{"id":"https://openalex.org/W2739131845","doi":"https://doi.org/10.1145/1083217.1083229","title":"Sensitivity analysis for a scenario-based reliability prediction model","display_name":"Sensitivity analysis for a scenario-based reliability prediction model","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W2739131845","doi":"https://doi.org/10.1145/1083217.1083229","mag":"2739131845"},"language":"en","primary_location":{"id":"doi:10.1145/1083217.1083229","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1083217.1083229","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2005 workshop on Architecting dependable systems  - WADS '05","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039374886","display_name":"Gena\u00edna Nunes Rodrigues","orcid":"https://orcid.org/0000-0003-1661-8131"},"institutions":[{"id":"https://openalex.org/I45129253","display_name":"University College London","ror":"https://ror.org/02jx3x895","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I45129253"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Gena\u00edna N. Rodrigues","raw_affiliation_strings":["University College London, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University College London, United Kingdom","institution_ids":["https://openalex.org/I45129253"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047104641","display_name":"David S. Rosenblum","orcid":"https://orcid.org/0000-0003-1685-4206"},"institutions":[{"id":"https://openalex.org/I45129253","display_name":"University College London","ror":"https://ror.org/02jx3x895","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I45129253"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"David S. Rosenblum","raw_affiliation_strings":["University College London, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University College London, United Kingdom","institution_ids":["https://openalex.org/I45129253"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045087569","display_name":"Sebasti\u00e1n Uchitel","orcid":"https://orcid.org/0000-0001-9352-1478"},"institutions":[{"id":"https://openalex.org/I47508984","display_name":"Imperial College London","ror":"https://ror.org/041kmwe10","country_code":"GB","type":"education","lineage":["https://openalex.org/I47508984"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Sebastian Uchitel","raw_affiliation_strings":["Imperial College London, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imperial College London, United Kingdom","institution_ids":["https://openalex.org/I47508984"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":7.6418,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.96602136,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.8830999732017517,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.8830999732017517,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.7729150056838989},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.616801917552948},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5783458352088928},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5522246956825256},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16248849034309387},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.09144338965415955},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06237339973449707}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.7729150056838989},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.616801917552948},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5783458352088928},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5522246956825256},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16248849034309387},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.09144338965415955},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06237339973449707},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1083217.1083229","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1083217.1083229","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2005 workshop on Architecting dependable systems  - WADS '05","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"As":[0],"a":[1,48,96,126],"popular":[2],"means":[3],"for":[4,41],"capturing":[5],"behavioural":[6],"requirements,":[7],"scenarios":[8,23,154],"show":[9],"how":[10,103,120],"components":[11,130],"interact":[12],"to":[13,27,51],"provide":[14],"system-level":[15],"functionality.":[16],"If":[17],"component":[18,57,104],"reliability":[19,31,45,83,105,123,162],"information":[20],"is":[21],"available,":[22],"can":[24,85],"be":[25,86],"used":[26],"perform":[28],"early":[29],"system":[30,44,69,80,113,122],"assessment.":[32],"In":[33],"previous":[34,92],"work":[35,93],"we":[36,118,147],"presented":[37],"an":[38],"automated":[39],"approach":[40],"predicting":[42],"software":[43,145],"that":[46,99],"extends":[47],"scenario":[49,61,76,134],"specification":[50],"model":[52],"(1)":[53],"the":[54,68,74,79,111,121,129,133,140,150,157],"probability":[55],"of":[56,67,128,143,152,160],"failure,":[58],"and":[59,94,106,132],"(2)":[60],"transition":[62,135],"probabilities.":[63,136],"Probabilistic":[64],"behaviour":[65,81],"models":[66],"are":[70],"then":[71],"synthesized":[72],"from":[73],"extended":[75],"specification.":[77],"From":[78],"model,":[82],"prediction":[84,163],"computed.":[87],"This":[88],"paper":[89],"complements":[90],"our":[91,161],"presents":[95],"sensitivity":[97,158],"analysis":[98,159],"supports":[100],"reasoning":[101],"about":[102],"usage":[107],"profiles":[108],"impact":[109],"on":[110],"overall":[112],"reliability.":[114],"For":[115],"this":[116],"purpose,":[117],"present":[119],"varies":[124],"as":[125],"function":[127],"reliabilities":[131],"Taking":[137],"into":[138,156],"account":[139],"concurrent":[141],"nature":[142],"component-based":[144],"systems,":[146],"also":[148],"analyse":[149],"effect":[151],"implied":[153],"prevention":[155],"technique.":[164]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}