{"id":"https://openalex.org/W2151443931","doi":"https://doi.org/10.1145/1146909.1147015","title":"A test pattern ordering algorithm for diagnosis with truncated fail data","display_name":"A test pattern ordering algorithm for diagnosis with truncated fail data","publication_year":2006,"publication_date":"2006-01-01","ids":{"openalex":"https://openalex.org/W2151443931","doi":"https://doi.org/10.1145/1146909.1147015","mag":"2151443931"},"language":"en","primary_location":{"id":"doi:10.1145/1146909.1147015","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1146909.1147015","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 43rd annual conference on Design automation - DAC '06","raw_type":"proceedings-article"},"type":"conference-abstract","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100389329","display_name":"Gang Chen","orcid":"https://orcid.org/0000-0003-4234-1359"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gang Chen","raw_affiliation_strings":["Mentor Graphics Corp., Wilsonville, OR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077101123","display_name":"S.M. Reddy","orcid":"https://orcid.org/0000-0001-9208-8262"},"institutions":[{"id":"https://openalex.org/I126307644","display_name":"University of Iowa","ror":"https://ror.org/036jqmy94","country_code":"US","type":"education","lineage":["https://openalex.org/I126307644"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sudhakar M. Reddy","raw_affiliation_strings":["University of Iowa, Iowa City, IA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Iowa, Iowa City, IA","institution_ids":["https://openalex.org/I126307644"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032651920","display_name":"Irith Pomeranz","orcid":"https://orcid.org/0000-0002-5491-7282"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Irith Pomeranz","raw_affiliation_strings":["Purdue University, W. Lafayette, IN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Purdue University, W. Lafayette, IN","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110218833","display_name":"J. Rajski","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Janusz Rajski","raw_affiliation_strings":["Mentor Graphics Corp., Wilsonville, OR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR","institution_ids":["https://openalex.org/I4210156212"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"399","last_page":"399"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.7146702408790588},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5703745484352112},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5586806535720825},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5363997220993042},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.5152516961097717},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5109252333641052},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4803260862827301},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46266961097717285},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.4482934772968292},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.44494229555130005},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.41707950830459595},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2156842052936554},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.11542209982872009},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0823313295841217},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.06256169080734253}],"concepts":[{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.7146702408790588},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5703745484352112},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5586806535720825},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5363997220993042},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.5152516961097717},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5109252333641052},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4803260862827301},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46266961097717285},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.4482934772968292},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.44494229555130005},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.41707950830459595},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2156842052936554},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.11542209982872009},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0823313295841217},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.06256169080734253},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1146909.1147015","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1146909.1147015","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 43rd annual conference on Design automation - DAC '06","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1723333647","https://openalex.org/W1906764766","https://openalex.org/W1947418710","https://openalex.org/W2001732005","https://openalex.org/W2034978802","https://openalex.org/W2064492678","https://openalex.org/W2096268091","https://openalex.org/W2106303764","https://openalex.org/W2110634061","https://openalex.org/W2114564787","https://openalex.org/W2119902270","https://openalex.org/W2121875568","https://openalex.org/W2128069111","https://openalex.org/W2133241273","https://openalex.org/W2133512509","https://openalex.org/W2136575309","https://openalex.org/W2167012192","https://openalex.org/W2199251691"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2129713538","https://openalex.org/W2341817401","https://openalex.org/W2408214455","https://openalex.org/W1953724919","https://openalex.org/W2128148266","https://openalex.org/W1493811107","https://openalex.org/W3038280805"],"abstract_inverted_index":{"In":[0,34],"this":[1],"paper,":[2],"we":[3],"propose":[4],"a":[5,28],"test":[6,45,64,75],"pattern":[7,14,50,65],"ordering":[8,15,51,66],"algorithm":[9,57],"for":[10],"fault":[11],"diagnosis.":[12],"Test":[13,49],"is":[16,24,52,67],"effective":[17],"in":[18],"situations":[19],"where":[20],"the":[21,44,55,74,91,94],"fail":[22,32],"log":[23],"truncated":[25],"and":[26],"contains":[27],"limited":[29],"number":[30],"of":[31,54,93],"data.":[33],"such":[35],"cases,":[36],"higher":[37,60],"diagnostic":[38],"resolution":[39,61],"can":[40],"be":[41],"achieved":[42,62],"with":[43],"set":[46],"appropriately":[47,79],"ordered.":[48,80],"independent":[53],"diagnosis":[56],"used.":[58],"The":[59],"by":[63],"obtained":[68],"at":[69],"no":[70],"additional":[71],"cost":[72],"once":[73],"patterns":[76],"have":[77],"been":[78],"Experimental":[81],"results":[82],"on":[83],"two":[84],"industrial":[85],"designs":[86],"are":[87],"presented":[88],"to":[89],"demonstrate":[90],"effectiveness":[92],"proposed":[95],"method.":[96]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-19T07:52:34.831488","created_date":"2025-10-10T00:00:00"}