{"id":"https://openalex.org/W2118476171","doi":"https://doi.org/10.1145/1146909.1147070","title":"FLAW","display_name":"FLAW","publication_year":2006,"publication_date":"2006-01-01","ids":{"openalex":"https://openalex.org/W2118476171","doi":"https://doi.org/10.1145/1146909.1147070","mag":"2118476171"},"language":"en","primary_location":{"id":"doi:10.1145/1146909.1147070","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1146909.1147070","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 43rd annual conference on Design automation - DAC '06","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078427610","display_name":"Suresh Srinivasan","orcid":"https://orcid.org/0000-0002-0228-8795"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Suresh Srinivasan","raw_affiliation_strings":["Department of Computer Science and Engineering Pennsylvania State University University Park, PA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering Pennsylvania State University University Park, PA","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089520058","display_name":"Prasanth Mangalagiri","orcid":null},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Prasanth Mangalagiri","raw_affiliation_strings":["Department of Computer Science and Engineering Pennsylvania State University University Park, PA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering Pennsylvania State University University Park, PA","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100385336","display_name":"Yuan Xie","orcid":"https://orcid.org/0000-0003-2093-1788"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuan Xie","raw_affiliation_strings":["Department of Computer Science and Engineering Pennsylvania State University University Park, PA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering Pennsylvania State University University Park, PA","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111913132","display_name":"N. Vijaykrishnan","orcid":null},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Vijaykrishnan","raw_affiliation_strings":["Department of Computer Science and Engineering Pennsylvania State University University Park, PA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering Pennsylvania State University University Park, PA","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046636646","display_name":"K. Sarpatwari","orcid":null},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Karthik Sarpatwari","raw_affiliation_strings":["[Pennsylvania State University, PA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"[Pennsylvania State University, PA]","institution_ids":["https://openalex.org/I130769515"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I130769515"],"apc_list":null,"apc_paid":null,"fwci":4.7038,"has_fulltext":false,"cited_by_count":50,"citation_normalized_percentile":{"value":0.95651252,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"630","last_page":"630"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/time-dependent-gate-oxide-breakdown","display_name":"Time-dependent gate oxide breakdown","score":0.7724379897117615},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6680790185928345},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6509959101676941},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5718560218811035},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5709498524665833},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.5518256425857544},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5471739172935486},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4912697672843933},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4830096960067749},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.47073447704315186},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43528419733047485},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.41355741024017334},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3531826436519623},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34061992168426514},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2815821170806885},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.22773557901382446},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1989138126373291},{"id":"https://openalex.org/keywords/gate-dielectric","display_name":"Gate dielectric","score":0.18525972962379456},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11606711149215698},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.08324754238128662},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08033433556556702}],"concepts":[{"id":"https://openalex.org/C152909973","wikidata":"https://www.wikidata.org/wiki/Q7804816","display_name":"Time-dependent gate oxide breakdown","level":5,"score":0.7724379897117615},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6680790185928345},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6509959101676941},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5718560218811035},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5709498524665833},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.5518256425857544},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5471739172935486},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4912697672843933},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4830096960067749},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.47073447704315186},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43528419733047485},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.41355741024017334},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3531826436519623},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34061992168426514},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2815821170806885},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.22773557901382446},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1989138126373291},{"id":"https://openalex.org/C166972891","wikidata":"https://www.wikidata.org/wiki/Q5527011","display_name":"Gate dielectric","level":4,"score":0.18525972962379456},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11606711149215698},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.08324754238128662},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08033433556556702},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1146909.1147070","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1146909.1147070","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 43rd annual conference on Design automation - DAC '06","raw_type":"proceedings-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-133928","is_oa":false,"landing_page_url":"https://repository.hkust.edu.hk/ir/Record/1783.1-133928","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1973039798","https://openalex.org/W2009269504","https://openalex.org/W2104086123","https://openalex.org/W2122904090","https://openalex.org/W2124021899","https://openalex.org/W2133762912","https://openalex.org/W2135660453","https://openalex.org/W2135987877","https://openalex.org/W2139637699","https://openalex.org/W2154845812","https://openalex.org/W2160174313","https://openalex.org/W2170530453","https://openalex.org/W2545268494"],"related_works":["https://openalex.org/W2099624314","https://openalex.org/W2392567938","https://openalex.org/W2106473374","https://openalex.org/W2311850564","https://openalex.org/W3011596590","https://openalex.org/W2108489988","https://openalex.org/W2588545518","https://openalex.org/W3160961382","https://openalex.org/W3134813975","https://openalex.org/W2111013026"],"abstract_inverted_index":{"Aggressive":[0],"scaling":[1],"of":[2,11,52,62,79,105],"technology":[3],"has":[4],"an":[5],"adverse":[6],"impact":[7],"on":[8],"the":[9,20,50,76,103,106],"reliability":[10],"VLSI":[12],"circuits.":[13],"Apart":[14],"from":[15],"increasing":[16],"transient":[17],"error":[18],"susceptibility,":[19],"circuits":[21],"also":[22,74,90],"become":[23],"more":[24],"vulnerable":[25],"to":[26,32,58,95],"permanent":[27],"damage":[28],"and":[29,71,101],"failures":[30,100],"due":[31],"different":[33,60],"physical":[34],"phenomenon.":[35],"Such":[36],"concerns":[37],"have":[38],"been":[39],"recently":[40],"demonstrated":[41],"for":[42],"regular":[43],"micro-architectures.":[44],"In":[45],"this":[46],"work":[47],"we":[48],"demonstrate":[49],"vulnerability":[51],"Field":[53],"Programmable":[54],"Gate":[55],"Arrays":[56],"(FPGA)s":[57],"two":[59],"types":[61],"hard":[63],"errors,":[64],"namely,":[65],"Time":[66],"Dependent":[67],"Dielectric":[68],"Breakdown":[69],"(TDDB)":[70],"Electro-migration.":[72],"We":[73,89],"analyze":[75],"performance":[77],"degradation":[78],"FPGAs":[80],"over":[81],"time":[82],"caused":[83],"by":[84],"Hot":[85],"Carrier":[86],"Effects":[87],"(HCE).":[88],"propose":[91],"three":[92],"novel":[93],"techniques":[94],"counter":[96],"such":[97],"aging":[98],"based":[99],"increase":[102],"lifetime":[104],"device.":[107],"Copyright":[108],"2006":[109],"ACM.":[110]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":7}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2016-06-24T00:00:00"}