{"id":"https://openalex.org/W1970880128","doi":"https://doi.org/10.1145/1179461.1179467","title":"Test sequence generation for controller verification and test with high coverage","display_name":"Test sequence generation for controller verification and test with high coverage","publication_year":2006,"publication_date":"2006-10-01","ids":{"openalex":"https://openalex.org/W1970880128","doi":"https://doi.org/10.1145/1179461.1179467","mag":"1970880128"},"language":"en","primary_location":{"id":"doi:10.1145/1179461.1179467","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1179461.1179467","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069036699","display_name":"Sezer G\u00f6ren","orcid":"https://orcid.org/0000-0002-3688-5280"},"institutions":[{"id":"https://openalex.org/I128277893","display_name":"Bah\u00e7e\u015fehir University","ror":"https://ror.org/00yze4d93","country_code":"TR","type":"education","lineage":["https://openalex.org/I128277893"]}],"countries":["TR"],"is_corresponding":true,"raw_author_name":"Sezer G\u00f6ren","raw_affiliation_strings":["Bah\u00e7e\u015fehir University, Istanbul, Turkey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bah\u00e7e\u015fehir University, Istanbul, Turkey","institution_ids":["https://openalex.org/I128277893"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112406551","display_name":"F.J. Ferguson","orcid":null},"institutions":[{"id":"https://openalex.org/I185103710","display_name":"University of California, Santa Cruz","ror":"https://ror.org/03s65by71","country_code":"US","type":"education","lineage":["https://openalex.org/I185103710"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. Joel Ferguson","raw_affiliation_strings":["University of California Santa Cruz, Santa Cruz, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California Santa Cruz, Santa Cruz, CA","institution_ids":["https://openalex.org/I185103710"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5069036699"],"corresponding_institution_ids":["https://openalex.org/I128277893"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.16269455,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"11","issue":"4","first_page":"916","last_page":"938"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8275527358055115},{"id":"https://openalex.org/keywords/finite-state-machine","display_name":"Finite-state machine","score":0.7518259286880493},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.7402535676956177},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.5680391192436218},{"id":"https://openalex.org/keywords/conformance-testing","display_name":"Conformance testing","score":0.5154750943183899},{"id":"https://openalex.org/keywords/abstraction","display_name":"Abstraction","score":0.49042436480522156},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.48119884729385376},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.46005767583847046},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.4571724534034729},{"id":"https://openalex.org/keywords/white-box-testing","display_name":"White-box testing","score":0.45662248134613037},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4376005232334137},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.43280911445617676},{"id":"https://openalex.org/keywords/extended-finite-state-machine","display_name":"Extended finite-state machine","score":0.4291543662548065},{"id":"https://openalex.org/keywords/system-under-test","display_name":"System under test","score":0.4178413450717926},{"id":"https://openalex.org/keywords/black-box","display_name":"Black box","score":0.41692763566970825},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.38833916187286377},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.35670462250709534},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.33791646361351013},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.2816990315914154},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.24385884404182434},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.11643263697624207},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10528787970542908},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10002607107162476},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.08583250641822815}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8275527358055115},{"id":"https://openalex.org/C167822520","wikidata":"https://www.wikidata.org/wiki/Q176452","display_name":"Finite-state machine","level":2,"score":0.7518259286880493},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.7402535676956177},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.5680391192436218},{"id":"https://openalex.org/C76844732","wikidata":"https://www.wikidata.org/wiki/Q4072285","display_name":"Conformance testing","level":3,"score":0.5154750943183899},{"id":"https://openalex.org/C124304363","wikidata":"https://www.wikidata.org/wiki/Q673661","display_name":"Abstraction","level":2,"score":0.49042436480522156},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.48119884729385376},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.46005767583847046},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.4571724534034729},{"id":"https://openalex.org/C162443782","wikidata":"https://www.wikidata.org/wiki/Q1066228","display_name":"White-box testing","level":5,"score":0.45662248134613037},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4376005232334137},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.43280911445617676},{"id":"https://openalex.org/C181062253","wikidata":"https://www.wikidata.org/wiki/Q5421886","display_name":"Extended finite-state machine","level":3,"score":0.4291543662548065},{"id":"https://openalex.org/C108913964","wikidata":"https://www.wikidata.org/wiki/Q2376856","display_name":"System under test","level":4,"score":0.4178413450717926},{"id":"https://openalex.org/C94966114","wikidata":"https://www.wikidata.org/wiki/Q29256","display_name":"Black box","level":2,"score":0.41692763566970825},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.38833916187286377},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.35670462250709534},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.33791646361351013},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2816990315914154},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.24385884404182434},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.11643263697624207},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10528787970542908},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10002607107162476},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.08583250641822815},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C188087704","wikidata":"https://www.wikidata.org/wiki/Q369577","display_name":"Standardization","level":2,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1179461.1179467","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1179461.1179467","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W647216188","https://openalex.org/W1590315663","https://openalex.org/W1592819458","https://openalex.org/W1593428110","https://openalex.org/W1760199343","https://openalex.org/W1879281873","https://openalex.org/W1935887224","https://openalex.org/W2004929506","https://openalex.org/W2005453221","https://openalex.org/W2047307891","https://openalex.org/W2061317765","https://openalex.org/W2070591508","https://openalex.org/W2090398333","https://openalex.org/W2115252182","https://openalex.org/W2121954581","https://openalex.org/W2129214591","https://openalex.org/W2138846963","https://openalex.org/W2142310917","https://openalex.org/W2147573597","https://openalex.org/W2164717880","https://openalex.org/W2168677788","https://openalex.org/W2171914031","https://openalex.org/W2489182347","https://openalex.org/W2493256084","https://openalex.org/W4248309809","https://openalex.org/W4250395788"],"related_works":["https://openalex.org/W2337793129","https://openalex.org/W87344752","https://openalex.org/W1989329871","https://openalex.org/W593718774","https://openalex.org/W2763952729","https://openalex.org/W1516913161","https://openalex.org/W4287112455","https://openalex.org/W2068407543","https://openalex.org/W1970880128","https://openalex.org/W4233267265"],"abstract_inverted_index":{"Verification":[0],"and":[1,28,38,119,148],"test":[2,36,93,129,140,159],"are":[3,45],"critical":[4],"phases":[5],"in":[6,55,189],"the":[7,23,60,84,115,125,155,180,190],"development":[8],"of":[9,22,26,62,72,86,91,127,157,192],"any":[10],"hardware":[11,27],"or":[12],"software":[13,29],"system.":[14],"This":[15],"article":[16,132],"focuses":[17],"on":[18,114],"black":[19],"box":[20,32],"testing":[21,33],"control":[24],"part":[25],"systems.":[30,58],"Black":[31],"involves":[34],"specification,":[35],"generation,":[37],"fault":[39,89,106,117],"coverage.":[40],"Finite":[41],"state":[42,186],"machines":[43],"(FSMs)":[44],"commonly":[46],"used":[47,188],"for":[48,95,109,161],"specifying":[49],"controllers.":[50],"FSMs":[51],"may":[52],"have":[53],"shortcomings":[54],"modeling":[56],"complex":[57,64],"With":[59],"introduction":[61],"X-machines,":[63],"systems":[65],"can":[66,76],"be":[67,77],"modeled":[68],"at":[69],"higher":[70],"levels":[71],"abstraction.":[73,87],"An":[74],"X-machine":[75],"converted":[78],"into":[79],"an":[80,96,110,162,166],"FSM":[81,97,111,163,167,172],"while":[82],"preserving":[83],"level":[85,147],"The":[88,131],"coverage":[90,107,126,146,156],"a":[92,100,105,128,135,144,158,176],"sequence":[94,160],"specification":[98,112],"provides":[99],"confidence":[101],"level.":[102],"We":[103,169],"propose":[104],"metric":[108,152],"based":[113],"transition":[116],"model,":[118],"using":[120],"this":[121,151],"metric,":[122],"we":[123],"derive":[124],"sequence.":[130],"also":[133],"presents":[134],"method":[136],"which":[137],"generates":[138],"short":[139],"sequences":[141],"that":[142],"meet":[143],"specific":[145],"then":[149],"extends":[150],"to":[153,175],"determine":[154],"driven":[164],"by":[165],"network.":[168],"applied":[170],"our":[171],"verification":[173],"technique":[174],"real-life":[177],"FSM,":[178],"namely,":[179],"fibre":[181],"channel":[182],"arbitrated":[183],"loop":[184],"port":[185],"machine,":[187],"field":[191],"storage":[193],"area":[194],"networks.":[195]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}