{"id":"https://openalex.org/W2050858815","doi":"https://doi.org/10.1145/1366230.1366258","title":"Credit-based dynamic reliability management using online wearout detection","display_name":"Credit-based dynamic reliability management using online wearout detection","publication_year":2008,"publication_date":"2008-05-05","ids":{"openalex":"https://openalex.org/W2050858815","doi":"https://doi.org/10.1145/1366230.1366258","mag":"2050858815"},"language":"en","primary_location":{"id":"doi:10.1145/1366230.1366258","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1366230.1366258","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 5th conference on Computing frontiers","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080546454","display_name":"John Oliver","orcid":"https://orcid.org/0000-0003-2877-6751"},"institutions":[{"id":"https://openalex.org/I149919469","display_name":"California Polytechnic State University","ror":"https://ror.org/001gpfp45","country_code":"US","type":"education","lineage":["https://openalex.org/I149919469"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John Oliver","raw_affiliation_strings":["Cal Poly State University, San Luis Obispo, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cal Poly State University, San Luis Obispo, CA, USA","institution_ids":["https://openalex.org/I149919469"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028759035","display_name":"Rajeevan Amirtharajah","orcid":"https://orcid.org/0000-0003-4727-9363"},"institutions":[{"id":"https://openalex.org/I84218800","display_name":"University of California, Davis","ror":"https://ror.org/05rrcem69","country_code":"US","type":"education","lineage":["https://openalex.org/I84218800"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rajeevan Amirtharajah","raw_affiliation_strings":["University of California, Davis, CA, USA","[University of California, Davis, CA~, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Davis, CA, USA","institution_ids":["https://openalex.org/I84218800"]},{"raw_affiliation_string":"[University of California, Davis, CA~, USA]","institution_ids":["https://openalex.org/I84218800"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089377852","display_name":"Venkatesh Akella","orcid":"https://orcid.org/0000-0003-3014-5326"},"institutions":[{"id":"https://openalex.org/I84218800","display_name":"University of California, Davis","ror":"https://ror.org/05rrcem69","country_code":"US","type":"education","lineage":["https://openalex.org/I84218800"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Venkatesh Akella","raw_affiliation_strings":["University of California, Davis, CA, USA","[University of California, Davis, CA~, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Davis, CA, USA","institution_ids":["https://openalex.org/I84218800"]},{"raw_affiliation_string":"[University of California, Davis, CA~, USA]","institution_ids":["https://openalex.org/I84218800"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083979678","display_name":"Frederic T. Chong","orcid":"https://orcid.org/0000-0001-9282-4645"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Frederic T. Chong","raw_affiliation_strings":["University of California, Santa Barbara, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"139","last_page":"148"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7956869602203369},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.714208722114563},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.6790292263031006},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5319191813468933},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5262131690979004},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5102009773254395},{"id":"https://openalex.org/keywords/provisioning","display_name":"Provisioning","score":0.4977255165576935},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.43427878618240356},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4060981273651123},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15928301215171814},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13251250982284546},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12340709567070007},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.12292149662971497}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7956869602203369},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.714208722114563},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6790292263031006},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5319191813468933},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5262131690979004},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5102009773254395},{"id":"https://openalex.org/C172191483","wikidata":"https://www.wikidata.org/wiki/Q1071806","display_name":"Provisioning","level":2,"score":0.4977255165576935},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.43427878618240356},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4060981273651123},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15928301215171814},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13251250982284546},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12340709567070007},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.12292149662971497},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1366230.1366258","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1366230.1366258","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 5th conference on Computing frontiers","raw_type":"proceedings-article"},{"id":"pmh:oai:digitalcommons.calpoly.edu:eeng_fac-1123","is_oa":false,"landing_page_url":"https://digitalcommons.calpoly.edu/eeng_fac/123","pdf_url":null,"source":{"id":"https://openalex.org/S4377196328","display_name":"DigitalCommons - CalPoly (California State Polytechnic University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98947143","host_organization_name":"California State Polytechnic University","host_organization_lineage":["https://openalex.org/I98947143"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Electrical Engineering","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W44510937","https://openalex.org/W424839606","https://openalex.org/W1890614305","https://openalex.org/W2027849669","https://openalex.org/W2032094184","https://openalex.org/W2059193309","https://openalex.org/W2104086123","https://openalex.org/W2104677471","https://openalex.org/W2121618685","https://openalex.org/W2125890858","https://openalex.org/W2138554927","https://openalex.org/W2140064132","https://openalex.org/W2154857344","https://openalex.org/W2165071510","https://openalex.org/W2167678606","https://openalex.org/W2171825402","https://openalex.org/W4243134243","https://openalex.org/W4379383269","https://openalex.org/W6678409955","https://openalex.org/W6680357974"],"related_works":["https://openalex.org/W2893779165","https://openalex.org/W2017432143","https://openalex.org/W1973694374","https://openalex.org/W2983574358","https://openalex.org/W2370475531","https://openalex.org/W4385924768","https://openalex.org/W4256551238","https://openalex.org/W2610550183","https://openalex.org/W1975778413","https://openalex.org/W1975511343"],"abstract_inverted_index":{"As":[0],"circuit":[1,12],"geometries":[2],"continue":[3],"to":[4,31,65,110],"shrink,":[5],"and":[6,35,80,86,94,125,140],"supply":[7],"voltages":[8],"remain":[9],"relatively":[10],"constant,":[11],"wearout":[13,41,44,78,123,138],"becomes":[14],"a":[15,27,39,92,99,117,122,129],"concern.":[16],"We":[17,69,115],"propose":[18],"that":[19,61,71,101,145],"the":[20,24,32,50,55,73,77,89,96,137,156,159],"relative":[21],"reliability":[22,51,90],"of":[23,26,49,52,57,76,91,98,131,158],"circuits":[25,53,60],"processor":[28,100,160],"be":[29,36,66,104],"exposed":[30],"operating":[33],"system,":[34],"managed":[37],"by":[38,146,150,161],"credit-based":[40],"monitor.":[42],"This":[43],"monitor":[45,79,124,139],"receives":[46],"dynamic":[47],"updates":[48],"through":[54,72],"use":[56,75],"stability":[58,81,126,141],"detector":[59],"are":[62,108],"small":[63],"enough":[64],"widely":[67],"deployed.":[68],"find":[70,144],"combined":[74],"detectors,":[82,142],"we":[83,143,153],"can":[84,154],"efficiently":[85],"accurately":[87],"manage":[88],"processor,":[93],"re-coup":[95],"performance":[97,149],"would":[102],"otherwise":[103],"lost":[105],"when":[106],"processors":[107],"over-provisioned":[109],"meet":[111],"an":[112],"expected":[113],"lifetime.":[114],"simulate":[116],"16":[118],"core":[119],"DSP":[120],"with":[121],"detectors":[127],"on":[128],"mix":[130],"four":[132],"different":[133],"media":[134],"algorithms.":[135],"Using":[136],"reducing":[147],"average":[148],"only":[151],"5%,":[152],"increase":[155],"lifetime":[157],"46%.":[162]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}