{"id":"https://openalex.org/W2140304312","doi":"https://doi.org/10.1145/1138929.1138936","title":"Automated verification and test case generation for input validation","display_name":"Automated verification and test case generation for input validation","publication_year":2006,"publication_date":"2006-05-23","ids":{"openalex":"https://openalex.org/W2140304312","doi":"https://doi.org/10.1145/1138929.1138936","mag":"2140304312"},"language":"en","primary_location":{"id":"doi:10.1145/1138929.1138936","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1138929.1138936","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2006 international workshop on Automation of software test","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024721944","display_name":"Hui Liu","orcid":"https://orcid.org/0000-0002-3267-6801"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Hui Liu","raw_affiliation_strings":["Nanyang Technological University, Singapore","Nanyang Technological University (Singapore)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Nanyang Technological University (Singapore)","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110248023","display_name":"Hee Beng Kuan Tan","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Hee Beng Kuan Tan","raw_affiliation_strings":["Nanyang Technological University, Singapore","Nanyang Technological University (Singapore)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Nanyang Technological University (Singapore)","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"29","last_page":"35"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12810","display_name":"Real-time simulation and control systems","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6722524762153625},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.46116915345191956},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4527462124824524},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4371987581253052},{"id":"https://openalex.org/keywords/formal-verification","display_name":"Formal verification","score":0.4267141819000244},{"id":"https://openalex.org/keywords/model-validation","display_name":"Model validation","score":0.41998106241226196},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.27382388710975647},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11557623744010925},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.07610273361206055}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6722524762153625},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46116915345191956},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4527462124824524},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4371987581253052},{"id":"https://openalex.org/C111498074","wikidata":"https://www.wikidata.org/wiki/Q173326","display_name":"Formal verification","level":2,"score":0.4267141819000244},{"id":"https://openalex.org/C3019813237","wikidata":"https://www.wikidata.org/wiki/Q65089264","display_name":"Model validation","level":2,"score":0.41998106241226196},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.27382388710975647},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11557623744010925},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.07610273361206055},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C2522767166","wikidata":"https://www.wikidata.org/wiki/Q2374463","display_name":"Data science","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1138929.1138936","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1138929.1138936","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2006 international workshop on Automation of software test","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.652.8668","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.652.8668","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.irisa.fr/lande/lande/icse-proceedings/ast/p29.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320309321","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1584511540","https://openalex.org/W1584652999","https://openalex.org/W1780091754","https://openalex.org/W1819615023","https://openalex.org/W1932714653","https://openalex.org/W1964372169","https://openalex.org/W1979248560","https://openalex.org/W2002454301","https://openalex.org/W2025918428","https://openalex.org/W2043292640","https://openalex.org/W2109180425","https://openalex.org/W2118915305","https://openalex.org/W2131538046","https://openalex.org/W4210611527"],"related_works":["https://openalex.org/W4254560580","https://openalex.org/W2131559056","https://openalex.org/W2127167802","https://openalex.org/W2080984854","https://openalex.org/W2323083271","https://openalex.org/W2019500818","https://openalex.org/W1600330381","https://openalex.org/W2009690023","https://openalex.org/W2156691306","https://openalex.org/W3174838144"],"abstract_inverted_index":{"Input":[0],"validation":[1,87,129],"is":[2],"essential":[3],"for":[4,38,48],"any":[5],"software":[6,22],"that":[7,23,118],"deals":[8],"with":[9,27,94],"input":[10,40,68,81,128,136],"from":[11,55],"its":[12,28,95],"external":[13],"environment.":[14,29],"It":[15],"forms":[16],"a":[17,45,61],"major":[18],"part":[19],"of":[20,33,51,60,65,67,72,85,127,135],"such":[21],"has":[24],"intensive":[25],"interaction":[26],"Through":[30],"the":[31,49,52,57,80,89,100,104,119,133],"integration":[32],"invariant":[34],"and":[35,77,131],"empirical":[36,101],"properties":[37,102],"implementing":[39],"validation,":[41],"this":[42],"paper":[43],"proposes":[44],"novel":[46],"approach":[47,121],"automation":[50],"following":[53],"tasks":[54],"processing":[56],"source":[58,113],"code":[59],"program:":[62],"(1)":[63],"verification":[64],"existence":[66],"validation;":[69],"(2)":[70],"generation":[71],"test":[73,76,96],"cases":[74],"to":[75],"demonstrate":[78],"all":[79],"validations;":[82],"(3)":[83],"classification":[84],"each":[86],"into":[88],"various":[90],"types":[91],"defined":[92],"along":[93],"case":[97],"generated.":[98],"All":[99],"in":[103,124],"theory":[105],"have":[106],"been":[107],"validated":[108],"statistically":[109],"based":[110],"on":[111],"open":[112],"systems.":[114],"Our":[115],"evaluation":[116],"shows":[117],"proposed":[120],"can":[122],"help":[123],"both":[125],"testing":[126],"features":[130],"verifying":[132],"adequacy":[134],"control.":[137]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}