{"id":"https://openalex.org/W2009908079","doi":"https://doi.org/10.1145/1284480.1284544","title":"Viability of analog inner product operations in CMOS imagers","display_name":"Viability of analog inner product operations in CMOS imagers","publication_year":2007,"publication_date":"2007-09-03","ids":{"openalex":"https://openalex.org/W2009908079","doi":"https://doi.org/10.1145/1284480.1284544","mag":"2009908079"},"language":"en","primary_location":{"id":"doi:10.1145/1284480.1284544","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1284480.1284544","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 20th annual conference on Integrated circuits and systems design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018478348","display_name":"Hugo L. Haas","orcid":null},"institutions":[{"id":"https://openalex.org/I122140584","display_name":"Universidade Federal do Rio de Janeiro","ror":"https://ror.org/03490as77","country_code":"BR","type":"education","lineage":["https://openalex.org/I122140584"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Hugo L. Haas","raw_affiliation_strings":["Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil"],"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I122140584"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027382066","display_name":"Jos\u00e9 Gabriel R. C. Gomes","orcid":"https://orcid.org/0000-0003-3242-023X"},"institutions":[{"id":"https://openalex.org/I122140584","display_name":"Universidade Federal do Rio de Janeiro","ror":"https://ror.org/03490as77","country_code":"BR","type":"education","lineage":["https://openalex.org/I122140584"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Jos\u00e9 Gabriel R. C. Gomes","raw_affiliation_strings":["Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil"],"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I122140584"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103201626","display_name":"Antonio Petraglia","orcid":"https://orcid.org/0000-0001-8173-1283"},"institutions":[{"id":"https://openalex.org/I122140584","display_name":"Universidade Federal do Rio de Janeiro","ror":"https://ror.org/03490as77","country_code":"BR","type":"education","lineage":["https://openalex.org/I122140584"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Antonio Petraglia","raw_affiliation_strings":["Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil"],"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I122140584"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5018478348"],"corresponding_institution_ids":["https://openalex.org/I122140584"],"apc_list":null,"apc_paid":null,"fwci":0.3512,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.63030331,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"236","last_page":"240"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.765993595123291},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.7559452056884766},{"id":"https://openalex.org/keywords/quantization","display_name":"Quantization (signal processing)","score":0.6158013343811035},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5845778584480286},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5460269451141357},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5259038209915161},{"id":"https://openalex.org/keywords/semiconductor-device-modeling","display_name":"Semiconductor device modeling","score":0.4622044563293457},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4352194666862488},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.4148826599121094},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2960337996482849},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2644331455230713},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.25420960783958435},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.15120640397071838}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.765993595123291},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.7559452056884766},{"id":"https://openalex.org/C28855332","wikidata":"https://www.wikidata.org/wiki/Q198099","display_name":"Quantization (signal processing)","level":2,"score":0.6158013343811035},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5845778584480286},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5460269451141357},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5259038209915161},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.4622044563293457},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4352194666862488},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.4148826599121094},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2960337996482849},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2644331455230713},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.25420960783958435},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.15120640397071838}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1284480.1284544","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1284480.1284544","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 20th annual conference on Integrated circuits and systems design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2107808739","https://openalex.org/W2174624617","https://openalex.org/W2473730651"],"related_works":["https://openalex.org/W2022123780","https://openalex.org/W2349576212","https://openalex.org/W2352535872","https://openalex.org/W1590693222","https://openalex.org/W2382967348","https://openalex.org/W2334823507","https://openalex.org/W2107073676","https://openalex.org/W2144789955","https://openalex.org/W2565551736","https://openalex.org/W1981776476"],"abstract_inverted_index":{"A":[0],"new":[1],"model":[2,53],"for":[3,32],"the":[4,24,33,45,66,70,79,83,88,95,98],"sensitivity":[5],"analysis":[6],"of":[7,23,35,48,97],"inner":[8],"products":[9],"to":[10,26,56,59],"CMOS":[11,49],"analog":[12,36],"hardware":[13],"implementation":[14],"is":[15,18,30,54],"proposed.":[16],"It":[17],"derived":[19],"from":[20,82],"Spice":[21],"simulations":[22],"circuits":[25],"be":[27,57],"implemented,":[28],"and":[29,94],"required":[31],"design":[34],"image":[37],"compression":[38,92],"systems":[39],"based":[40],"on":[41],"vector":[42],"quantization":[43],"at":[44],"focal":[46],"plane":[47],"imaging":[50],"sensors.":[51],"The":[52],"shown":[55],"equivalent":[58],"a":[60],"simpler,":[61],"previously":[62],"introduced":[63],"model,":[64],"if":[65],"errors":[67],"caused":[68],"by":[69,87],"fabrication":[71],"process":[72],"are":[73,104],"around":[74],"6%.":[75],"For":[76],"1.5%":[77],"errors,":[78],"results":[80,93],"differ":[81],"theoretical":[84],"predictions":[85],"made":[86],"previous":[89],"model.":[90],"Image":[91],"layout":[96],"fabricated":[99],"circuit,":[100],"currently":[101],"under":[102],"test,":[103],"presented.":[105]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}