{"id":"https://openalex.org/W2107515594","doi":"https://doi.org/10.1145/1065579.1065630","title":"A noise-driven effective capacitance method with fast embedded noise rule calculation for functional noise analysis","display_name":"A noise-driven effective capacitance method with fast embedded noise rule calculation for functional noise analysis","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W2107515594","doi":"https://doi.org/10.1145/1065579.1065630","mag":"2107515594"},"language":"en","primary_location":{"id":"doi:10.1145/1065579.1065630","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1065579.1065630","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 42nd annual conference on Design automation  - DAC '05","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111882522","display_name":"Haihua Su","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Haihua Su","raw_affiliation_strings":["IBM Corporation, Austin, TX","IBM Corporation Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Corporation, Austin, TX","institution_ids":[]},{"raw_affiliation_string":"IBM Corporation Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059269253","display_name":"D. Widiger","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Widiger","raw_affiliation_strings":["IBM Corporation, Austin, TX","IBM Corporation Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Corporation, Austin, TX","institution_ids":[]},{"raw_affiliation_string":"IBM Corporation Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110899319","display_name":"Chandramouli Kashyap","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chandramouli Kashyap","raw_affiliation_strings":["IBM Corporation, Austin, TX","IBM Corporation Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Corporation, Austin, TX","institution_ids":[]},{"raw_affiliation_string":"IBM Corporation Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006587869","display_name":"Frank Liu","orcid":"https://orcid.org/0000-0001-6615-0739"},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Frank Liu","raw_affiliation_strings":["IBM Corporation, Austin, TX","IBM Corporation Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Corporation, Austin, TX","institution_ids":[]},{"raw_affiliation_string":"IBM Corporation Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052285600","display_name":"B. Krauter","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Byron Krauter","raw_affiliation_strings":["IBM Corporation, Austin, TX","IBM Corporation Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Corporation, Austin, TX","institution_ids":[]},{"raw_affiliation_string":"IBM Corporation Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3634,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.67213883,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"186","last_page":"186"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6206144094467163},{"id":"https://openalex.org/keywords/th\u00e9venins-theorem","display_name":"Th\u00e9venin's theorem","score":0.6194595694541931},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6099501252174377},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.573853075504303},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5665237903594971},{"id":"https://openalex.org/keywords/effective-input-noise-temperature","display_name":"Effective input noise temperature","score":0.5553568005561829},{"id":"https://openalex.org/keywords/superposition-principle","display_name":"Superposition principle","score":0.5216558575630188},{"id":"https://openalex.org/keywords/rlc-circuit","display_name":"RLC circuit","score":0.4848662316799164},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.4779098927974701},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.4303589463233948},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.40576881170272827},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.32519567012786865},{"id":"https://openalex.org/keywords/noise-floor","display_name":"Noise floor","score":0.2984873652458191},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2951086759567261},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.2885802388191223},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2712962031364441},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.2379899024963379},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22646507620811462},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19291415810585022},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1608797013759613},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10919904708862305}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6206144094467163},{"id":"https://openalex.org/C540940223","wikidata":"https://www.wikidata.org/wiki/Q241868","display_name":"Th\u00e9venin's theorem","level":4,"score":0.6194595694541931},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6099501252174377},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.573853075504303},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5665237903594971},{"id":"https://openalex.org/C12252657","wikidata":"https://www.wikidata.org/wiki/Q5347266","display_name":"Effective input noise temperature","level":5,"score":0.5553568005561829},{"id":"https://openalex.org/C27753989","wikidata":"https://www.wikidata.org/wiki/Q284885","display_name":"Superposition principle","level":2,"score":0.5216558575630188},{"id":"https://openalex.org/C89880566","wikidata":"https://www.wikidata.org/wiki/Q323477","display_name":"RLC circuit","level":4,"score":0.4848662316799164},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.4779098927974701},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.4303589463233948},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.40576881170272827},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.32519567012786865},{"id":"https://openalex.org/C187612029","wikidata":"https://www.wikidata.org/wiki/Q17083130","display_name":"Noise floor","level":4,"score":0.2984873652458191},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2951086759567261},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.2885802388191223},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2712962031364441},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.2379899024963379},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22646507620811462},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19291415810585022},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1608797013759613},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10919904708862305},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1065579.1065630","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1065579.1065630","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 42nd annual conference on Design automation  - DAC '05","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.574.8784","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.574.8784","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.york.ac.uk/rts/docs/DAC-1964-2005/papers/2005/dac05/pdffiles/p186.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1547254974","https://openalex.org/W2099133725","https://openalex.org/W2108816571","https://openalex.org/W2117703630","https://openalex.org/W2122608783","https://openalex.org/W2133268384","https://openalex.org/W2154249113","https://openalex.org/W2158118249","https://openalex.org/W2163626738"],"related_works":["https://openalex.org/W2784238743","https://openalex.org/W1599570640","https://openalex.org/W2334332851","https://openalex.org/W2383599705","https://openalex.org/W1909508617","https://openalex.org/W2136735819","https://openalex.org/W2169384616","https://openalex.org/W2374498442","https://openalex.org/W2132022685","https://openalex.org/W2107515594"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2,29,49],"noise-driven":[3],"effective":[4,129,139],"capacitance":[5,130,140],"method":[6,68,131,141],"for":[7],"estimating":[8],"the":[9,24,34,45,56,93,97,106,126,133,138,150,155,161,168,172,178],"combined":[10,110],"propagation":[11,17,94,113],"noise":[12,18,62,80,114,134,182],"and":[13,112,180,189,198],"crosstalk":[14,107],"noise.":[15,108],"Gate":[16],"rules":[19,63],"are":[20,64],"efficiently":[21],"calculated":[22],"inside":[23],"Ceff":[25],"procedure":[26],"to":[27,54,91,104,137,201],"determine":[28],"linear":[30,83,156,162],"Thevenin":[31,85,99],"model":[32,41,86,164],"of":[33,44,170],"victim":[35,179],"driver.":[36],"A":[37],"voltage-dependent":[38],"current":[39],"source":[40],"[2,":[42],"6]":[43],"driver,":[46],"along":[47],"with":[48],"load":[50],"capacitor":[51],"is":[52],"analyzed":[53],"generate":[55],"gate":[57],"output":[58],"waveform,":[59],"from":[60,154,192],"which":[61],"directly":[65],"extracted.":[66],"This":[67],"removes":[69],"potential":[70],"errors":[71],"introduced":[72],"in":[73,142],"traditional":[74],"look-up":[75],"table":[76],"or":[77],"fitted-equation":[78],"based":[79],"rules.":[81],"The":[82,109],"driver":[84,152,163],"can":[87,101,115,147,165],"then":[88,116],"be":[89,102,117],"employed":[90],"analyze":[92,105],"noise,":[95],"while":[96],"same":[98],"resistance":[100],"used":[103],"coupling":[111],"estimated":[118],"using":[119],"superposition.":[120],"In":[121,159],"this":[122,145],"work,":[123],"we":[124],"extend":[125],"popular":[127],"timing-driven":[128],"into":[132],"domain.":[135],"Similar":[136],"timing":[143],"analysis,":[144],"technique":[146],"successfully":[148],"separate":[149],"nonlinear":[151],"analysis":[153],"interconnect":[157],"analysis.":[158],"addition,":[160],"significantly":[166],"ease":[167],"task":[169],"finding":[171],"worst-case":[173],"peak":[174],"alignment":[175],"among":[176],"all":[177],"aggressor":[181],"sources.":[183],"Experimental":[184],"results":[185],"on":[186],"both":[187,196],"RC":[188],"RLC":[190],"nets":[191],"industry":[193],"designs":[194],"show":[195],"accuracy":[197],"efficiency":[199],"compared":[200],"SPICE":[202],"results.":[203]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}