{"id":"https://openalex.org/W2118283361","doi":"https://doi.org/10.1145/1065579.1065620","title":"Analysis of full-wave conductor system impedance over substrate using novel integration techniques","display_name":"Analysis of full-wave conductor system impedance over substrate using novel integration techniques","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W2118283361","doi":"https://doi.org/10.1145/1065579.1065620","mag":"2118283361"},"language":"en","primary_location":{"id":"doi:10.1145/1065579.1065620","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1065579.1065620","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 42nd annual conference on Design automation  - DAC '05","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102137835","display_name":"Xin Hu","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Xin Hu","raw_affiliation_strings":["M.I.T"],"affiliations":[{"raw_affiliation_string":"M.I.T","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100418703","display_name":"Jung Hoon Lee","orcid":"https://orcid.org/0000-0002-7875-2398"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jung Hoon Lee","raw_affiliation_strings":["M.I.T"],"affiliations":[{"raw_affiliation_string":"M.I.T","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071621222","display_name":"Jacob White","orcid":"https://orcid.org/0000-0002-3557-3568"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jacob White","raw_affiliation_strings":["M.I.T"],"affiliations":[{"raw_affiliation_string":"M.I.T","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021651870","display_name":"Luca Daniel","orcid":"https://orcid.org/0000-0002-5880-3151"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Luca Daniel","raw_affiliation_strings":["M.I.T"],"affiliations":[{"raw_affiliation_string":"M.I.T","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5102137835"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.4415,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.94831485,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"147","last_page":"147"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/solver","display_name":"Solver","score":0.9288524985313416},{"id":"https://openalex.org/keywords/conductor","display_name":"Conductor","score":0.7134748697280884},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6066780090332031},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.5503343343734741},{"id":"https://openalex.org/keywords/integral-equation","display_name":"Integral equation","score":0.5151140093803406},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.5116172432899475},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4732656478881836},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45559242367744446},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.42866310477256775},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.38298147916793823},{"id":"https://openalex.org/keywords/computational-science","display_name":"Computational science","score":0.32831281423568726},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.26662856340408325},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2593621015548706},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2379947304725647},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23668265342712402},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.19103893637657166},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.09722232818603516},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.09116137027740479}],"concepts":[{"id":"https://openalex.org/C2778770139","wikidata":"https://www.wikidata.org/wiki/Q1966904","display_name":"Solver","level":2,"score":0.9288524985313416},{"id":"https://openalex.org/C34800285","wikidata":"https://www.wikidata.org/wiki/Q5159395","display_name":"Conductor","level":2,"score":0.7134748697280884},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6066780090332031},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.5503343343734741},{"id":"https://openalex.org/C27016315","wikidata":"https://www.wikidata.org/wiki/Q580101","display_name":"Integral equation","level":2,"score":0.5151140093803406},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.5116172432899475},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4732656478881836},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45559242367744446},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.42866310477256775},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.38298147916793823},{"id":"https://openalex.org/C459310","wikidata":"https://www.wikidata.org/wiki/Q117801","display_name":"Computational science","level":1,"score":0.32831281423568726},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.26662856340408325},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2593621015548706},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2379947304725647},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23668265342712402},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.19103893637657166},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.09722232818603516},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.09116137027740479},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1065579.1065620","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1065579.1065620","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 42nd annual conference on Design automation  - DAC '05","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.510.3220","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.510.3220","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.mit.edu/~dluca/publications/hu_conf_2005_dac_filam_integration.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"},{"id":"https://openalex.org/F4320330952","display_name":"Max-Planck-Institut f\u00fcr Eisenforschung","ror":"https://ror.org/01ngpvg12"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1515302430","https://openalex.org/W1543225180","https://openalex.org/W1543790290","https://openalex.org/W1987083185","https://openalex.org/W2002961297","https://openalex.org/W2046476805","https://openalex.org/W2047279864","https://openalex.org/W2049232803","https://openalex.org/W2072435124","https://openalex.org/W2101441765","https://openalex.org/W2101877670","https://openalex.org/W2120119473","https://openalex.org/W2128128047","https://openalex.org/W2129722479","https://openalex.org/W2131845643","https://openalex.org/W2134452878","https://openalex.org/W2138087367","https://openalex.org/W2142205575","https://openalex.org/W2152948533","https://openalex.org/W2158942640","https://openalex.org/W2562676921","https://openalex.org/W3140530510"],"related_works":["https://openalex.org/W3195196920","https://openalex.org/W2044328780","https://openalex.org/W248949505","https://openalex.org/W2386068720","https://openalex.org/W2353665340","https://openalex.org/W2131412785","https://openalex.org/W2363016592","https://openalex.org/W2161384743","https://openalex.org/W2130985112","https://openalex.org/W4244555212"],"abstract_inverted_index":{"An":[0],"efficient":[1],"approach":[2],"to":[3,75],"full-wave":[4],"impedance":[5],"extraction":[6],"is":[7,55,65],"developed":[8],"that":[9],"accounts":[10],"for":[11,32,44],"substrate":[12],"effects":[13],"through":[14],"the":[15,28,33,39,51,76],"use":[16],"of":[17,30,41],"two-layer":[18],"media":[19,35],"Green's":[20,36],"functions":[21,37],"in":[22,50,71,73],"a":[23],"mixed-potential-integral-equation":[24],"(MPIE)":[25],"solver.":[26,52],"Particularly,":[27],"choice":[29],"implementation":[31],"layered":[34],"motivates":[38],"development":[40],"accelerated":[42],"techniques":[43],"both":[45],"volume":[46],"and":[47],"surface":[48],"integrations":[49],"Solver":[53],"accuracy":[54],"validated":[56],"against":[57],"measurements":[58],"taken":[59],"on":[60],"fabricated":[61],"devices;":[62],"solver":[63],"efficiency":[64],"demonstrated":[66],"by":[67],"its":[68],"9.8X":[69],"reduction":[70],"cost":[72],"comparison":[74],"traditional":[77],"integration":[78],"approach.":[79]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}