{"id":"https://openalex.org/W2123554048","doi":"https://doi.org/10.1145/1065579.1065779","title":"An effective DFM strategy requires accurate process and IP pre-characterization","display_name":"An effective DFM strategy requires accurate process and IP pre-characterization","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W2123554048","doi":"https://doi.org/10.1145/1065579.1065779","mag":"2123554048"},"language":"en","primary_location":{"id":"doi:10.1145/1065579.1065779","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1065579.1065779","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 42nd annual conference on Design automation  - DAC '05","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047784337","display_name":"Carlo Guardiani","orcid":"https://orcid.org/0000-0002-8914-9260"},"institutions":[{"id":"https://openalex.org/I65376102","display_name":"PDF Solutions (United States)","ror":"https://ror.org/007737841","country_code":"US","type":"company","lineage":["https://openalex.org/I65376102"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Carlo Guardiani","raw_affiliation_strings":["PDF Solutions, San Jose, CA","PDF/Solutions, San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"PDF Solutions, San Jose, CA","institution_ids":["https://openalex.org/I65376102"]},{"raw_affiliation_string":"PDF/Solutions, San Jose, CA, USA","institution_ids":["https://openalex.org/I65376102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021372327","display_name":"Massimo Bertoletti","orcid":null},"institutions":[{"id":"https://openalex.org/I65376102","display_name":"PDF Solutions (United States)","ror":"https://ror.org/007737841","country_code":"US","type":"company","lineage":["https://openalex.org/I65376102"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Massimo Bertoletti","raw_affiliation_strings":["PDF Solutions, San Jose, CA"],"affiliations":[{"raw_affiliation_string":"PDF Solutions, San Jose, CA","institution_ids":["https://openalex.org/I65376102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078090160","display_name":"Nicola Dragone","orcid":"https://orcid.org/0009-0007-5696-414X"},"institutions":[{"id":"https://openalex.org/I65376102","display_name":"PDF Solutions (United States)","ror":"https://ror.org/007737841","country_code":"US","type":"company","lineage":["https://openalex.org/I65376102"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nicola Dragone","raw_affiliation_strings":["PDF Solutions, San Jose, CA","PDF/Solutions, San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"PDF Solutions, San Jose, CA","institution_ids":["https://openalex.org/I65376102"]},{"raw_affiliation_string":"PDF/Solutions, San Jose, CA, USA","institution_ids":["https://openalex.org/I65376102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032196807","display_name":"Marco Malcotti","orcid":null},"institutions":[{"id":"https://openalex.org/I65376102","display_name":"PDF Solutions (United States)","ror":"https://ror.org/007737841","country_code":"US","type":"company","lineage":["https://openalex.org/I65376102"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Marco Malcotti","raw_affiliation_strings":["PDF Solutions, San Jose, CA","PDF/Solutions, San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"PDF Solutions, San Jose, CA","institution_ids":["https://openalex.org/I65376102"]},{"raw_affiliation_string":"PDF/Solutions, San Jose, CA, USA","institution_ids":["https://openalex.org/I65376102"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007750216","display_name":"Patrick J. McNamara","orcid":"https://orcid.org/0000-0002-9708-3345"},"institutions":[{"id":"https://openalex.org/I65376102","display_name":"PDF Solutions (United States)","ror":"https://ror.org/007737841","country_code":"US","type":"company","lineage":["https://openalex.org/I65376102"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Patrick McNamara","raw_affiliation_strings":["PDF Solutions, San Jose, CA","PDF/Solutions, San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"PDF Solutions, San Jose, CA","institution_ids":["https://openalex.org/I65376102"]},{"raw_affiliation_string":"PDF/Solutions, San Jose, CA, USA","institution_ids":["https://openalex.org/I65376102"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5047784337"],"corresponding_institution_ids":["https://openalex.org/I65376102"],"apc_list":null,"apc_paid":null,"fwci":3.9126,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.93542552,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"760","last_page":"760"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/design-for-manufacturability","display_name":"Design for manufacturability","score":0.8236925601959229},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5970075726509094},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5646157264709473},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5522440075874329},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.46376582980155945},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.19458577036857605},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1864461600780487},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.11776533722877502},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1026710569858551}],"concepts":[{"id":"https://openalex.org/C62064638","wikidata":"https://www.wikidata.org/wiki/Q553878","display_name":"Design for manufacturability","level":2,"score":0.8236925601959229},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5970075726509094},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5646157264709473},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5522440075874329},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46376582980155945},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.19458577036857605},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1864461600780487},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.11776533722877502},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1026710569858551},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1065579.1065779","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1065579.1065779","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 42nd annual conference on Design automation  - DAC '05","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1567810144","https://openalex.org/W1685139098","https://openalex.org/W1873030251","https://openalex.org/W2122192918","https://openalex.org/W2161055040","https://openalex.org/W2161678494"],"related_works":["https://openalex.org/W2118975943","https://openalex.org/W2166756701","https://openalex.org/W4283465125","https://openalex.org/W2490623042","https://openalex.org/W2170602543","https://openalex.org/W1994432930","https://openalex.org/W2328982588","https://openalex.org/W2126341512","https://openalex.org/W1977094789","https://openalex.org/W2527194500"],"abstract_inverted_index":{"No":[0],"abstract":[1],"available.":[2]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}