{"id":"https://openalex.org/W4247035379","doi":"https://doi.org/10.1145/1083274.1083288","title":"The effect of code coverage on fault detection under different testing profiles","display_name":"The effect of code coverage on fault detection under different testing profiles","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W4247035379","doi":"https://doi.org/10.1145/1083274.1083288"},"language":"en","primary_location":{"id":"doi:10.1145/1083274.1083288","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1083274.1083288","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the first international workshop on Advances in model-based testing  - A-MOST '05","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100960178","display_name":"Xia Cai","orcid":"https://orcid.org/0009-0008-6695-3775"},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xia Cai","raw_affiliation_strings":["The Chinese University of Hong Kong"],"affiliations":[{"raw_affiliation_string":"The Chinese University of Hong Kong","institution_ids":["https://openalex.org/I177725633"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069596903","display_name":"Michael R. Lyu","orcid":"https://orcid.org/0000-0002-3666-5798"},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"CN","type":"education","lineage":["https://openalex.org/I177725633"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Michael R. Lyu","raw_affiliation_strings":["The Chinese University of Hong Kong"],"affiliations":[{"raw_affiliation_string":"The Chinese University of Hong Kong","institution_ids":["https://openalex.org/I177725633"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100960178"],"corresponding_institution_ids":["https://openalex.org/I177725633"],"apc_list":null,"apc_paid":null,"fwci":0.7163,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.77277778,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.9866999983787537,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9761999845504761,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.8466618061065674},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6908648610115051},{"id":"https://openalex.org/keywords/random-testing","display_name":"Random testing","score":0.6487417221069336},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.62093186378479},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5992263555526733},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.587661623954773},{"id":"https://openalex.org/keywords/non-regression-testing","display_name":"Non-regression testing","score":0.4993405342102051},{"id":"https://openalex.org/keywords/white-box-testing","display_name":"White-box testing","score":0.4758843183517456},{"id":"https://openalex.org/keywords/software-performance-testing","display_name":"Software performance testing","score":0.47533607482910156},{"id":"https://openalex.org/keywords/estimator","display_name":"Estimator","score":0.47522881627082825},{"id":"https://openalex.org/keywords/regression-testing","display_name":"Regression testing","score":0.4561831057071686},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.43490517139434814},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.42514321208000183},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.40405863523483276},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3698541522026062},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.363413006067276},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.19136455655097961},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.1792798936367035},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14911258220672607},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.14688289165496826},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.1390000581741333},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.12176692485809326},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.10792946815490723},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0798397958278656}],"concepts":[{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.8466618061065674},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6908648610115051},{"id":"https://openalex.org/C106159264","wikidata":"https://www.wikidata.org/wiki/Q17146789","display_name":"Random testing","level":4,"score":0.6487417221069336},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.62093186378479},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5992263555526733},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.587661623954773},{"id":"https://openalex.org/C86469151","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Non-regression testing","level":5,"score":0.4993405342102051},{"id":"https://openalex.org/C162443782","wikidata":"https://www.wikidata.org/wiki/Q1066228","display_name":"White-box testing","level":5,"score":0.4758843183517456},{"id":"https://openalex.org/C178059732","wikidata":"https://www.wikidata.org/wiki/Q1982529","display_name":"Software performance testing","level":5,"score":0.47533607482910156},{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.47522881627082825},{"id":"https://openalex.org/C161821725","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Regression testing","level":5,"score":0.4561831057071686},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.43490517139434814},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.42514321208000183},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.40405863523483276},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3698541522026062},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.363413006067276},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.19136455655097961},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.1792798936367035},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14911258220672607},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.14688289165496826},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.1390000581741333},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.12176692485809326},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.10792946815490723},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0798397958278656},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1083274.1083288","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1083274.1083288","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the first international workshop on Advances in model-based testing  - A-MOST '05","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2387992358","https://openalex.org/W3214776400","https://openalex.org/W3197709817","https://openalex.org/W2560445721","https://openalex.org/W2074050424","https://openalex.org/W2051264696","https://openalex.org/W2041379335","https://openalex.org/W2107484131","https://openalex.org/W3149216967","https://openalex.org/W2955592476"],"abstract_inverted_index":{"Software":[0],"testing":[1,20,40,67,72,84,87,104,155,160,184],"is":[2,21,112,130,172],"a":[3,45,114,132,144],"key":[4,16],"procedure":[5],"to":[6,35,91],"ensure":[7],"high":[8],"quality":[9],"and":[10,24,85,98,161,169],"reliability":[11],"of":[12,26,50,63,78,120,139,195],"software":[13,19],"programs.":[14],"The":[15,193],"issue":[17],"in":[18,88,150,174,178,188,202],"the":[22,61,76,93,118,124,136,164,189],"selection":[23],"evaluation":[25],"different":[27,71,103,183,196],"test":[28,126,141,148,176,191],"cases.":[29],"Code":[30],"coverage":[31,65,83,97,111,168,171,197],"has":[32],"been":[33],"proposed":[34],"be":[36],"an":[37],"estimator":[38,134],"for":[39,117,135,147],"effectiveness,":[41],"but":[42,143],"it":[43,129],"remains":[44],"controversial":[46],"topic":[47],"which":[48],"lacks":[49],"support":[51],"from":[52],"empirical":[53],"data.":[54],"In":[55],"this":[56],"study,":[57],"we":[58,81],"hypothesize":[59],"that":[60],"estimation":[62],"code":[64,79,96,110,167],"on":[66,123],"effectiveness":[68],"varies":[69],"under":[70,102],"profiles.":[73,105],"To":[74],"evaluate":[75],"performance":[77],"coverage,":[80],"employ":[82],"mutation":[86],"our":[89,107,203],"experiment":[90],"investigate":[92],"relationship":[94],"between":[95,166],"fault":[99,121,137,170],"detection":[100,122,138],"capability":[101,119],"From":[106],"experimental":[108],"data,":[109],"simply":[113],"moderate":[115],"indicator":[116],"whole":[125,190],"set.":[127,192],"However,":[128],"clearly":[131],"good":[133],"exceptional":[140],"cases,":[142],"poor":[145],"one":[146],"cases":[149],"normal":[151],"operations.":[152],"For":[153],"other":[154],"profiles,":[156],"such":[157],"as":[158],"functional":[159,175],"random":[162,179],"testing,":[163,180],"correlation":[165],"higher":[173],"than":[177],"although":[181],"these":[182],"profiles":[185],"are":[186,199],"complementary":[187],"effects":[194],"metrics":[198],"also":[200],"addressed":[201],"experiment.":[204]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}