{"id":"https://openalex.org/W2163208120","doi":"https://doi.org/10.1145/1346281.1346314","title":"Adapting to intermittent faults in multicore systems","display_name":"Adapting to intermittent faults in multicore systems","publication_year":2008,"publication_date":"2008-03-01","ids":{"openalex":"https://openalex.org/W2163208120","doi":"https://doi.org/10.1145/1346281.1346314","mag":"2163208120"},"language":"en","primary_location":{"id":"doi:10.1145/1346281.1346314","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1346281.1346314","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 13th international conference on Architectural support for programming languages and operating systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043323129","display_name":"Philip M. Wells","orcid":null},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Philip M. Wells","raw_affiliation_strings":["University of Wisconsin-Madison, Madison, WI"],"affiliations":[{"raw_affiliation_string":"University of Wisconsin-Madison, Madison, WI","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101594477","display_name":"Koushik Chakraborty","orcid":"https://orcid.org/0000-0003-0228-2737"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Koushik Chakraborty","raw_affiliation_strings":["University of Wisconsin-Madison, Madison, WI"],"affiliations":[{"raw_affiliation_string":"University of Wisconsin-Madison, Madison, WI","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108260478","display_name":"Gurindar S. Sohi","orcid":null},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gurindar S. Sohi","raw_affiliation_strings":["University of Wisconsin-Madison, Madison, WI"],"affiliations":[{"raw_affiliation_string":"University of Wisconsin-Madison, Madison, WI","institution_ids":["https://openalex.org/I135310074"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5043323129"],"corresponding_institution_ids":["https://openalex.org/I135310074"],"apc_list":null,"apc_paid":null,"fwci":10.6542,"has_fulltext":false,"cited_by_count":64,"citation_normalized_percentile":{"value":0.98684578,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"255","last_page":"264"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.8180978894233704},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6333289742469788},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6118271350860596},{"id":"https://openalex.org/keywords/variety","display_name":"Variety (cybernetics)","score":0.49956440925598145},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.4985673427581787},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4911515414714813},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.47084519267082214},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4259186089038849},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.41535431146621704},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.23756521940231323},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22002315521240234},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.20656439661979675},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16421231627464294},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0791216492652893}],"concepts":[{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.8180978894233704},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6333289742469788},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6118271350860596},{"id":"https://openalex.org/C136197465","wikidata":"https://www.wikidata.org/wiki/Q1729295","display_name":"Variety (cybernetics)","level":2,"score":0.49956440925598145},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.4985673427581787},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4911515414714813},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.47084519267082214},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4259186089038849},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.41535431146621704},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.23756521940231323},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22002315521240234},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.20656439661979675},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16421231627464294},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0791216492652893},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1346281.1346314","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1346281.1346314","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 13th international conference on Architectural support for programming languages and operating systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":50,"referenced_works":["https://openalex.org/W65564217","https://openalex.org/W130731712","https://openalex.org/W147650083","https://openalex.org/W347580606","https://openalex.org/W1579215414","https://openalex.org/W1671166152","https://openalex.org/W1862469596","https://openalex.org/W1972621238","https://openalex.org/W1973551931","https://openalex.org/W1974101162","https://openalex.org/W1980419087","https://openalex.org/W1981647592","https://openalex.org/W2017521824","https://openalex.org/W2033443176","https://openalex.org/W2033921992","https://openalex.org/W2037459596","https://openalex.org/W2045485583","https://openalex.org/W2098228187","https://openalex.org/W2099222972","https://openalex.org/W2099865945","https://openalex.org/W2100204983","https://openalex.org/W2101587002","https://openalex.org/W2104677471","https://openalex.org/W2109781153","https://openalex.org/W2112472666","https://openalex.org/W2116359224","https://openalex.org/W2116672036","https://openalex.org/W2117648153","https://openalex.org/W2120635877","https://openalex.org/W2129816520","https://openalex.org/W2130611655","https://openalex.org/W2133985894","https://openalex.org/W2135123845","https://openalex.org/W2138513384","https://openalex.org/W2140839100","https://openalex.org/W2145064068","https://openalex.org/W2145071646","https://openalex.org/W2148952606","https://openalex.org/W2151182669","https://openalex.org/W2152422320","https://openalex.org/W2154857344","https://openalex.org/W2155581886","https://openalex.org/W2156783995","https://openalex.org/W2162351670","https://openalex.org/W2165160270","https://openalex.org/W2169213530","https://openalex.org/W2979917050","https://openalex.org/W3137092842","https://openalex.org/W4214519867","https://openalex.org/W6605987033"],"related_works":["https://openalex.org/W2032233321","https://openalex.org/W3121970507","https://openalex.org/W2110028391","https://openalex.org/W54497855","https://openalex.org/W217960748","https://openalex.org/W3125814499","https://openalex.org/W2090827041","https://openalex.org/W2148533276","https://openalex.org/W2094012830","https://openalex.org/W187246281"],"abstract_inverted_index":{"Future":[0],"multicore":[1],"processors":[2],"will":[3,51],"be":[4],"more":[5],"susceptible":[6],"to":[7,37,43,56],"a":[8,61],"variety":[9],"of":[10,29,46,65],"hardware":[11],"failures.":[12],"In":[13],"particular,":[14],"intermittent":[15,66],"faults,":[16],"caused":[17],"in":[18],"part":[19],"by":[20],"manufacturing,":[21],"thermal,":[22],"and":[23],"voltage":[24],"variations,":[25],"can":[26],"cause":[27],"bursts":[28],"frequent":[30],"faults":[31],"that":[32],"last":[33],"from":[34],"several":[35,38],"cycles":[36],"seconds":[39],"or":[40],"more.":[41],"Due":[42],"practical":[44],"limitations":[45],"circuit":[47],"techniques,":[48],"cost-effective":[49],"reliability":[50],"likely":[52],"require":[53],"the":[54],"ability":[55],"temporarily":[57],"suspend":[58],"execution":[59],"on":[60],"core":[62],"during":[63],"periods":[64],"faults.":[67]},"counts_by_year":[{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}