{"id":"https://openalex.org/W1979538201","doi":"https://doi.org/10.1145/1230800.1230808","title":"Low test application time resource binding for behavioral synthesis","display_name":"Low test application time resource binding for behavioral synthesis","publication_year":2007,"publication_date":"2007-04-01","ids":{"openalex":"https://openalex.org/W1979538201","doi":"https://doi.org/10.1145/1230800.1230808","mag":"1979538201"},"language":"en","primary_location":{"id":"doi:10.1145/1230800.1230808","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1230800.1230808","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://infoscience.epfl.ch/record/138615","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000075032","display_name":"Mohammad Hosseinabady","orcid":"https://orcid.org/0000-0003-3989-4999"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mohammad Hosseinabady","raw_affiliation_strings":["University of Tehran, Tehran, Iran","University of Tehran , Tehran , Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tehran, Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"University of Tehran , Tehran , Iran","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032350195","display_name":"Pejman Lotfi-Kamran","orcid":"https://orcid.org/0000-0003-3293-8274"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Pejman Lotfi-Kamran","raw_affiliation_strings":["University of Tehran, Tehran, Iran","University of Tehran , Tehran , Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tehran, Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"University of Tehran , Tehran , Iran","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007933406","display_name":"Zainalabedin Navabi","orcid":null},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Zainalabedin Navabi","raw_affiliation_strings":["University of Tehran, Tehran, Iran","University of Tehran , Tehran , Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tehran, Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"University of Tehran , Tehran , Iran","institution_ids":["https://openalex.org/I23946033"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I23946033"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.08584313,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"12","issue":"2","first_page":"16","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8159216046333313},{"id":"https://openalex.org/keywords/datapath","display_name":"Datapath","score":0.8027451038360596},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6286433935165405},{"id":"https://openalex.org/keywords/control-flow-graph","display_name":"Control flow graph","score":0.4789617359638214},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4695369005203247},{"id":"https://openalex.org/keywords/resource","display_name":"Resource (disambiguation)","score":0.4476453959941864},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4423788785934448},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4387861490249634},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3907357454299927},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3615080714225769},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3475189507007599},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3285420835018158},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.11730197072029114}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8159216046333313},{"id":"https://openalex.org/C2781198647","wikidata":"https://www.wikidata.org/wiki/Q1633673","display_name":"Datapath","level":2,"score":0.8027451038360596},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6286433935165405},{"id":"https://openalex.org/C27458966","wikidata":"https://www.wikidata.org/wiki/Q1187693","display_name":"Control flow graph","level":2,"score":0.4789617359638214},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4695369005203247},{"id":"https://openalex.org/C206345919","wikidata":"https://www.wikidata.org/wiki/Q20380951","display_name":"Resource (disambiguation)","level":2,"score":0.4476453959941864},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4423788785934448},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4387861490249634},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3907357454299927},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3615080714225769},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3475189507007599},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3285420835018158},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.11730197072029114},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1145/1230800.1230808","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1230800.1230808","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.107.2959","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.107.2959","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://cad.ece.ut.ac.ir/~plotfi/Papers/Test-Synthesis.pdf","raw_type":"text"},{"id":"pmh:oai:infoscience.epfl.ch:138615","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/138615","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I5124864","host_organization_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","host_organization_lineage":["https://openalex.org/I5124864"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:infoscience.epfl.ch:138615","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/138615","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I5124864","host_organization_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","host_organization_lineage":["https://openalex.org/I5124864"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"},"sustainable_development_goals":[{"score":0.4399999976158142,"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1534609007","https://openalex.org/W1837475237","https://openalex.org/W2044893209","https://openalex.org/W2073599385","https://openalex.org/W2093604576","https://openalex.org/W2099552425","https://openalex.org/W2105036235","https://openalex.org/W2112283885","https://openalex.org/W2116254096","https://openalex.org/W2130024882","https://openalex.org/W2133745968","https://openalex.org/W2135931142","https://openalex.org/W2147910207","https://openalex.org/W2541102694","https://openalex.org/W2587271961","https://openalex.org/W2626367477"],"related_works":["https://openalex.org/W2032952398","https://openalex.org/W2157212570","https://openalex.org/W2543176856","https://openalex.org/W1897203488","https://openalex.org/W2764440971","https://openalex.org/W2616892825","https://openalex.org/W1837475237","https://openalex.org/W2624668974","https://openalex.org/W3088373974","https://openalex.org/W2806771822"],"abstract_inverted_index":{"Recent":[0],"advances":[1],"in":[2,11,30,35,39],"process":[3],"technology":[4],"have":[5,33],"led":[6],"to":[7,23,51],"a":[8,36,47,61,71,77,85],"rapid":[9],"increase":[10,38],"the":[12,21,58],"density":[13,19],"of":[14,28,60,84],"integrated":[15],"circuits":[16],"(ICs).":[17],"Increased":[18],"and":[20],"need":[22],"test":[24,40,48,53,64],"for":[25,56],"new":[26],"types":[27],"defects":[29],"nanometer":[31],"technologies":[32],"resulted":[34],"tremendous":[37],"application":[41,54,65],"time":[42,55,66],"(TAT).":[43],"This":[44],"article":[45],"presents":[46],"synthesis":[49],"method":[50],"reduce":[52],"testing":[57],"datapath":[59],"design.":[62,86],"The":[63],"is":[67],"reduced":[68],"by":[69],"applying":[70],"test-time-aware":[72],"resource":[73],"sharing":[74],"algorithm":[75],"on":[76],"scheduled":[78],"control":[79],"data":[80],"flow":[81],"graph":[82],"(CDFG)":[83]},"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2026-08-13T07:04:57.449891","created_date":"2025-10-10T00:00:00"}