{"id":"https://openalex.org/W2094131653","doi":"https://doi.org/10.1145/1120725.1120799","title":"Propagation delay fault","display_name":"Propagation delay fault","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W2094131653","doi":"https://doi.org/10.1145/1120725.1120799","mag":"2094131653"},"language":"en","primary_location":{"id":"doi:10.1145/1120725.1120799","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1120725.1120799","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2005 conference on Asia South Pacific design automation  - ASP-DAC '05","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103033725","display_name":"Xijiang Lin","orcid":"https://orcid.org/0000-0003-1794-3788"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]},{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]}],"countries":["HU","US"],"is_corresponding":true,"raw_author_name":"Xijiang Lin","raw_affiliation_strings":["Mentor Graphics Corp., Wilsonville, OR","Mentor Graphics Corp. Wilsonville, OR, USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics Corp. Wilsonville, OR, USA","institution_ids":["https://openalex.org/I105695857"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080960636","display_name":"Janusz Rajski","orcid":"https://orcid.org/0000-0003-2124-447X"},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]},{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["HU","US"],"is_corresponding":false,"raw_author_name":"Janusz Rajski","raw_affiliation_strings":["Mentor Graphics Corp., Wilsonville, OR","Mentor Graphics Corp. Wilsonville, OR, USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics Corp. Wilsonville, OR, USA","institution_ids":["https://openalex.org/I105695857"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5103033725"],"corresponding_institution_ids":["https://openalex.org/I105695857","https://openalex.org/I4210156212"],"apc_list":null,"apc_paid":null,"fwci":1.0312,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.78082483,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"178","last_page":"178"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7138726115226746},{"id":"https://openalex.org/keywords/delay-calculation","display_name":"Delay calculation","score":0.7132814526557922},{"id":"https://openalex.org/keywords/propagation-delay","display_name":"Propagation delay","score":0.6765024065971375},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.6260819435119629},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5945197343826294},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5723714828491211},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4899679720401764},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.4741651117801666},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.45285916328430176},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.436184823513031},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.4242897033691406},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3074794411659241},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23526126146316528},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0970386266708374},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.09201118350028992},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.059359073638916016}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7138726115226746},{"id":"https://openalex.org/C174086752","wikidata":"https://www.wikidata.org/wiki/Q5253471","display_name":"Delay calculation","level":3,"score":0.7132814526557922},{"id":"https://openalex.org/C90806461","wikidata":"https://www.wikidata.org/wiki/Q1144416","display_name":"Propagation delay","level":2,"score":0.6765024065971375},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.6260819435119629},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5945197343826294},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5723714828491211},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4899679720401764},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.4741651117801666},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.45285916328430176},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.436184823513031},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.4242897033691406},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3074794411659241},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23526126146316528},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0970386266708374},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.09201118350028992},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.059359073638916016},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1120725.1120799","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1120725.1120799","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2005 conference on Asia South Pacific design automation  - ASP-DAC '05","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W13277579","https://openalex.org/W1589317331","https://openalex.org/W1610717462","https://openalex.org/W1754278879","https://openalex.org/W2005319125","https://openalex.org/W2061946964","https://openalex.org/W2096146619","https://openalex.org/W2097410912","https://openalex.org/W2106585148","https://openalex.org/W2108103162","https://openalex.org/W2110542678","https://openalex.org/W2112062619","https://openalex.org/W2113853304","https://openalex.org/W2115483211","https://openalex.org/W2130062787","https://openalex.org/W2137012712","https://openalex.org/W2140719334","https://openalex.org/W2142063621","https://openalex.org/W2149966432","https://openalex.org/W2149991436","https://openalex.org/W2160010735","https://openalex.org/W2166294071"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W2166897423","https://openalex.org/W2575775159","https://openalex.org/W3148663848","https://openalex.org/W2544222762","https://openalex.org/W2566529656","https://openalex.org/W2577233154","https://openalex.org/W2350226881","https://openalex.org/W4235100100","https://openalex.org/W2094131653"],"abstract_inverted_index":{"A":[0],"new":[1],"fault":[2,7,30,35,66,70,78,105],"model,":[3,8],"named":[4],"propagation":[5,31,71],"delay":[6,16,26,45,50],"is":[9,94],"proposed":[10,34],"to":[11,55,96],"test":[12,91,98],"the":[13,24,29,39,42,48,61,65,69,90,97,103],"gross":[14,43],"gate":[15,21,44],"defects":[17,27],"modeled":[18],"at":[19],"each":[20],"terminal":[22],"and":[23,47,68,89],"distributed":[25,49],"in":[28,83],"paths.":[32],"The":[33],"model":[36],"assumes":[37],"that":[38,76],"sum":[40],"of":[41,87],"defect":[46,51],"are":[52],"large":[53],"enough":[54],"cause":[56],"timing":[57],"violation":[58],"for":[59,102],"all":[60],"paths":[62],"passing":[63],"through":[64],"site":[67],"path.":[72],"Experimental":[73],"results":[74],"demonstrate":[75],"high":[77],"coverage":[79],"can":[80],"be":[81],"achieved":[82],"a":[84],"reasonable":[85],"amount":[86],"time":[88],"set":[92,99],"size":[93,100],"comparable":[95],"generated":[101],"transition":[104],"model.":[106]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}