{"id":"https://openalex.org/W2050886972","doi":"https://doi.org/10.1145/1353629.1353643","title":"Variations, margins, and statistics","display_name":"Variations, margins, and statistics","publication_year":2008,"publication_date":"2008-04-13","ids":{"openalex":"https://openalex.org/W2050886972","doi":"https://doi.org/10.1145/1353629.1353643","mag":"2050886972"},"language":"en","primary_location":{"id":"doi:10.1145/1353629.1353643","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1353629.1353643","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2008 international symposium on Physical design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062086382","display_name":"Patrick McGuinness","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Patrick McGuinness","raw_affiliation_strings":["Freescale Semiconductor, Austin, TX, USA",", Freescale Semiconductor, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Austin, TX, USA","institution_ids":[]},{"raw_affiliation_string":", Freescale Semiconductor, Austin, TX, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5062086382"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3318,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.81198523,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"60","last_page":"67"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.7148512601852417},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6620745658874512},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.6477568745613098},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6322577595710754},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6254016757011414},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.5908147096633911},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5280362367630005},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40523451566696167},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19186121225357056},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12097322940826416},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.11219319701194763}],"concepts":[{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.7148512601852417},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6620745658874512},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.6477568745613098},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6322577595710754},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6254016757011414},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.5908147096633911},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5280362367630005},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40523451566696167},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19186121225357056},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12097322940826416},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.11219319701194763},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1353629.1353643","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1353629.1353643","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2008 international symposium on Physical design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1508076293","https://openalex.org/W1517661712","https://openalex.org/W1993879453","https://openalex.org/W2026851806","https://openalex.org/W2095778540","https://openalex.org/W2103792078","https://openalex.org/W2105302023","https://openalex.org/W2124018090","https://openalex.org/W2126564504","https://openalex.org/W2127392734","https://openalex.org/W2129267471","https://openalex.org/W2130601386","https://openalex.org/W2146421924","https://openalex.org/W2146731180","https://openalex.org/W2163262735","https://openalex.org/W2163982770","https://openalex.org/W2165740397","https://openalex.org/W2168908441","https://openalex.org/W4230287572"],"related_works":["https://openalex.org/W2386430105","https://openalex.org/W2356521405","https://openalex.org/W2038534795","https://openalex.org/W2384358604","https://openalex.org/W1567829292","https://openalex.org/W3001063351","https://openalex.org/W3196905815","https://openalex.org/W2137012493","https://openalex.org/W2959030164","https://openalex.org/W1564147575"],"abstract_inverted_index":{"Design":[0],"margining":[1,42,65],"is":[2],"used":[3,67],"to":[4,68,84],"account":[5,69],"for":[6,70,100,112,136],"design":[7,41,64,120],"uncertainties":[8],"in":[9,23,37,78],"the":[10,50,62,79,125],"measurement":[11],"of":[12,52,81,92,98,127],"performance,":[13,60],"and":[14,29,35,54,61,94,102,115],"thereby":[15],"ensures":[16],"that":[17],"actual":[18],"manufactured":[19],"parts":[20],"will":[21],"operate":[22],"within":[24],"predicted":[25],"bounds.":[26],"As":[27],"process":[28,39,53,66],"environmental":[30,55],"variations":[31],"become":[32],"increasingly":[33],"severe":[34],"complex":[36],"nanometer":[38],"technology,":[40],"overheads":[43],"have":[44],"increased":[45],"correspondingly.":[46],"This":[47],"paper":[48],"describes":[49],"types":[51],"variations,":[56,93],"their":[57],"impact":[58],"on":[59],"traditional":[63],"these":[71],"uncertainties.":[72],"We":[73,123],"consider":[74],"statistical":[75],"timing":[76,86,117],"(SSTA)":[77],"context":[80],"its":[82],"ability":[83],"reduce":[85],"margins":[87],"through":[88],"more":[89],"accurate":[90],"modeling":[91],"quantify":[95],"potential":[96],"benefits":[97],"SSTA":[99,108],"setup":[101],"hold":[103],"time":[104],"margin":[105,121],"reduction.":[106,122],"Combining":[107],"with":[109],"complementary":[110],"techniques":[111],"systematic":[113],"variation-aware":[114,137],"voltage-variation-aware":[116],"provides":[118],"meaningful":[119],"introduce":[124],"concept":[126],"activity":[128],"based":[129],"operating":[130],"condition":[131],"as":[132],"a":[133],"supporting":[134],"construct":[135],"STA":[138],"flows":[139]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}