],"their":[12],"excellent":[13],"carrier":[14],"transport":[15,30],"properties":[16],"and":[17,23,50,55,76,93,102,108],"potential":[18],"large":[20],"scale":[21],"processing":[22],"fabrication.":[24],"This":[25],"paper":[26],"combines":[27],"atomistic":[28],"quantum":[29],"modeling":[31],"with":[32],"circuit":[33],"simulation":[34,103],"to":[35,83,91],"perform":[36],"technology":[37],"exploration":[38],"GNRFET":[40,58,68],"circuits.":[41],"A":[42],"quantitative":[43],"study":[44],"the":[46,53,106],"effects":[47],"variations":[49,92],"defects":[51],"on":[52],"performance":[54],"reliability":[56,78],"circuits":[59,69],"is":[60],"also":[61,97],"presented.":[62],"Simulation":[63],"results":[64,96],"indicate":[65],"that":[66],"whereas":[67],"promise":[70],"higher":[71],"performance,":[72],"lower":[73],"energy":[74],"consumption,":[75],"comparable":[77],"at":[79],"similar":[80],"operating":[81],"points":[82],"scaled":[84],"CMOS":[85],"circuits,":[86],"they":[87],"more":[89],"susceptible":[90],"defects.":[94],"The":[95],"motivate":[98],"significant":[99],"engineering,":[100],"modeling,":[101],"challenges":[104],"facing":[105],"device":[107],"CAD":[109],"communities":[110],"involved":[111],"in":[112],"graphene":[113],"electronics":[114],"research.":[115]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":6},{"year":2012,"cited_by_count":3}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}