{"id":"https://openalex.org/W2077070488","doi":"https://doi.org/10.1145/1366224.1366226","title":"Analyzing the effects of the granularity of recomputation based techniques to cope with radiation induced soft errors","display_name":"Analyzing the effects of the granularity of recomputation based techniques to cope with radiation induced soft errors","publication_year":2008,"publication_date":"2008-05-05","ids":{"openalex":"https://openalex.org/W2077070488","doi":"https://doi.org/10.1145/1366224.1366226","mag":"2077070488"},"language":"en","primary_location":{"id":"doi:10.1145/1366224.1366226","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1366224.1366226","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2008 workshop on Radiation effects and fault tolerance in nanometer technologies","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014901784","display_name":"Carlos Lisboa","orcid":"https://orcid.org/0000-0003-2030-942X"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Carlos A. L. Lisboa","raw_affiliation_strings":["Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024813896","display_name":"Fernanda Lima Kastensmidt","orcid":"https://orcid.org/0000-0001-5767-8582"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Fernanda G. L. Kastensmidt","raw_affiliation_strings":["Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062358729","display_name":"Luigi Carro","orcid":"https://orcid.org/0000-0002-7402-4780"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Luigi Carro","raw_affiliation_strings":["Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11384113,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"329","last_page":"338"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/granularity","display_name":"Granularity","score":0.9422640800476074},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7910420894622803},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6135985851287842},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5995489954948425},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5275606513023376},{"id":"https://openalex.org/keywords/face","display_name":"Face (sociological concept)","score":0.49309512972831726},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.43158581852912903},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4037475287914276},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.38910192251205444},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.36114293336868286},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.19489547610282898},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.12369447946548462},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09583732485771179},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.08697730302810669}],"concepts":[{"id":"https://openalex.org/C177774035","wikidata":"https://www.wikidata.org/wiki/Q1246948","display_name":"Granularity","level":2,"score":0.9422640800476074},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7910420894622803},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6135985851287842},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5995489954948425},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5275606513023376},{"id":"https://openalex.org/C2779304628","wikidata":"https://www.wikidata.org/wiki/Q3503480","display_name":"Face (sociological concept)","level":2,"score":0.49309512972831726},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.43158581852912903},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4037475287914276},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.38910192251205444},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.36114293336868286},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.19489547610282898},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.12369447946548462},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09583732485771179},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.08697730302810669},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C36289849","wikidata":"https://www.wikidata.org/wiki/Q34749","display_name":"Social science","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1366224.1366226","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1366224.1366226","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2008 workshop on Radiation effects and fault tolerance in nanometer technologies","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1489870749","https://openalex.org/W1523087909","https://openalex.org/W1965475108","https://openalex.org/W2013185880","https://openalex.org/W2051973459","https://openalex.org/W2098247453","https://openalex.org/W2112494342","https://openalex.org/W2127658067","https://openalex.org/W2132529273","https://openalex.org/W2149985396","https://openalex.org/W2150463399","https://openalex.org/W2151845324","https://openalex.org/W2152652532","https://openalex.org/W2162465831","https://openalex.org/W2167950192"],"related_works":["https://openalex.org/W2931688134","https://openalex.org/W2110991008","https://openalex.org/W2000201823","https://openalex.org/W2149051075","https://openalex.org/W2061536619","https://openalex.org/W1927459197","https://openalex.org/W2554735846","https://openalex.org/W2394408226","https://openalex.org/W3041678444","https://openalex.org/W4389168214"],"abstract_inverted_index":{"A":[0],"single":[1],"radiation":[2],"induced":[3],"transient":[4,46],"can":[5,22],"cause":[6],"multiple":[7,20,82],"errors":[8,21,47],"in":[9,26,48,64,73],"a":[10,41],"circuit.":[11],"Hardware":[12],"and":[13,30,68],"time-based":[14],"mitigation":[15],"solutions":[16],"able":[17],"to":[18,43],"handle":[19],"be":[23],"very":[24],"expensive":[25],"terms":[27],"of":[28,59,62],"area":[29],"performance.":[31],"To":[32],"face":[33],"this":[34,49,53],"problem,":[35],"recomputation":[36,66],"has":[37],"been":[38],"proposed":[39],"as":[40],"means":[42],"cope":[44],"with":[45,81],"new":[50],"scenario.":[51],"In":[52],"paper,":[54],"we":[55],"discuss":[56],"the":[57,60,65,69,74],"effects":[58],"levels":[61],"granularity":[63],"process,":[67],"verification":[70],"time":[71,78],"cost,":[72],"final":[75],"application":[76],"execution":[77],"when":[79],"dealing":[80],"errors.":[83]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}