{"id":"https://openalex.org/W1979020681","doi":"https://doi.org/10.1145/1119772.1119779","title":"A statistical gate delay model for intra-chip and inter-chip variabilities","display_name":"A statistical gate delay model for intra-chip and inter-chip variabilities","publication_year":2003,"publication_date":"2003-01-01","ids":{"openalex":"https://openalex.org/W1979020681","doi":"https://doi.org/10.1145/1119772.1119779","mag":"1979020681"},"language":"en","primary_location":{"id":"doi:10.1145/1119772.1119779","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1119772.1119779","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2003 conference on Asia South Pacific design automation  - ASPDAC","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064086312","display_name":"Kenichi Okada","orcid":"https://orcid.org/0000-0002-1082-7672"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Kenichi Okada","raw_affiliation_strings":["Kyoto University, Kyoto, Japan","[Graduate School of Informatics, Kyoto University, Japan]"],"affiliations":[{"raw_affiliation_string":"Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"[Graduate School of Informatics, Kyoto University, Japan]","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108396185","display_name":"Kento Yamaoka","orcid":null},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kento Yamaoka","raw_affiliation_strings":["Kyoto University, Kyoto, Japan","[Graduate School of Informatics, Kyoto University, Japan]"],"affiliations":[{"raw_affiliation_string":"Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"[Graduate School of Informatics, Kyoto University, Japan]","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026865951","display_name":"Hidetoshi Onodera","orcid":"https://orcid.org/0000-0001-5198-0668"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hidetoshi Onodera","raw_affiliation_strings":["Kyoto University, Kyoto, Japan","[Graduate School of Informatics, Kyoto University, Japan]"],"affiliations":[{"raw_affiliation_string":"Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"[Graduate School of Informatics, Kyoto University, Japan]","institution_ids":["https://openalex.org/I22299242"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5064086312"],"corresponding_institution_ids":["https://openalex.org/I22299242"],"apc_list":null,"apc_paid":null,"fwci":3.1872,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.9134167,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"31","last_page":"31"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.7442846298217773},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6606467366218567},{"id":"https://openalex.org/keywords/statistical-model","display_name":"Statistical model","score":0.4722292423248291},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.46724653244018555},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44345566630363464},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42132696509361267},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.157616525888443},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1361008584499359},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13208189606666565},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10141357779502869},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08586344122886658},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.05651652812957764}],"concepts":[{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.7442846298217773},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6606467366218567},{"id":"https://openalex.org/C114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","level":2,"score":0.4722292423248291},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.46724653244018555},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44345566630363464},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42132696509361267},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.157616525888443},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1361008584499359},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13208189606666565},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10141357779502869},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08586344122886658},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.05651652812957764},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1145/1119772.1119779","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1119772.1119779","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2003 conference on Asia South Pacific design automation  - ASPDAC","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.324.553","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.324.553","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cecs.uci.edu/~papers/compendium94-03/papers/2003/aspdac03/pdffiles/01b_1.pdf","raw_type":"text"},{"id":"pmh:oai:t2r2.star.titech.ac.jp:00088368","is_oa":false,"landing_page_url":"http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100482435","pdf_url":null,"source":{"id":"https://openalex.org/S4377196385","display_name":"Tokyo Tech Research Repository (Tokyo Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I114531698","host_organization_name":"Tokyo Institute of Technology","host_organization_lineage":["https://openalex.org/I114531698"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference Paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W61749477","https://openalex.org/W1577901703","https://openalex.org/W2000836282","https://openalex.org/W2003506352","https://openalex.org/W2034948999","https://openalex.org/W2109757138","https://openalex.org/W2110706133","https://openalex.org/W2117324805","https://openalex.org/W2136219890","https://openalex.org/W2138451337","https://openalex.org/W2140437015","https://openalex.org/W2140823559","https://openalex.org/W2145245103","https://openalex.org/W2157210245","https://openalex.org/W2533387447"],"related_works":["https://openalex.org/W2386430105","https://openalex.org/W2356521405","https://openalex.org/W2038534795","https://openalex.org/W2384358604","https://openalex.org/W1567829292","https://openalex.org/W3001063351","https://openalex.org/W3196905815","https://openalex.org/W2351370765","https://openalex.org/W2321594810","https://openalex.org/W3181247111"],"abstract_inverted_index":{"This":[0,70],"paper":[1],"proposes":[2],"a":[3,20,25,30,58,76,87,93,109,125],"model":[4,17,23,85],"to":[5,56,99],"calculate":[6],"statistical":[7,21,77,88],"gate-delay":[8,26,84],"variation":[9,67,91,128],"caused":[10],"by":[11,61,130],"intra-chip":[12,40,51,66,101],"and":[13,24,32,42,102,118],"inter-chip":[14,44,103],"variabilities.":[15],"Our":[16,83],"consists":[18],"of":[19,35,49,65,105,115,124,134],"transistor":[22,36,107,135],"model.":[27],"We":[28,111],"present":[29],"modeling":[31,48],"extracting":[33],"method":[34,96],"characteristics":[37],"for":[38],"the":[39,43,47,50,63,100,113,131],"variability":[41,104],"variability.":[45],"In":[46],"variability,":[52],"it":[53],"is":[54,68,72],"important":[55],"consider":[57],"gate-size":[59],"dependence":[60],"which":[62],"amount":[64],"affected.":[69],"effect":[71],"not":[73],"captured":[74],"in":[75,108],"delay":[78,90,127],"analysis":[79],"reported":[80],"so":[81],"far.":[82],"characterizes":[86],"gate":[89],"using":[92],"response":[94],"surface":[95],"(RSM)":[97],"according":[98],"each":[106],"gate.":[110],"evaluate":[112],"accuracy":[114],"our":[116],"model,":[117],"we":[119],"show":[120],"some":[121],"simulated":[122],"results":[123],"circuit":[126],"characterized":[129],"measured":[132],"variances":[133],"currents.":[136]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}