{"id":"https://openalex.org/W2166455209","doi":"https://doi.org/10.1145/1146909.1146994","title":"Hold time validation on silicon and the relevance of hazards in timing analysis","display_name":"Hold time validation on silicon and the relevance of hazards in timing analysis","publication_year":2006,"publication_date":"2006-01-01","ids":{"openalex":"https://openalex.org/W2166455209","doi":"https://doi.org/10.1145/1146909.1146994","mag":"2166455209"},"language":"en","primary_location":{"id":"doi:10.1145/1146909.1146994","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1146909.1146994","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 43rd annual conference on Design automation  - DAC '06","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038766940","display_name":"A. Majumdar","orcid":"https://orcid.org/0000-0002-0860-6686"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Amitava Majumdar","raw_affiliation_strings":["Stratosphere Solutions, Inc., Sunnyvale, CA"],"affiliations":[{"raw_affiliation_string":"Stratosphere Solutions, Inc., Sunnyvale, CA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100373298","display_name":"Wei-Yu Chen","orcid":"https://orcid.org/0000-0001-8922-3988"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wei-Yu Chen","raw_affiliation_strings":["Sun Microsystems, Inc., Sunnyvale, CA"],"affiliations":[{"raw_affiliation_string":"Sun Microsystems, Inc., Sunnyvale, CA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101554563","display_name":"Jun Guo","orcid":"https://orcid.org/0000-0003-1438-8782"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jun Guo","raw_affiliation_strings":["Sun Microsystems, Inc., Sunnyvale, CA"],"affiliations":[{"raw_affiliation_string":"Sun Microsystems, Inc., Sunnyvale, CA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5038766940"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6724,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.84588497,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"326","last_page":"326"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/relevance","display_name":"Relevance (law)","score":0.8194677829742432},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7109372615814209},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6640315651893616},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.539766788482666},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.5331529974937439},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.500216007232666},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3327142596244812},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22615781426429749},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.20271140336990356}],"concepts":[{"id":"https://openalex.org/C158154518","wikidata":"https://www.wikidata.org/wiki/Q7310970","display_name":"Relevance (law)","level":2,"score":0.8194677829742432},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7109372615814209},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6640315651893616},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.539766788482666},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.5331529974937439},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.500216007232666},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3327142596244812},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22615781426429749},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.20271140336990356},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1146909.1146994","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1146909.1146994","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 43rd annual conference on Design automation  - DAC '06","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1528914157","https://openalex.org/W1993741688","https://openalex.org/W2075400577","https://openalex.org/W2093660707","https://openalex.org/W2097884286","https://openalex.org/W2098440959","https://openalex.org/W2116021798","https://openalex.org/W2123512677","https://openalex.org/W2128961080","https://openalex.org/W2133667515","https://openalex.org/W2141985270","https://openalex.org/W2158586221","https://openalex.org/W2160740950","https://openalex.org/W2163535189"],"related_works":["https://openalex.org/W39373273","https://openalex.org/W2098026815","https://openalex.org/W2390545901","https://openalex.org/W2351709090","https://openalex.org/W2735012529","https://openalex.org/W2732121450","https://openalex.org/W1604566864","https://openalex.org/W4234690636","https://openalex.org/W2542412253","https://openalex.org/W1971777976"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"we":[3],"motivate":[4],"the":[5,54,60],"explicit":[6],"validation":[7],"of":[8,44,56,62],"hold-time":[9,21],"violations":[10],"in":[11],"silicon":[12],"and":[13,24,52],"propose":[14],"a":[15,50],"method":[16],"for":[17],"doing":[18],"so.":[19],"New":[20],"failure":[22],"model":[23],"test":[25,47],"pattern":[26],"generation":[27],"methodologies":[28],"are":[29],"defined.We":[30],"outline":[31],"conditions":[32],"under":[33],"which":[34],"these":[35,46],"tests":[36],"can":[37],"be":[38],"applied":[39],"reliably.":[40],"We":[41],"present":[42],"results":[43],"applying":[45],"patterns":[48],"on":[49,59],"microprocessor":[51],"discuss":[53],"implications":[55],"intermittent":[57],"failures":[58],"relevance":[61],"hazards":[63],"during":[64],"timing":[65],"analysis.":[66]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}