{"id":"https://openalex.org/W1993741688","doi":"https://doi.org/10.1145/1065579.1065671","title":"The Titanic","display_name":"The Titanic","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W1993741688","doi":"https://doi.org/10.1145/1065579.1065671","mag":"1993741688"},"language":"en","primary_location":{"id":"doi:10.1145/1065579.1065671","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1065579.1065671","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 42nd annual conference on Design automation  - DAC '05","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046886936","display_name":"Sani Nassif","orcid":"https://orcid.org/0000-0002-5096-4794"},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sani R. Nassif","raw_affiliation_strings":["IBM - Research, Austin, TX","IBM Research Austin, TX"],"affiliations":[{"raw_affiliation_string":"IBM - Research, Austin, TX","institution_ids":["https://openalex.org/I4210156936"]},{"raw_affiliation_string":"IBM Research Austin, TX","institution_ids":["https://openalex.org/I4210156936"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015661017","display_name":"Paul S. Zuchowski","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Paul S. Zuchowski","raw_affiliation_strings":["IBM, Burlington, VT","IBM, Burlington, VT#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM, Burlington, VT","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM, Burlington, VT#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015870844","display_name":"Claude Moughanni","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Claude Moughanni","raw_affiliation_strings":["Freescale, Austin, TX"],"affiliations":[{"raw_affiliation_string":"Freescale, Austin, TX","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034330095","display_name":"M. Moosa","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mohamed Moosa","raw_affiliation_strings":["Freescale, Austin, TX"],"affiliations":[{"raw_affiliation_string":"Freescale, Austin, TX","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078565660","display_name":"S. Posluszny","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stephen D. Posluszny","raw_affiliation_strings":["IBM, Austin, TX","IBM, Austin TX"],"affiliations":[{"raw_affiliation_string":"IBM, Austin, TX","institution_ids":["https://openalex.org/I4210156936"]},{"raw_affiliation_string":"IBM, Austin TX","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034042475","display_name":"Ward Vercruysse","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ward Vercruysse","raw_affiliation_strings":["AMD, Austin, TX"],"affiliations":[{"raw_affiliation_string":"AMD, Austin, TX","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5046886936"],"corresponding_institution_ids":["https://openalex.org/I4210156936"],"apc_list":null,"apc_paid":null,"fwci":0.8283967,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.77478368,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"349","last_page":"349"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9567000269889832,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9567000269889832,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6776342391967773},{"id":"https://openalex.org/keywords/session","display_name":"Session (web analytics)","score":0.6746439933776855},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6108169555664062},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.5588135123252869},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4922865927219391},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4130234718322754},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.32729971408843994},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2881786525249481},{"id":"https://openalex.org/keywords/world-wide-web","display_name":"World Wide Web","score":0.14295300841331482}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6776342391967773},{"id":"https://openalex.org/C2779182362","wikidata":"https://www.wikidata.org/wiki/Q17126187","display_name":"Session (web analytics)","level":2,"score":0.6746439933776855},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6108169555664062},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.5588135123252869},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4922865927219391},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4130234718322754},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.32729971408843994},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2881786525249481},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.14295300841331482},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1065579.1065671","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1065579.1065671","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 42nd annual conference on Design automation  - DAC '05","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2374901194","https://openalex.org/W2033512842","https://openalex.org/W2994319598","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3116237489","https://openalex.org/W1607054433"],"abstract_inverted_index":{"We":[0,8],"often":[1],"hear":[2],"about":[3,60],"success":[4],"stories":[5],"in":[6,62],"EDA.":[7,64],"are":[9,56],"all":[10],"justifiably":[11],"proud":[12],"of":[13,87],"the":[14,20,34,88],"impact":[15],"we":[16,50],"collectively":[17],"make":[18],"on":[19],"overall":[21],"integrated":[22],"circuit":[23],"design":[24],"and":[25,76],"manufacturing":[26],"machine.":[27],"It":[28],"is":[29],"fair":[30],"to":[31,58],"say,":[32],"however,":[33],"one":[35,42],"learns":[36],"far":[37],"more":[38],"from":[39,44],"failure":[40],"than":[41],"does":[43],"success.":[45],"In":[46,81],"this":[47],"special":[48],"session":[49],"found":[51],"several":[52],"brave":[53],"practitioners":[54],"who":[55],"willing":[57],"talk":[59],"problems":[61,66],"business-as-usual":[63],"These":[65],"include":[67],"technology":[68],"related":[69,72],"issues;":[70],"reliability":[71],"issues,":[73],"power":[74],"issues":[75,79],"even":[77],"methodology":[78],"-":[80],"short,":[82],"covering":[83],"a":[84],"wide":[85],"swatch":[86],"EDA":[89],"domain.":[90]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}