{"id":"https://openalex.org/W2107590485","doi":"https://doi.org/10.1145/1228784.1228802","title":"Simultaneous reduction in test data volume and test time for TRC-reseeding","display_name":"Simultaneous reduction in test data volume and test time for TRC-reseeding","publication_year":2007,"publication_date":"2007-03-11","ids":{"openalex":"https://openalex.org/W2107590485","doi":"https://doi.org/10.1145/1228784.1228802","mag":"2107590485"},"language":"en","primary_location":{"id":"doi:10.1145/1228784.1228802","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1228784.1228802","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 17th ACM Great Lakes symposium on VLSI","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060424750","display_name":"Bin Zhou","orcid":"https://orcid.org/0000-0003-1272-2652"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Bin Zhou","raw_affiliation_strings":["Harbin Institute of Technology, Harbin, China","Harbin Institute of Technology Harbin, China#TAB#"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Harbin Institute of Technology Harbin, China#TAB#","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060885776","display_name":"Yizheng Ye","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi-Zheng Ye","raw_affiliation_strings":["Harbin Institute of Technology, Harbin, China","Harbin Institute of Technology Harbin, China#TAB#"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Harbin Institute of Technology Harbin, China#TAB#","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100360011","display_name":"Yongsheng Wang","orcid":"https://orcid.org/0009-0003-5569-1048"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yong-Sheng Wang","raw_affiliation_strings":["Harbin Institute of Technology, Harbin, China","Harbin Institute of Technology Harbin, China#TAB#"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Harbin Institute of Technology Harbin, China#TAB#","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5060424750"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":0.95,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.7710508,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"49","last_page":"54"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6885719299316406},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.652260422706604},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6110896468162537},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.59734046459198},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.592846155166626},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5770529508590698},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.49729421734809875},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.48711657524108887},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4684845209121704},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4498344361782074},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.4275757372379303},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.42577263712882996},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.34715747833251953},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.28085190057754517},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1674518883228302},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13841423392295837}],"concepts":[{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6885719299316406},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.652260422706604},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6110896468162537},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.59734046459198},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.592846155166626},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5770529508590698},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.49729421734809875},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.48711657524108887},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4684845209121704},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4498344361782074},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.4275757372379303},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.42577263712882996},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.34715747833251953},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28085190057754517},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1674518883228302},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13841423392295837},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1228784.1228802","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1228784.1228802","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 17th ACM Great Lakes symposium on VLSI","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W327215","https://openalex.org/W197391467","https://openalex.org/W1517866781","https://openalex.org/W2002464589","https://openalex.org/W2087289986","https://openalex.org/W2111151532","https://openalex.org/W2128038056","https://openalex.org/W2146806184","https://openalex.org/W2152279620","https://openalex.org/W2154325327","https://openalex.org/W2155876767","https://openalex.org/W2162399819","https://openalex.org/W6607990715"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W2021253405","https://openalex.org/W2323083271","https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2408214455","https://openalex.org/W1953724919","https://openalex.org/W2128148266"],"abstract_inverted_index":{"A":[0],"novel":[1],"technique":[2,27,84,160],"for":[3,90,120,136],"reducing":[4],"the":[5,10,97,102,111,114,117,121,143,150,155,163,166,180],"test":[6,11,35,51,88,124,177],"data":[7],"volumes":[8,115],"and":[9,30,54,68,174],"application":[12],"time":[13],"of":[14,80,96,113,116,142,154],"reseeding":[15],"based":[16],"on":[17],"Twisted-ring":[18],"counters":[19],"is":[20,28,45,59,76,128],"presented":[21],"in":[22],"this":[23],"paper.":[24],"The":[25,41,82,130,158],"proposed":[26,159,182],"generic":[29],"can":[31],"be":[32],"applied":[33],"to":[34,61],"set":[36,125],"embedding":[37,126],"or":[38],"mixed-mode":[39],"schemes.":[40],"imposed":[42],"hardware":[43],"overhead":[44],"very":[46],"small":[47,50],"(only":[48],"a":[49,69,105],"control":[52,70,145],"logic":[53],"three":[55],"counters)":[56],"since":[57],"it":[58],"confined":[60],"just":[62],"one":[63],"extra":[64],"bit":[65],"per":[66],"seed":[67,119,135],"word,":[71,146],"named":[72],"ORVECTOR,":[73],"whose":[74],"length":[75],"shorter":[77,176],"than":[78,95,179],"that":[79,153],"seed.":[81],"test-sequence-length-reduction":[83,103,167],"requires":[85,132,147],"47%":[86],"fewer":[87,134,172],"vectors":[89],"all":[91,137],"ISCAS'89":[92,138],"benchmark":[93,139],"circuits":[94],"original":[98,156],"technique.":[99,157],"Along":[100],"with":[101,165,171],"technique,":[104],"more":[106],"efficient":[107],"seed-selection":[108],"algorithm":[109],"targeting":[110],"minimization":[112],"selected":[118],"test-per-clock,":[122],"TRC-based,":[123],"case":[127],"presented.":[129],"seed-selection-algorithm":[131,164],"20%":[133],"circuits,":[140],"because":[141],"stored":[144],"11%":[148],"less":[149],"test-data":[151],"storage":[152],"which":[161],"combines":[162],"scheme,":[168],"delivers":[169],"results":[170],"seeds":[173],"much":[175],"sequences":[178],"already":[181],"approaches.":[183]},"counts_by_year":[{"year":2015,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}