{"id":"https://openalex.org/W1993237560","doi":"https://doi.org/10.1145/1142155.1142167","title":"A survey of fault tolerant methodologies for FPGAs","display_name":"A survey of fault tolerant methodologies for FPGAs","publication_year":2006,"publication_date":"2006-04-01","ids":{"openalex":"https://openalex.org/W1993237560","doi":"https://doi.org/10.1145/1142155.1142167","mag":"1993237560"},"language":"en","primary_location":{"id":"doi:10.1145/1142155.1142167","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1142155.1142167","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027334673","display_name":"J.A. Cheatham","orcid":null},"institutions":[{"id":"https://openalex.org/I19648265","display_name":"Wright State University","ror":"https://ror.org/04qk6pt94","country_code":"US","type":"education","lineage":["https://openalex.org/I19648265"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jason A. Cheatham","raw_affiliation_strings":["Wright State University, Dayton, OH","wright state university, Dayton, OH"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wright State University, Dayton, OH","institution_ids":["https://openalex.org/I19648265"]},{"raw_affiliation_string":"wright state university, Dayton, OH","institution_ids":["https://openalex.org/I19648265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031863054","display_name":"John M. Emmert","orcid":"https://orcid.org/0000-0002-6074-535X"},"institutions":[{"id":"https://openalex.org/I19648265","display_name":"Wright State University","ror":"https://ror.org/04qk6pt94","country_code":"US","type":"education","lineage":["https://openalex.org/I19648265"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John M. Emmert","raw_affiliation_strings":["Wright State University, Dayton, OH","wright state university, Dayton, OH"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wright State University, Dayton, OH","institution_ids":["https://openalex.org/I19648265"]},{"raw_affiliation_string":"wright state university, Dayton, OH","institution_ids":["https://openalex.org/I19648265"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053595059","display_name":"Stan Baumgart","orcid":null},"institutions":[{"id":"https://openalex.org/I102149020","display_name":"University of North Carolina at Charlotte","ror":"https://ror.org/04dawnj30","country_code":"US","type":"education","lineage":["https://openalex.org/I102149020"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stan Baumgart","raw_affiliation_strings":["University of North Carolina, Charlotte, Lexington, KY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of North Carolina, Charlotte, Lexington, KY","institution_ids":["https://openalex.org/I102149020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.1696,"has_fulltext":false,"cited_by_count":104,"citation_normalized_percentile":{"value":0.93522125,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"11","issue":"2","first_page":"501","last_page":"533"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.854756236076355},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.769018292427063},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7253424525260925},{"id":"https://openalex.org/keywords/implementation","display_name":"Implementation","score":0.6542059779167175},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6439492106437683},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4924126863479614},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.47216862440109253},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4416177570819855},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.41001763939857483},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.4012753367424011},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.29100722074508667},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.13482385873794556},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.06960088014602661}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.854756236076355},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.769018292427063},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7253424525260925},{"id":"https://openalex.org/C26713055","wikidata":"https://www.wikidata.org/wiki/Q245962","display_name":"Implementation","level":2,"score":0.6542059779167175},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6439492106437683},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4924126863479614},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.47216862440109253},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4416177570819855},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.41001763939857483},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.4012753367424011},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.29100722074508667},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.13482385873794556},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.06960088014602661},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1142155.1142167","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1142155.1142167","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W191948085","https://openalex.org/W1481050397","https://openalex.org/W1492200690","https://openalex.org/W1594570581","https://openalex.org/W1594667974","https://openalex.org/W1905355278","https://openalex.org/W1930833126","https://openalex.org/W1977920491","https://openalex.org/W1978599303","https://openalex.org/W1983346512","https://openalex.org/W2018658353","https://openalex.org/W2034034477","https://openalex.org/W2043597276","https://openalex.org/W2043788727","https://openalex.org/W2068920660","https://openalex.org/W2082193796","https://openalex.org/W2120295190","https://openalex.org/W2123124978","https://openalex.org/W2125690626","https://openalex.org/W2126343776","https://openalex.org/W2135919750","https://openalex.org/W2143549853","https://openalex.org/W2145011507","https://openalex.org/W2148668586","https://openalex.org/W2151954769","https://openalex.org/W2152780120","https://openalex.org/W2165783907","https://openalex.org/W2912450397","https://openalex.org/W3023634467","https://openalex.org/W4212788429","https://openalex.org/W4239606945","https://openalex.org/W4255686433"],"related_works":["https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W2102525122","https://openalex.org/W4245282135","https://openalex.org/W4306316843","https://openalex.org/W2130594209","https://openalex.org/W2170004886","https://openalex.org/W4300955944","https://openalex.org/W2036953450","https://openalex.org/W2527822502"],"abstract_inverted_index":{"A":[0,83],"wide":[1],"range":[2,13],"of":[3,25,51,55,86,109],"fault":[4,59],"tolerance":[5,60],"methods":[6,27,75,94],"for":[7,34,58],"FPGAs":[8],"have":[9,68],"been":[10,69],"proposed.":[11],"Approaches":[12],"from":[14],"simple":[15],"architectural":[16],"redundancy":[17],"to":[18,47,103],"fully":[19],"on-line":[20],"adaptive":[21],"implementations.":[22],"The":[23],"applications":[24],"these":[26],"also":[28],"differ;":[29],"some":[30],"are":[31,77,95,101],"used":[32,42],"only":[33],"manufacturing":[35],"yield":[36],"enhancement,":[37],"while":[38],"others":[39],"can":[40],"be":[41],"in-system.":[43],"This":[44],"survey":[45],"attempts":[46],"provide":[48],"an":[49],"overview":[50],"the":[52,56,74,81,93,110],"current":[53],"state":[54],"art":[57],"in":[61],"FPGAs.":[62],"It":[63],"is":[64,89],"assumed":[65],"that":[66],"faults":[67],"previously":[70],"detected":[71],"and":[72],"diagnosed;":[73],"presented":[76],"targeted":[78],"towards":[79],"tolerating":[80],"faults.":[82],"detailed":[84],"description":[85],"each":[87],"method":[88],"presented.":[90],"Where":[91],"applicable,":[92],"compared":[96],"using":[97],"common":[98],"metrics.":[99],"Results":[100],"summarized":[102],"present":[104],"a":[105],"succinct,":[106],"comprehensive":[107],"comparison":[108],"different":[111],"approaches.":[112]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":11},{"year":2013,"cited_by_count":14},{"year":2012,"cited_by_count":13}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}