{"id":"https://openalex.org/W2113133200","doi":"https://doi.org/10.1145/1057661.1057666","title":"Low power test generation for path delay faults using stability functions","display_name":"Low power test generation for path delay faults using stability functions","publication_year":2005,"publication_date":"2005-04-17","ids":{"openalex":"https://openalex.org/W2113133200","doi":"https://doi.org/10.1145/1057661.1057666","mag":"2113133200"},"language":"en","primary_location":{"id":"doi:10.1145/1057661.1057666","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1057661.1057666","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 15th ACM Great Lakes symposium on VLSI","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008118580","display_name":"Mahilchi Milir Vaseekar Kumar","orcid":null},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"M. M. Vaseekar Kumar","raw_affiliation_strings":["Southern Illinois University, Carbondale, IL"],"affiliations":[{"raw_affiliation_string":"Southern Illinois University, Carbondale, IL","institution_ids":["https://openalex.org/I110378019"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083284025","display_name":"Spyros Tragoudas","orcid":"https://orcid.org/0009-0006-2575-3588"},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Tragoudas","raw_affiliation_strings":["Southern Illinois University, Carbondale, IL"],"affiliations":[{"raw_affiliation_string":"Southern Illinois University, Carbondale, IL","institution_ids":["https://openalex.org/I110378019"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5008118580"],"corresponding_institution_ids":["https://openalex.org/I110378019"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17665816,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"8","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8535544872283936},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.7687263488769531},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.7029860615730286},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.6147357821464539},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.5468629598617554},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5379287600517273},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.4367119073867798},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.37331831455230713},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3555808365345001},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2434925138950348},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12652069330215454},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.10495319962501526},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08773279190063477},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07975339889526367}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8535544872283936},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.7687263488769531},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.7029860615730286},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6147357821464539},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.5468629598617554},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5379287600517273},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.4367119073867798},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.37331831455230713},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3555808365345001},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2434925138950348},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12652069330215454},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.10495319962501526},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08773279190063477},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07975339889526367},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1057661.1057666","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1057661.1057666","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 15th ACM Great Lakes symposium on VLSI","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2001352955","https://openalex.org/W2100089563","https://openalex.org/W2104084170","https://openalex.org/W2105954189","https://openalex.org/W2110134350","https://openalex.org/W2115296652","https://openalex.org/W2119691242","https://openalex.org/W2130208056","https://openalex.org/W2133005168","https://openalex.org/W2135453964","https://openalex.org/W2136706551","https://openalex.org/W2151461354"],"related_works":["https://openalex.org/W2347486132","https://openalex.org/W2316789606","https://openalex.org/W2350340797","https://openalex.org/W4293224283","https://openalex.org/W2950501077","https://openalex.org/W2131559056","https://openalex.org/W4254560580","https://openalex.org/W2127167802","https://openalex.org/W4243663106","https://openalex.org/W2561083275"],"abstract_inverted_index":{"A":[0],"recent":[1],"work":[2],"describes":[3],"an":[4],"ATPG":[5,75],"for":[6],"path":[7],"delay":[8],"faults":[9],"that":[10,52,80],"limits":[11],"the":[12,16,24,28,33,53,86],"power":[13,25,83],"dissipated":[14,26],"by":[15,27,85],"test":[17,34,44,78],"patterns":[18,30,35,45,59,88],"to":[19,57,68,76],"a":[20,37,66,73],"given":[21],"bound.":[22],"However,":[23],"intermediate":[29,58,87],"while":[31],"applying":[32],"in":[36,72,91],"sequence":[38],"is":[39],"not":[40],"considered.":[41],"Experiments":[42],"with":[43],"derived":[46],"from":[47],"different":[48],"ATPGs":[49],"has":[50],"shown":[51],"switching":[54],"activity":[55],"due":[56],"dissipate":[60],"considerable":[61],"power.":[62],"This":[63],"paper":[64],"proposes":[65],"method":[67],"incorporate":[69],"stability":[70],"functions":[71],"functional":[74],"derive":[77],"vectors":[79],"guarantee":[81],"reduced":[82],"dissipation":[84],"without":[89],"loss":[90],"PDF":[92],"coverage.":[93]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}