{"id":"https://openalex.org/W2143707413","doi":"https://doi.org/10.1145/1366110.1366122","title":"On-die CMOS voltage droop detection and dynamiccompensation","display_name":"On-die CMOS voltage droop detection and dynamiccompensation","publication_year":2008,"publication_date":"2008-05-04","ids":{"openalex":"https://openalex.org/W2143707413","doi":"https://doi.org/10.1145/1366110.1366122","mag":"2143707413"},"language":"en","primary_location":{"id":"doi:10.1145/1366110.1366122","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1366110.1366122","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 18th ACM Great Lakes symposium on VLSI","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057312247","display_name":"Matthew Seetharam A. Holtz","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Matthew Seetharam A. Holtz","raw_affiliation_strings":["Keithley Instruments, Inc., Cleveland, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Keithley Instruments, Inc., Cleveland, OH, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004668210","display_name":"Seetharam Narasimhan","orcid":null},"institutions":[{"id":"https://openalex.org/I58956616","display_name":"Case Western Reserve University","ror":"https://ror.org/051fd9666","country_code":"US","type":"education","lineage":["https://openalex.org/I58956616"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seetharam Narasimhan","raw_affiliation_strings":["Case Western Reserve University, Cleveland, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Case Western Reserve University, Cleveland, OH, USA","institution_ids":["https://openalex.org/I58956616"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039442844","display_name":"Swarup Bhunia","orcid":"https://orcid.org/0000-0001-6082-6961"},"institutions":[{"id":"https://openalex.org/I58956616","display_name":"Case Western Reserve University","ror":"https://ror.org/051fd9666","country_code":"US","type":"education","lineage":["https://openalex.org/I58956616"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Swarup Bhunia","raw_affiliation_strings":["Case Western Reserve University, Cleveland, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Case Western Reserve University, Cleveland, OH, USA","institution_ids":["https://openalex.org/I58956616"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4233,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.80058472,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"35","last_page":"40"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.964645504951477},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.6353448629379272},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.634494423866272},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5554500818252563},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5144898891448975},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4745018184185028},{"id":"https://openalex.org/keywords/mesh-analysis","display_name":"Mesh analysis","score":0.4743286967277527},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4584263563156128},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4488867521286011},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.4449102580547333},{"id":"https://openalex.org/keywords/voltage-source","display_name":"Voltage source","score":0.43831297755241394},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.43620407581329346},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31548815965652466}],"concepts":[{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.964645504951477},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.6353448629379272},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.634494423866272},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5554500818252563},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5144898891448975},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4745018184185028},{"id":"https://openalex.org/C55311165","wikidata":"https://www.wikidata.org/wiki/Q1852652","display_name":"Mesh analysis","level":5,"score":0.4743286967277527},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4584263563156128},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4488867521286011},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.4449102580547333},{"id":"https://openalex.org/C144655898","wikidata":"https://www.wikidata.org/wiki/Q1161128","display_name":"Voltage source","level":3,"score":0.43831297755241394},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.43620407581329346},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31548815965652466},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1366110.1366122","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1366110.1366122","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 18th ACM Great Lakes symposium on VLSI","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7200000286102295,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1820338185","https://openalex.org/W2101512735","https://openalex.org/W2111944961","https://openalex.org/W2123134748","https://openalex.org/W2125671371","https://openalex.org/W2126416778","https://openalex.org/W2128933446","https://openalex.org/W2162560527","https://openalex.org/W2788582544","https://openalex.org/W2788706082","https://openalex.org/W4241232532","https://openalex.org/W4244441832"],"related_works":["https://openalex.org/W2077073890","https://openalex.org/W2269166041","https://openalex.org/W4244383444","https://openalex.org/W2977399316","https://openalex.org/W2409882009","https://openalex.org/W2980232854","https://openalex.org/W2002509857","https://openalex.org/W3024702869","https://openalex.org/W2805471441","https://openalex.org/W4236844190"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"an":[3],"on-die":[4],"di/dt":[5],"voltage":[6,55],"droop":[7,56,64],"compensation":[8],"scheme":[9,77],"for":[10],"use":[11],"in":[12],"high":[13],"current,":[14],"low":[15],"voltage,":[16],"VLSI":[17],"circuits":[18],"using":[19],"current":[20,40,68,75],"injection.":[21],"The":[22,30],"circuit":[23,31],"was":[24],"designed":[25],"and":[26,50,66,80,83],"simulated":[27],"with":[28],"SPICE.":[29],"is":[32,51,60,78,88],"able":[33,52],"to":[34,37,53],"source":[35],"up":[36],"150mA":[38],"of":[39,48,85],"into":[41],"a":[42,46,73],"drooping":[43],"node,":[44],"has":[45],"bandwidth":[47],"20MHz,":[49],"lessen":[54],"magnitude.":[57],"Since":[58],"there":[59],"delay":[61],"between":[62],"the":[63,67],"event":[65],"provided":[69],"by":[70],"this":[71,86],"circuit,":[72],"predictive":[74],"injection":[76],"proposed":[79],"some":[81],"simulation":[82],"analysis":[84],"method":[87],"performed.":[89]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}