{"id":"https://openalex.org/W2092191173","doi":"https://doi.org/10.1145/1081081.1081103","title":"Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic","display_name":"Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W2092191173","doi":"https://doi.org/10.1145/1081081.1081103","mag":"2092191173"},"language":"en","primary_location":{"id":"doi:10.1145/1081081.1081103","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1081081.1081103","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 18th annual symposium on Integrated circuits and system design - SBCCI '05","raw_type":"proceedings-article"},"type":"conference-abstract","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014280371","display_name":"Egas Henes Neto","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112140","display_name":"Universidade Estadual do Rio Grande do Sul","ror":"https://ror.org/01vxwy461","country_code":"BR","type":"education","lineage":["https://openalex.org/I4210112140"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Egas Henes Neto","raw_affiliation_strings":["Universidade Estadual do Rio Grande do Sul, Brazil","Engenharia em Sistemas Digitais, Univ. Estadual do Rio Grande do Sul, Guaiba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Estadual do Rio Grande do Sul, Brazil","institution_ids":["https://openalex.org/I4210112140"]},{"raw_affiliation_string":"Engenharia em Sistemas Digitais, Univ. Estadual do Rio Grande do Sul, Guaiba","institution_ids":["https://openalex.org/I4210112140"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103523918","display_name":"Ivandro Ribeiro","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112140","display_name":"Universidade Estadual do Rio Grande do Sul","ror":"https://ror.org/01vxwy461","country_code":"BR","type":"education","lineage":["https://openalex.org/I4210112140"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Ivandro Ribeiro","raw_affiliation_strings":["Universidade Estadual do Rio Grande do Sul, Brazil","Engenharia em Sistemas Digitais, Univ. Estadual do Rio Grande do Sul, Guaiba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Estadual do Rio Grande do Sul, Brazil","institution_ids":["https://openalex.org/I4210112140"]},{"raw_affiliation_string":"Engenharia em Sistemas Digitais, Univ. Estadual do Rio Grande do Sul, Guaiba","institution_ids":["https://openalex.org/I4210112140"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042205514","display_name":"Michele O. Vieira","orcid":"https://orcid.org/0000-0003-0836-2738"},"institutions":[{"id":"https://openalex.org/I4210112140","display_name":"Universidade Estadual do Rio Grande do Sul","ror":"https://ror.org/01vxwy461","country_code":"BR","type":"education","lineage":["https://openalex.org/I4210112140"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Michele Vieira","raw_affiliation_strings":["Universidade Estadual do Rio Grande do Sul, Brazil","Engenharia em Sistemas Digitais, Univ. Estadual do Rio Grande do Sul, Guaiba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Estadual do Rio Grande do Sul, Brazil","institution_ids":["https://openalex.org/I4210112140"]},{"raw_affiliation_string":"Engenharia em Sistemas Digitais, Univ. Estadual do Rio Grande do Sul, Guaiba","institution_ids":["https://openalex.org/I4210112140"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022015482","display_name":"Gilson Wirth","orcid":"https://orcid.org/0000-0002-4990-5113"},"institutions":[{"id":"https://openalex.org/I4210112140","display_name":"Universidade Estadual do Rio Grande do Sul","ror":"https://ror.org/01vxwy461","country_code":"BR","type":"education","lineage":["https://openalex.org/I4210112140"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Gilson Wirth","raw_affiliation_strings":["Universidade Estadual do Rio Grande do Sul, Brazil","Engenharia em Sistemas Digitais, Univ. Estadual do Rio Grande do Sul, Guaiba"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Estadual do Rio Grande do Sul, Brazil","institution_ids":["https://openalex.org/I4210112140"]},{"raw_affiliation_string":"Engenharia em Sistemas Digitais, Univ. Estadual do Rio Grande do Sul, Guaiba","institution_ids":["https://openalex.org/I4210112140"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024813896","display_name":"Fernanda Lima Kastensmidt","orcid":"https://orcid.org/0000-0001-5767-8582"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Fernanda Lima Kastensmidt","raw_affiliation_strings":["Universidade Federal do Rio Grande do Sul, Brazil","[Universidade Federal do Rio Grande do Sul, Brazil]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal do Rio Grande do Sul, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"[Universidade Federal do Rio Grande do Sul, Brazil]","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"62","last_page":"62"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.940082311630249},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.853062629699707},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.7292479872703552},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6870236992835999},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6861659288406372},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6586894392967224},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.609773576259613},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5912293791770935},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5450461506843567},{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.5203611254692078},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5047181844711304},{"id":"https://openalex.org/keywords/current-sensor","display_name":"Current sensor","score":0.4916420578956604},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.49075064063072205},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.48525118827819824},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4327138364315033},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.41208717226982117},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40272057056427},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36490708589553833},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2773210406303406},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.11277994513511658}],"concepts":[{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.940082311630249},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.853062629699707},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.7292479872703552},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6870236992835999},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6861659288406372},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6586894392967224},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.609773576259613},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5912293791770935},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5450461506843567},{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.5203611254692078},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5047181844711304},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.4916420578956604},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.49075064063072205},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.48525118827819824},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4327138364315033},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.41208717226982117},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40272057056427},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36490708589553833},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2773210406303406},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.11277994513511658},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1081081.1081103","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1081081.1081103","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 18th annual symposium on Integrated circuits and system design - SBCCI '05","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8500000238418579,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2063837668","https://openalex.org/W2118126629","https://openalex.org/W2141068710","https://openalex.org/W2153922221","https://openalex.org/W2163493261","https://openalex.org/W2169213530"],"related_works":["https://openalex.org/W2622269177","https://openalex.org/W3141633657","https://openalex.org/W1523508240","https://openalex.org/W2102538861","https://openalex.org/W1991534444","https://openalex.org/W2042259532","https://openalex.org/W2122334461","https://openalex.org/W2165400042","https://openalex.org/W2086616086","https://openalex.org/W2745265705"],"abstract_inverted_index":{"In":[0,28,56],"this":[1,29],"paper,":[2],"we":[3],"propose":[4],"a":[5,52,77],"new":[6],"approach":[7,87],"for":[8,132],"using":[9],"Built-in":[10],"Current":[11],"Sensor":[12],"(BICS)":[13],"to":[14,39,43,118],"detect":[15,44],"not":[16],"only":[17],"transient":[18],"upsets":[19],"in":[20,25,35,68,101,135],"sequential":[21],"logic":[22],"but":[23],"also":[24],"combinational":[26],"circuits.":[27],"approach,":[30],"the":[31,36,58,64,69,82,96,102,125,133],"BICS":[32,60,94,128],"is":[33],"connected":[34],"design":[37,134],"bulk":[38,107,127],"increase":[40],"its":[41],"sensitivity":[42],"any":[45],"current":[46,114],"discrepancy":[47],"that":[48,124],"may":[49],"occur":[50],"during":[51],"charged":[53,119],"particle":[54,120],"strike.":[55,121],"addition,":[57],"proposed":[59,86,126],"can":[61,75],"inform":[62],"if":[63],"upset":[65],"has":[66,145],"occurred":[67],"PMOS":[70],"or":[71],"NMOS":[72],"transistors,":[73],"which":[74],"generate":[76],"more":[78],"precise":[79],"evaluation":[80],"of":[81,113,137],"corrupted":[83],"region.":[84],"The":[85,93,106],"was":[88],"validated":[89],"by":[90],"Spice":[91],"simulation.":[92],"and":[95,140,143],"case-studied":[97],"circuits":[98],"were":[99],"designed":[100],"100nm":[103],"CMOS":[104],"technology.":[105],"BIC":[108],"sensor":[109],"detects":[110],"various":[111],"shapes":[112],"pulses":[115],"generated":[116],"due":[117],"Results":[122],"show":[123],"presents":[129],"minor":[130],"penalties":[131],"terms":[136],"area,":[138],"performance":[139],"power":[141],"consumption":[142],"it":[144],"high":[146],"detection":[147],"sensitivity.":[148]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":3}],"updated_date":"2026-07-19T07:52:34.831488","created_date":"2025-10-10T00:00:00"}