{"id":"https://openalex.org/W2123380246","doi":"https://doi.org/10.1145/1230800.1230809","title":"A critical-path-aware partial gating approach for test power reduction","display_name":"A critical-path-aware partial gating approach for test power reduction","publication_year":2007,"publication_date":"2007-04-01","ids":{"openalex":"https://openalex.org/W2123380246","doi":"https://doi.org/10.1145/1230800.1230809","mag":"2123380246"},"language":"en","primary_location":{"id":"doi:10.1145/1230800.1230809","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1230800.1230809","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008448127","display_name":"Mohammed Elshoukry","orcid":null},"institutions":[{"id":"https://openalex.org/I79272384","display_name":"University of Maryland, Baltimore County","ror":"https://ror.org/02qskvh78","country_code":"US","type":"education","lineage":["https://openalex.org/I79272384"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mohammed Elshoukry","raw_affiliation_strings":["University of Maryland, Baltimore County, MD"],"affiliations":[{"raw_affiliation_string":"University of Maryland, Baltimore County, MD","institution_ids":["https://openalex.org/I79272384"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113697198","display_name":"Mohammad Tehranipoor","orcid":null},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammad Tehranipoor","raw_affiliation_strings":["University of Connecticut, Storrs, CT"],"affiliations":[{"raw_affiliation_string":"University of Connecticut, Storrs, CT","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036733255","display_name":"C.P. Ravikumar","orcid":"https://orcid.org/0000-0003-0809-5545"},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"C. P. Ravikumar","raw_affiliation_strings":["Texas Instruments India, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments India, Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5008448127"],"corresponding_institution_ids":["https://openalex.org/I79272384"],"apc_list":null,"apc_paid":null,"fwci":2.2166,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.88000795,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"12","issue":"2","first_page":"17","last_page":"17"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.74405437707901},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7241330146789551},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6617487072944641},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.6122949719429016},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.60797119140625},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5479733943939209},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5407779812812805},{"id":"https://openalex.org/keywords/power-gating","display_name":"Power gating","score":0.5397461652755737},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.517231285572052},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.47648972272872925},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.46384504437446594},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.41118869185447693},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.22081977128982544},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21752366423606873},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.17739924788475037},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.14600840210914612},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.12612104415893555}],"concepts":[{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.74405437707901},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7241330146789551},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6617487072944641},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.6122949719429016},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.60797119140625},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5479733943939209},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5407779812812805},{"id":"https://openalex.org/C2780700455","wikidata":"https://www.wikidata.org/wiki/Q7236515","display_name":"Power gating","level":4,"score":0.5397461652755737},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.517231285572052},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.47648972272872925},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.46384504437446594},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.41118869185447693},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.22081977128982544},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21752366423606873},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17739924788475037},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.14600840210914612},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.12612104415893555},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1230800.1230809","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1230800.1230809","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1557977552","https://openalex.org/W1561562902","https://openalex.org/W1593730165","https://openalex.org/W1595368737","https://openalex.org/W1744290565","https://openalex.org/W1917155881","https://openalex.org/W1924975623","https://openalex.org/W1967602327","https://openalex.org/W2080510479","https://openalex.org/W2106303764","https://openalex.org/W2110232289","https://openalex.org/W2119691242","https://openalex.org/W2120246395","https://openalex.org/W2125715320","https://openalex.org/W2126641963","https://openalex.org/W2127870380","https://openalex.org/W2130439920","https://openalex.org/W2131261851","https://openalex.org/W2132881562","https://openalex.org/W2139234345","https://openalex.org/W2146091965","https://openalex.org/W2153309099","https://openalex.org/W2158963606","https://openalex.org/W2160621850","https://openalex.org/W2162248293","https://openalex.org/W2169462318","https://openalex.org/W2169839635","https://openalex.org/W6605831802"],"related_works":["https://openalex.org/W1974621628","https://openalex.org/W2118952760","https://openalex.org/W2075356617","https://openalex.org/W2274367941","https://openalex.org/W2390529848","https://openalex.org/W2763030692","https://openalex.org/W2073042086","https://openalex.org/W2143881398","https://openalex.org/W2092894550","https://openalex.org/W2789883751"],"abstract_inverted_index":{"Power":[0],"reduction":[1,112],"during":[2],"test":[3,17,26,114,132,140],"application":[4],"is":[5,28,100,107,127,143,184],"important":[6],"from":[7,33],"the":[8,21,34,62,73,125,148,158,173,190],"viewpoint":[9],"of":[10,20,36,64,75,82,97,104,124,151,175],"chip":[11],"reliability":[12],"and":[13,85,137,171,186],"for":[14],"obtaining":[15],"correct":[16],"results.":[18],"One":[19],"ways":[22],"to":[23,29,44,54,109,128,157,189],"reduce":[24],"scan":[25,37,65,98,105,153],"power":[27,115,133,141,192],"block":[30],"transitions":[31],"propagating":[32],"outputs":[35,63],"cells":[38,99,106],"through":[39],"combinational":[40],"logic.":[41],"In":[42,67],"order":[43],"accomplish":[45],"this,":[46],"some":[47],"researchers":[48],"have":[49],"proposed":[50],"setting":[51],"primary":[52],"inputs":[53],"appropriate":[55],"values":[56],"or":[57],"adding":[58],"extra":[59],"gates":[60],"at":[61],"cells.":[66],"this":[68,145],"article,":[69],"we":[70],"point":[71],"out":[72],"limitations":[74],"such":[76],"full":[77],"gating":[78,176],"techniques":[79],"in":[80,113,161],"terms":[81],"area":[83,119,162,182],"overhead":[84,183],"performance":[86,169],"degradation.":[87],"We":[88],"propose":[89],"an":[90],"alternate":[91,122],"solution":[92],"where":[93],"a":[94,117,135,139],"partial":[95],"set":[96],"gated.":[101],"A":[102],"subset":[103],"selected":[108],"give":[110],"maximum":[111,130],"within":[116,144],"given":[118],"constraint.":[120],"An":[121],"formulation":[123,166],"problem":[126,165],"treat":[129],"permitted":[131],"as":[134],"constraint":[136],"achieve":[138],"that":[142],"limit":[146],"using":[147],"fewest":[149],"number":[150],"gated":[152],"cells,":[154],"thereby":[155],"leading":[156],"least":[159],"impact":[160],"overhead.":[163],"Our":[164],"also":[167],"comprehends":[168],"constraints":[170],"prevents":[172],"inclusion":[174],"points":[177],"on":[178],"critical":[179],"paths.":[180],"The":[181],"predictable":[185],"closely":[187],"corresponds":[188],"average":[191],"reduction.":[193]},"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}