{"id":"https://openalex.org/W1991353737","doi":"https://doi.org/10.1145/1216919.1216948","title":"Performance and yield enhancement of FPGAs with within-die variation using multiple configurations","display_name":"Performance and yield enhancement of FPGAs with within-die variation using multiple configurations","publication_year":2007,"publication_date":"2007-02-18","ids":{"openalex":"https://openalex.org/W1991353737","doi":"https://doi.org/10.1145/1216919.1216948","mag":"1991353737"},"language":"en","primary_location":{"id":"doi:10.1145/1216919.1216948","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1216919.1216948","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2007 ACM/SIGDA 15th international symposium on Field programmable gate arrays","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110465575","display_name":"Yohei Matsumoto","orcid":null},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yohei Matsumoto","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency","National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency#TAB#"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency","institution_ids":["https://openalex.org/I73613424","https://openalex.org/I4210086780"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency#TAB#","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049602728","display_name":"Masakazu Hioki","orcid":"https://orcid.org/0000-0002-5641-9252"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masakazu Hioki","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency","National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency#TAB#"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency","institution_ids":["https://openalex.org/I73613424","https://openalex.org/I4210086780"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency#TAB#","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111904253","display_name":"Takashi Kawanami","orcid":null},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Kawanami","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency","National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency#TAB#"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency","institution_ids":["https://openalex.org/I73613424","https://openalex.org/I4210086780"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency#TAB#","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054071085","display_name":"Toshiyuki Tsutsumi","orcid":"https://orcid.org/0000-0002-3566-390X"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I16656306","display_name":"Meiji University","ror":"https://ror.org/02rqvrp93","country_code":"JP","type":"education","lineage":["https://openalex.org/I16656306"]},{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiyuki Tsutsumi","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan, CREST, Japan Science and Technology Agency and Meiji University, Kanagawa, Japan","National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan, CREST, Japan Science and Technology Agency and Meiji University, Kanagawa, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan, CREST, Japan Science and Technology Agency and Meiji University, Kanagawa, Japan","institution_ids":["https://openalex.org/I73613424","https://openalex.org/I16656306","https://openalex.org/I4210086780"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan, CREST, Japan Science and Technology Agency and Meiji University, Kanagawa, Japan#TAB#","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105820724","display_name":"Tadashi Nakagawa","orcid":"https://orcid.org/0000-0001-8872-6129"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tadashi Nakagawa","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan","National Institute of Advanced Industrial Science and Technology (AIST) , Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST) , Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110235024","display_name":"Toshihiro Sekigawa","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshihiro Sekigawa","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan","National Institute of Advanced Industrial Science and Technology (AIST) , Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST) , Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111904254","display_name":"Hanpei Koike","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]},{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hanpei Koike","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency","National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency#TAB#"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency","institution_ids":["https://openalex.org/I73613424","https://openalex.org/I4210086780"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan and CREST, Japan Science and Technology Agency#TAB#","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5110465575"],"corresponding_institution_ids":["https://openalex.org/I4210086780","https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":5.9711,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.96176455,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"169","last_page":"177"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.7177069783210754},{"id":"https://openalex.org/keywords/die","display_name":"Die (integrated circuit)","score":0.6974413394927979},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.6254463791847229},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6223499774932861},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.59424889087677},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5400820970535278},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5294556021690369},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.5108708739280701},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5040361285209656},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.4755018651485443},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46119996905326843},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.382460355758667},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24762210249900818},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23575815558433533},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20623084902763367},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.19184404611587524},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1273670792579651},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0977606475353241}],"concepts":[{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.7177069783210754},{"id":"https://openalex.org/C111106434","wikidata":"https://www.wikidata.org/wiki/Q1072430","display_name":"Die (integrated circuit)","level":2,"score":0.6974413394927979},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.6254463791847229},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6223499774932861},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.59424889087677},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5400820970535278},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5294556021690369},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.5108708739280701},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5040361285209656},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.4755018651485443},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46119996905326843},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.382460355758667},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24762210249900818},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23575815558433533},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20623084902763367},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.19184404611587524},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1273670792579651},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0977606475353241},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1216919.1216948","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1216919.1216948","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2007 ACM/SIGDA 15th international symposium on Field programmable gate arrays","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1523051745","https://openalex.org/W1978232794","https://openalex.org/W2033443176","https://openalex.org/W2056804345","https://openalex.org/W2084083833","https://openalex.org/W2115596773","https://openalex.org/W2126460975","https://openalex.org/W2133712953","https://openalex.org/W2136569261","https://openalex.org/W2139637699","https://openalex.org/W2154776455","https://openalex.org/W2155042027","https://openalex.org/W2161359960","https://openalex.org/W2161648718","https://openalex.org/W2275304190"],"related_works":["https://openalex.org/W4235807419","https://openalex.org/W2144633290","https://openalex.org/W2550704533","https://openalex.org/W2890026549","https://openalex.org/W2827496155","https://openalex.org/W2160859600","https://openalex.org/W3092420867","https://openalex.org/W2115729972","https://openalex.org/W2793417036","https://openalex.org/W2042032654"],"abstract_inverted_index":{"A":[0],"new":[1],"method":[2,114],"for":[3,97,105,128],"improving":[4],"the":[5,36,46,49,92,118],"timing":[6],"yield":[7],"of":[8,23,30,63,70,87,120,125],"field-programmable":[9],"gate":[10],"array":[11],"(FPGA)":[12],"devices":[13],"affected":[14],"by":[15,101,138],"random":[16,65],"within-die":[17,68,99],"variation":[18,100,109,145],"is":[19,136],"proposed.":[20],"By":[21],"selection":[22],"an":[24],"appropriate":[25],"configuration":[26],"from":[27],"a":[28,150],"set":[29],"functionally":[31],"equivalent":[32],"configurations":[33],"such":[34,73,98],"that":[35],"critical":[37,51,133],"paths":[38],"do":[39],"not":[40,116],"share":[41],"same":[42],"circuit":[43,103],"resources":[44],"on":[45],"FPGA,":[47],"both":[48],"average":[50,132],"path":[52,134],"delay":[53,135],"and":[54,123],"its":[55],"standard":[56,155],"deviation":[57],"are":[58,78],"reduced":[59,137],"substantially":[60],"under":[61],"conditions":[62],"large":[64],"variation.":[66],"Large":[67],"variations":[69,122],"device":[71],"parameters":[72],"as":[74],"transistor":[75],"threshold":[76,147],"voltage":[77],"anticipated":[79],"in":[80,85,146,154],"future":[81],"semiconductor":[82],"technologies,":[83],"resulting":[84],"degradation":[86],"parametric":[88],"yields.":[89],"Comparing":[90],"to":[91,140],"previous":[93],"approach":[94],"which":[95],"compensates":[96],"designing":[102],"placement":[104],"each":[106,129],"chip":[107],"using":[108],"information":[110],"measured":[111],"before,":[112],"our":[113],"does":[115],"require":[117],"measurement":[119],"process":[121],"execution":[124],"design":[126],"tools":[127],"chip.":[130],"The":[131],"up":[139],"5%":[141],"assuming":[142],"30%":[143],"(\u03c3/\u03bc)":[144],"voltage,":[148],"with":[149],"corresponding":[151],"50%":[152],"decrease":[153],"deviation.":[156]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}