{"id":"https://openalex.org/W2046737467","doi":"https://doi.org/10.1145/1233501.1233511","title":"A statistical framework for post-silicon tuning through body bias clustering","display_name":"A statistical framework for post-silicon tuning through body bias clustering","publication_year":2006,"publication_date":"2006-01-01","ids":{"openalex":"https://openalex.org/W2046737467","doi":"https://doi.org/10.1145/1233501.1233511","mag":"2046737467"},"language":"en","primary_location":{"id":"doi:10.1145/1233501.1233511","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1233501.1233511","pdf_url":null,"source":{"id":"https://openalex.org/S4210177401","display_name":"Digest of technical papers/Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design","issn_l":"1092-3152","issn":["1092-3152","1558-2434"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design  - ICCAD '06","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040337147","display_name":"S. Kulkarni","orcid":"https://orcid.org/0000-0002-7562-5561"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sarvesh H Kulkarni","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI","EECS Department, University of Michigan, Ann Arbor, MI 48109, USA. shkulkar@eecs.umich.edu"],"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"EECS Department, University of Michigan, Ann Arbor, MI 48109, USA. shkulkar@eecs.umich.edu","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000767141","display_name":"Dennis Sylvester","orcid":"https://orcid.org/0000-0003-2598-0458"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dennis Sylvester","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI","EECS Department, University of Michigan, Ann Arbor, MI 48109, USA. dennis@eecs.umich.edu"],"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"EECS Department, University of Michigan, Ann Arbor, MI 48109, USA. dennis@eecs.umich.edu","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026311377","display_name":"David Blaauw","orcid":"https://orcid.org/0000-0001-6744-7075"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Blaauw","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI","EECS Department, University of Michigan, Ann Arbor, MI 48109, USA. blaauw@eecs.umich.edu"],"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"EECS Department, University of Michigan, Ann Arbor, MI 48109, USA. blaauw@eecs.umich.edu","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5040337147"],"corresponding_institution_ids":["https://openalex.org/I27837315"],"apc_list":null,"apc_paid":null,"fwci":7.6618,"has_fulltext":false,"cited_by_count":60,"citation_normalized_percentile":{"value":0.97440231,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"39","last_page":"39"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6458147764205933},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.6103237271308899},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6085100173950195},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5223104357719421},{"id":"https://openalex.org/keywords/rendering","display_name":"Rendering (computer graphics)","score":0.5115678906440735},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.501636266708374},{"id":"https://openalex.org/keywords/leakage-power","display_name":"Leakage power","score":0.5013644695281982},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4438859820365906},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4284428656101227},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37356534600257874},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.163397878408432},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15950995683670044},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11656725406646729},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10779321193695068}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6458147764205933},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.6103237271308899},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6085100173950195},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5223104357719421},{"id":"https://openalex.org/C205711294","wikidata":"https://www.wikidata.org/wiki/Q176953","display_name":"Rendering (computer graphics)","level":2,"score":0.5115678906440735},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.501636266708374},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.5013644695281982},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4438859820365906},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4284428656101227},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37356534600257874},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.163397878408432},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15950995683670044},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11656725406646729},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10779321193695068},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1145/1233501.1233511","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1233501.1233511","pdf_url":null,"source":{"id":"https://openalex.org/S4210177401","display_name":"Digest of technical papers/Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design","issn_l":"1092-3152","issn":["1092-3152","1558-2434"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design  - ICCAD '06","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.130.1237","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.130.1237","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.iccad.com/data2/iccad/iccad_06acceptedpapers.nsf/9cfb1ebaaf59043587256a6a00031f78/00c0566ca3ef96578725718f005f1345/$file/1c_1.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.259.4237","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.259.4237","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cecs.uci.edu/%7Epapers/iccad06/papers/1C_1.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5899999737739563}],"awards":[],"funders":[{"id":"https://openalex.org/F4320309652","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1572287951","https://openalex.org/W1882013345","https://openalex.org/W2100379261","https://openalex.org/W2102502584","https://openalex.org/W2105597240","https://openalex.org/W2115970675","https://openalex.org/W2125157415","https://openalex.org/W2126564504","https://openalex.org/W2131862714","https://openalex.org/W2131909792","https://openalex.org/W2150526221","https://openalex.org/W2170913662"],"related_works":["https://openalex.org/W1506931758","https://openalex.org/W4250600962","https://openalex.org/W2017024282","https://openalex.org/W3139630586","https://openalex.org/W2153081350","https://openalex.org/W4234835973","https://openalex.org/W2994906808","https://openalex.org/W2560001647","https://openalex.org/W1488405592","https://openalex.org/W2581156470"],"abstract_inverted_index":{"Adaptive":[0],"body":[1,89,129],"biasing":[2],"(ABB)":[3],"is":[4],"a":[5,44,72,83,147,175],"powerful":[6],"technique":[7],"that":[8,17,76,103],"allows":[9,105],"post-silicon":[10,97,127],"tuning":[11],"of":[12,85,125,197],"individual":[13,28],"manufactured":[14],"dies":[15],"such":[16],"each":[18,32,99,118],"die":[19],"optimally":[20],"meets":[21],"the":[22,39,52,55,122,153,160,170,194],"delay":[23,198],"and":[24,62,111,142,157,162],"power":[25,112,188],"constraints.":[26],"Assigning":[27],"bias":[29,46,90,130],"control":[30,47],"to":[31,35,48,107,145,174],"gate":[33],"leads":[34],"severe":[36],"overhead,":[37],"rendering":[38],"method":[40,56,75],"impractical.":[41],"However,":[42],"assigning":[43],"single":[45],"all":[49],"gates":[50,78],"in":[51],"circuit":[53],"prevents":[54],"from":[57],"compensating":[58],"for":[59,98],"intra-die":[60],"variation":[61],"greatly":[63],"reduces":[64],"its":[65,126],"effectiveness.":[66],"In":[67],"this":[68,104],"paper,":[69],"we":[70,120,185],"propose":[71],"new":[73],"variability-aware":[74],"clusters":[77],"at":[79],"design":[80,155,177],"time":[81,178],"into":[82],"handful":[84],"carefully":[86],"chosen":[87],"independent":[88],"groups,":[91],"which":[92],"are":[93],"then":[94,138],"individually":[95],"tuned":[96],"die.":[100],"We":[101,137,151],"show":[102,158],"us":[106],"obtain":[108],"near-optimal":[109],"performance":[110],"characteristics":[113],"with":[114],"minimal":[115],"overhead.":[116],"For":[117],"gate,":[119],"generate":[121],"probability":[123],"distribution":[124],"ideal":[128],"voltage":[131,182],"using":[132,169],"an":[133],"efficient":[134],"sampling":[135],"method.":[136,172],"use":[139],"these":[140],"distributions":[141],"their":[143],"correlations":[144],"drive":[146],"statistically-aware":[148],"clustering":[149],"technique.":[150],"study":[152],"physical":[154],"constraints":[156],"how":[159],"area":[161],"wirelength":[163],"overhead":[164],"can":[165],"be":[166],"significantly":[167],"limited":[168],"proposed":[171],"Compared":[173],"fixed":[176],"based":[179],"dual":[180],"threshold":[181],"assignment":[183],"method,":[184],"improve":[186],"leakage":[187],"by":[189,199],"38-71%":[190],"while":[191],"simultaneously":[192],"reducing":[193],"standard":[195],"deviation":[196],"2-9X.":[200]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}