{"id":"https://openalex.org/W2043899604","doi":"https://doi.org/10.1145/1291535.1291547","title":"Test purpose generation in an industrial application","display_name":"Test purpose generation in an industrial application","publication_year":2007,"publication_date":"2007-07-09","ids":{"openalex":"https://openalex.org/W2043899604","doi":"https://doi.org/10.1145/1291535.1291547","mag":"2043899604"},"language":"en","primary_location":{"id":"doi:10.1145/1291535.1291547","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1291535.1291547","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 3rd international workshop on Advances in model-based testing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009450062","display_name":"Bernhard K. Aichernig","orcid":"https://orcid.org/0000-0002-3484-5584"},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Bernhard K. Aichernig","raw_affiliation_strings":["Technische Universit\u00e4t Graz, Graz, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universit\u00e4t Graz, Graz, Austria","institution_ids":["https://openalex.org/I4092182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043589437","display_name":"Martin Weiglhofer","orcid":null},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Martin Weiglhofer","raw_affiliation_strings":["Technische Universit\u00e4t Graz, Graz, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universit\u00e4t Graz, Graz, Austria","institution_ids":["https://openalex.org/I4092182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075661926","display_name":"Bernhard Peischl","orcid":"https://orcid.org/0000-0002-5440-7223"},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Bernhard Peischl","raw_affiliation_strings":["Technische Universit\u00e4t, Graz Graz, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universit\u00e4t, Graz Graz, Austria","institution_ids":["https://openalex.org/I4092182"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011388533","display_name":"Franz Wotawa","orcid":"https://orcid.org/0000-0002-0462-2283"},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Franz Wotawa","raw_affiliation_strings":["Technische Universit\u00e4t, Graz, Graz, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Universit\u00e4t, Graz, Graz, Austria","institution_ids":["https://openalex.org/I4092182"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4092182"],"apc_list":null,"apc_paid":null,"fwci":2.5075,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.89439374,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"115","last_page":"125"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10639","display_name":"Advanced Software Engineering Methodologies","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.8023639917373657},{"id":"https://openalex.org/keywords/test-management-approach","display_name":"Test Management Approach","score":0.70668625831604},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7034030556678772},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6460723280906677},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5600921511650085},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5184409618377686},{"id":"https://openalex.org/keywords/test-harness","display_name":"Test harness","score":0.5144358277320862},{"id":"https://openalex.org/keywords/session","display_name":"Session (web analytics)","score":0.4978814125061035},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4971621334552765},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.4842681288719177},{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.4672265946865082},{"id":"https://openalex.org/keywords/test-design","display_name":"Test design","score":0.4598987102508545},{"id":"https://openalex.org/keywords/heuristic","display_name":"Heuristic","score":0.4538891613483429},{"id":"https://openalex.org/keywords/test-script","display_name":"Test script","score":0.43768924474716187},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.3857644200325012},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2241116762161255},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1842920482158661},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.17500609159469604},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16575270891189575},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.12939703464508057},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.09825834631919861}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.8023639917373657},{"id":"https://openalex.org/C7435765","wikidata":"https://www.wikidata.org/wiki/Q7705776","display_name":"Test Management Approach","level":5,"score":0.70668625831604},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7034030556678772},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6460723280906677},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5600921511650085},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5184409618377686},{"id":"https://openalex.org/C109852812","wikidata":"https://www.wikidata.org/wiki/Q2406355","display_name":"Test harness","level":5,"score":0.5144358277320862},{"id":"https://openalex.org/C2779182362","wikidata":"https://www.wikidata.org/wiki/Q17126187","display_name":"Session (web analytics)","level":2,"score":0.4978814125061035},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4971621334552765},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.4842681288719177},{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.4672265946865082},{"id":"https://openalex.org/C11017329","wikidata":"https://www.wikidata.org/wiki/Q7705763","display_name":"Test design","level":3,"score":0.4598987102508545},{"id":"https://openalex.org/C173801870","wikidata":"https://www.wikidata.org/wiki/Q201413","display_name":"Heuristic","level":2,"score":0.4538891613483429},{"id":"https://openalex.org/C109086967","wikidata":"https://www.wikidata.org/wiki/Q2509100","display_name":"Test script","level":4,"score":0.43768924474716187},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.3857644200325012},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2241116762161255},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1842920482158661},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.17500609159469604},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16575270891189575},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.12939703464508057},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.09825834631919861},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1291535.1291547","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1291535.1291547","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 3rd international workshop on Advances in model-based testing","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.541.4394","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.541.4394","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ist.tugraz.at/aichernig/publications/papers/amost2007.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5400000214576721,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W150374354","https://openalex.org/W1498542756","https://openalex.org/W1522465028","https://openalex.org/W1526284106","https://openalex.org/W1529660919","https://openalex.org/W1573853539","https://openalex.org/W1607386006","https://openalex.org/W2024851598","https://openalex.org/W2097725665","https://openalex.org/W2098868862","https://openalex.org/W2112578244","https://openalex.org/W2112640524","https://openalex.org/W2128644160","https://openalex.org/W2161532121","https://openalex.org/W3010856131","https://openalex.org/W6606211016","https://openalex.org/W6634297077","https://openalex.org/W6674817225"],"related_works":["https://openalex.org/W1987412493","https://openalex.org/W2560965237","https://openalex.org/W1505084386","https://openalex.org/W3017054977","https://openalex.org/W2189444510","https://openalex.org/W2186923336","https://openalex.org/W2340727272","https://openalex.org/W2035502798","https://openalex.org/W2096373397","https://openalex.org/W2393936324"],"abstract_inverted_index":{"Nowadays":[0],"test":[1,11,14,27,49,61,68,76,84,93,109,119],"engineers":[2],"typically":[3],"use":[4],"two":[5,45],"strategies":[6,103],"for":[7,48,57,104],"the":[8,58,67,72,105],"design":[9],"of":[10,22,60,74,83,90,92,107,131],"cases.":[12],"First,":[13],"cases":[15,28,62,94,120],"are":[16,29,121],"designed":[17],"related":[18],"to":[19],"some":[20],"kind":[21],"structural":[23],"coverage":[24],"criteria.":[25],"Second,":[26],"created":[30],"by":[31],"having":[32],"a":[33,54,124,132],"specific":[34],"fault":[35],"model":[36],"in":[37,81,88],"mind.":[38],"In":[39],"this":[40,97],"paper":[41],"we":[42,100],"evaluate":[43,101],"these":[44],"supplementary":[46],"techniques":[47],"purpose":[50],"design.":[51],"We":[52,70],"present":[53],"heuristic":[55],"algorithm":[56],"extraction":[59],"from":[63],"tgv\u2019s":[64],"output,":[65],"i.e.,":[66],"pro-cess.":[69],"discuss":[71],"problem":[73],"overlapping":[75],"purposes":[77,110],"and":[78,87,126],"illustrate":[79],"improvements":[80],"terms":[82,89],"execution":[85],"time":[86],"number":[91],"when":[95],"minimizing":[96],"overlap.":[98],"Furthermore,":[99],"different":[102],"generation":[106],"fault-based":[108],"on":[111],"our":[112,115],"specifica-tion.":[113],"For":[114],"evaluation,":[116],"all":[117],"extracted":[118],"executed":[122],"against":[123],"commercial":[125],"an":[127],"open":[128],"source":[129],"implementation":[130],"Session":[133],"Initiation":[134],"Protocol":[135],"(SIP)":[136],"Registrar.":[137]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}