{"id":"https://openalex.org/W2089142922","doi":"https://doi.org/10.1145/1236246.1236275","title":"Estimating the impact of large design changes on field problems","display_name":"Estimating the impact of large design changes on field problems","publication_year":2007,"publication_date":"2007-06-04","ids":{"openalex":"https://openalex.org/W2089142922","doi":"https://doi.org/10.1145/1236246.1236275","mag":"2089142922"},"language":"en","primary_location":{"id":"doi:10.1145/1236246.1236275","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1236246.1236275","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2007 ACM symposium on Solid and physical modeling","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087016063","display_name":"Sankara Hari Gopalakrishnan","orcid":null},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sankara Hari Gopalakrishnan","raw_affiliation_strings":["University of Wisconsin - Madison"],"affiliations":[{"raw_affiliation_string":"University of Wisconsin - Madison","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001417775","display_name":"Krishnan Suresh","orcid":"https://orcid.org/0000-0002-9688-9697"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnan Suresh","raw_affiliation_strings":["University of Wisconsin - Madison"],"affiliations":[{"raw_affiliation_string":"University of Wisconsin - Madison","institution_ids":["https://openalex.org/I135310074"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5087016063"],"corresponding_institution_ids":["https://openalex.org/I135310074"],"apc_list":null,"apc_paid":null,"fwci":1.0731,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.81867352,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"205","last_page":"215"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11115","display_name":"Topology Optimization in Engineering","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11115","display_name":"Topology Optimization in Engineering","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10672","display_name":"Design Education and Practice","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/design-for-manufacturability","display_name":"Design for manufacturability","score":0.8720451593399048},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.7559514045715332},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.7360507249832153},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6148703694343567},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5625414848327637},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5569208860397339},{"id":"https://openalex.org/keywords/parametric-design","display_name":"Parametric design","score":0.5476866364479065},{"id":"https://openalex.org/keywords/cad","display_name":"CAD","score":0.5318569540977478},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.508089542388916},{"id":"https://openalex.org/keywords/parametric-model","display_name":"Parametric model","score":0.44255226850509644},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.37447431683540344},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.22982612252235413},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22894126176834106},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20310023427009583},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.11951425671577454},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08561909198760986}],"concepts":[{"id":"https://openalex.org/C62064638","wikidata":"https://www.wikidata.org/wiki/Q553878","display_name":"Design for manufacturability","level":2,"score":0.8720451593399048},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.7559514045715332},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.7360507249832153},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6148703694343567},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5625414848327637},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5569208860397339},{"id":"https://openalex.org/C2778370241","wikidata":"https://www.wikidata.org/wiki/Q18386598","display_name":"Parametric design","level":3,"score":0.5476866364479065},{"id":"https://openalex.org/C194789388","wikidata":"https://www.wikidata.org/wiki/Q17855283","display_name":"CAD","level":2,"score":0.5318569540977478},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.508089542388916},{"id":"https://openalex.org/C24574437","wikidata":"https://www.wikidata.org/wiki/Q7135228","display_name":"Parametric model","level":3,"score":0.44255226850509644},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.37447431683540344},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.22982612252235413},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22894126176834106},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20310023427009583},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.11951425671577454},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08561909198760986},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1236246.1236275","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1236246.1236275","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2007 ACM symposium on Solid and physical modeling","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W61939156","https://openalex.org/W171497384","https://openalex.org/W648511115","https://openalex.org/W1517115540","https://openalex.org/W1551542124","https://openalex.org/W1580726534","https://openalex.org/W1977860124","https://openalex.org/W1980325672","https://openalex.org/W1981250805","https://openalex.org/W1995067704","https://openalex.org/W1995610688","https://openalex.org/W2022977680","https://openalex.org/W2024140856","https://openalex.org/W2027619967","https://openalex.org/W2043130099","https://openalex.org/W2049497677","https://openalex.org/W2067869442","https://openalex.org/W2072596017","https://openalex.org/W2082099661","https://openalex.org/W2094251381","https://openalex.org/W2095216523","https://openalex.org/W2101049712","https://openalex.org/W2121130437","https://openalex.org/W2316514014","https://openalex.org/W2994970858","https://openalex.org/W3132178687","https://openalex.org/W4298228534","https://openalex.org/W4300186924","https://openalex.org/W4302961159","https://openalex.org/W6790340191","https://openalex.org/W7062119161"],"related_works":["https://openalex.org/W1984933749","https://openalex.org/W2289718384","https://openalex.org/W2372760916","https://openalex.org/W2379564476","https://openalex.org/W2387868983","https://openalex.org/W2377324899","https://openalex.org/W2899564779","https://openalex.org/W1973986918","https://openalex.org/W2359118882","https://openalex.org/W2257719909"],"abstract_inverted_index":{"CAD":[0],"systems":[1],"today":[2],"are":[3,25,91,95],"feature-based":[4],"in":[5],"that":[6],"they":[7],"represent":[8],"geometry":[9],"via":[10],"a":[11,57],"collection":[12],"of":[13,44,50,84],"features,":[14],"and":[15,75],"associated":[16],"feature":[17,23,46],"parameters.":[18],"During":[19],"the":[20,42,62,81,88],"design":[21,30],"process,":[22],"parameters":[24],"optimized":[26],"to":[27,78],"meet":[28],"various":[29],"objectives":[31],"including":[32],"functionality,":[33],"manufacturability,":[34],"aesthetics,":[35],"etc.":[36,60],"This":[37],"paper":[38],"focuses":[39],"on":[40,48,71],"predicting":[41],"impact":[43],"parametric":[45,63,89],"changes":[47,90],"quantities":[49],"interest,":[51],"such":[52],"as":[53],"average":[54],"stress":[55],"within":[56],"given":[58],"region,":[59],"When":[61],"change":[64],"is":[65],"sufficiently":[66],"small,":[67],"one":[68],"can":[69],"rely":[70],"classic":[72],"shape":[73],"sensitivity":[74],"reanalysis":[76],"methods":[77,94],"rapidly":[79],"predict":[80],"desired":[82],"quantity":[83],"interest.":[85],"However,":[86],"when":[87],"large,":[92],"both":[93],"unreliable.":[96]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}