{"id":"https://openalex.org/W2099493071","doi":"https://doi.org/10.1145/1065579.1065596","title":"Enhanced leakage reduction Technique by gate replacement","display_name":"Enhanced leakage reduction Technique by gate replacement","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W2099493071","doi":"https://doi.org/10.1145/1065579.1065596","mag":"2099493071"},"language":"en","primary_location":{"id":"doi:10.1145/1065579.1065596","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1065579.1065596","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 42nd annual conference on Design automation  - DAC '05","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103671105","display_name":"Yuan Lin","orcid":"https://orcid.org/0000-0002-7625-7852"},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Lin Yuan","raw_affiliation_strings":["University of Maryland, College Park, MD","[Electr. & Comput. Eng. Dept., Maryland Univ., College Park, MD, USA]"],"affiliations":[{"raw_affiliation_string":"University of Maryland, College Park, MD","institution_ids":["https://openalex.org/I66946132"]},{"raw_affiliation_string":"[Electr. & Comput. Eng. Dept., Maryland Univ., College Park, MD, USA]","institution_ids":["https://openalex.org/I66946132"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012474783","display_name":"Gang Qu","orcid":"https://orcid.org/0000-0001-6759-8949"},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gang Qu","raw_affiliation_strings":["University of Maryland, College Park, MD","[Electr. & Comput. Eng. Dept., Maryland Univ., College Park, MD, USA]"],"affiliations":[{"raw_affiliation_string":"University of Maryland, College Park, MD","institution_ids":["https://openalex.org/I66946132"]},{"raw_affiliation_string":"[Electr. & Comput. Eng. Dept., Maryland Univ., College Park, MD, USA]","institution_ids":["https://openalex.org/I66946132"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5103671105"],"corresponding_institution_ids":["https://openalex.org/I66946132"],"apc_list":null,"apc_paid":null,"fwci":5.0786,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.95303836,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"47","last_page":"47"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.7145243287086487},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5818349719047546},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44174402952194214},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41102221608161926},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.38693898916244507},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36684688925743103},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34649401903152466},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17984473705291748},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07540345191955566}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.7145243287086487},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5818349719047546},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44174402952194214},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41102221608161926},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.38693898916244507},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36684688925743103},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34649401903152466},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17984473705291748},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07540345191955566},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1145/1065579.1065596","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1065579.1065596","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 42nd annual conference on Design automation  - DAC '05","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.572.7687","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.572.7687","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.york.ac.uk/rts/docs/DAC-1964-2005/papers/2005/dac05/pdffiles/p047.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.65.292","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.65.292","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ece.umd.edu/~gangqu/research/papers/c049.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1537715695","https://openalex.org/W1860460518","https://openalex.org/W2095816730","https://openalex.org/W2103227017","https://openalex.org/W2104208957","https://openalex.org/W2113996606","https://openalex.org/W2145267773","https://openalex.org/W2155309348","https://openalex.org/W2163108907","https://openalex.org/W2165788555"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2899084033","https://openalex.org/W2902546961","https://openalex.org/W2399397734","https://openalex.org/W2292675962","https://openalex.org/W3127524829","https://openalex.org/W2769410768","https://openalex.org/W2121524308","https://openalex.org/W1993889649","https://openalex.org/W2460230608"],"abstract_inverted_index":{"Input":[0],"vector":[1,17],"control":[2,36],"(IVC)":[3],"technique":[4,51,130],"utilizes":[5],"the":[6,14,20,23,55,79,84,114,121,139,145],"stack":[7],"effect":[8],"in":[9,68],"CMOS":[10],"circuit":[11,21],"to":[12,19,26,38,62,112,135],"apply":[13],"minimum":[15],"leakage":[16,56,71,137],"(MLV)":[18],"at":[22,83],"sleep":[24],"mode":[25],"reduce":[27,132],"leakage.":[28],"Additional":[29],"logic":[30],"gates":[31],"can":[32,131],"be":[33],"inserted":[34],"as":[35],"points":[37],"make":[39],"it":[40],"more":[41],"effective.":[42],"In":[43],"this":[44],"paper,":[45],"we":[46],"propose":[47],"a":[48,64,90,95,109],"gate":[49,65,76,97],"replacement":[50,98],"that":[52,66,93,128],"further":[53],"enhances":[54],"reduction.":[57],"The":[58,125],"basic":[59],"idea":[60],"is":[61,67],"replace":[63],"its":[69],"worst":[70],"state":[72],"by":[73],"another":[74],"library":[75],"while":[77],"keeping":[78],"circuit's":[80],"correct":[81],"functionality":[82],"active":[85],"mode.":[86],"We":[87,117],"also":[88],"develop":[89],"divide-and-conquer":[91],"approach":[92],"integrates":[94],"fast":[96],"heuristic,":[99],"an":[100],"optimal":[101,146],"MLV":[102,147],"search":[103],"strategy":[104],"for":[105],"tree":[106,115],"circuit,":[107],"and":[108,144,152],"genetic":[110],"algorithm":[111],"connect":[113],"circuits.":[116,124],"conduct":[118],"experiments":[119],"on":[120],"MCNC91":[122],"benchmark":[123],"results":[126],"reveal":[127],"our":[129],"additional":[133],"10%":[134],"24%":[136],"over":[138],"best":[140],"known":[141],"IVC":[142],"methods":[143],"with":[148],"no":[149],"delay":[150],"penalty":[151],"little":[153],"area":[154],"increase.":[155]},"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}