{"id":"https://openalex.org/W2749469030","doi":"https://doi.org/10.1142/s1793962318500095","title":"Equipment remaining useful life prediction oriented symbiotic simulation driven by real-time degradation data","display_name":"Equipment remaining useful life prediction oriented symbiotic simulation driven by real-time degradation data","publication_year":2017,"publication_date":"2017-08-17","ids":{"openalex":"https://openalex.org/W2749469030","doi":"https://doi.org/10.1142/s1793962318500095","mag":"2749469030"},"language":"en","primary_location":{"id":"doi:10.1142/s1793962318500095","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s1793962318500095","pdf_url":null,"source":{"id":"https://openalex.org/S107361000","display_name":"Advances in Complex Systems","issn_l":"0219-5259","issn":["0219-5259","1793-6802","1793-9615","1793-9623"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Modeling, Simulation, and Scientific Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072216407","display_name":"Chenglong Ge","orcid":"https://orcid.org/0000-0002-2415-0252"},"institutions":[{"id":"https://openalex.org/I4210122191","display_name":"Ordnance Engineering College","ror":"https://ror.org/02mn08y26","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122191"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenglong Ge","raw_affiliation_strings":["Department of Electronic and Optics Engineering, Mechanical Engineering College, Shijiazhuang 050003, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic and Optics Engineering, Mechanical Engineering College, Shijiazhuang 050003, P. R. China","institution_ids":["https://openalex.org/I4210122191"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100573008","display_name":"Yuanchang Zhu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122191","display_name":"Ordnance Engineering College","ror":"https://ror.org/02mn08y26","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122191"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanchang Zhu","raw_affiliation_strings":["Department of Electronic and Optics Engineering, Mechanical Engineering College, Shijiazhuang 050003, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic and Optics Engineering, Mechanical Engineering College, Shijiazhuang 050003, P. R. China","institution_ids":["https://openalex.org/I4210122191"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056098658","display_name":"Yanqiang Di","orcid":"https://orcid.org/0000-0002-3517-5404"},"institutions":[{"id":"https://openalex.org/I4210122191","display_name":"Ordnance Engineering College","ror":"https://ror.org/02mn08y26","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122191"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanqiang Di","raw_affiliation_strings":["Department of Electronic and Optics Engineering, Mechanical Engineering College, Shijiazhuang 050003, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic and Optics Engineering, Mechanical Engineering College, Shijiazhuang 050003, P. R. China","institution_ids":["https://openalex.org/I4210122191"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210122191"],"apc_list":null,"apc_paid":null,"fwci":0.3076,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.62819501,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"09","issue":"02","first_page":"1850009","last_page":"1850009"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6077227592468262},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5748898983001709},{"id":"https://openalex.org/keywords/data-assimilation","display_name":"Data assimilation","score":0.5744119882583618},{"id":"https://openalex.org/keywords/kalman-filter","display_name":"Kalman filter","score":0.5530378818511963},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5339931845664978},{"id":"https://openalex.org/keywords/simulation-modeling","display_name":"Simulation modeling","score":0.5248720049858093},{"id":"https://openalex.org/keywords/fidelity","display_name":"Fidelity","score":0.4834457337856293},{"id":"https://openalex.org/keywords/modeling-and-simulation","display_name":"Modeling and simulation","score":0.44357970356941223},{"id":"https://openalex.org/keywords/basis","display_name":"Basis (linear algebra)","score":0.44308170676231384},{"id":"https://openalex.org/keywords/dynamic-simulation","display_name":"Dynamic simulation","score":0.4275897443294525},{"id":"https://openalex.org/keywords/high-fidelity","display_name":"High fidelity","score":0.4182271957397461},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3575778305530548},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.32001516222953796},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25634557008743286},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1827840805053711}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6077227592468262},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5748898983001709},{"id":"https://openalex.org/C24552861","wikidata":"https://www.wikidata.org/wiki/Q2670177","display_name":"Data assimilation","level":2,"score":0.5744119882583618},{"id":"https://openalex.org/C157286648","wikidata":"https://www.wikidata.org/wiki/Q846780","display_name":"Kalman filter","level":2,"score":0.5530378818511963},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5339931845664978},{"id":"https://openalex.org/C108215451","wikidata":"https://www.wikidata.org/wiki/Q7263963","display_name":"Simulation modeling","level":2,"score":0.5248720049858093},{"id":"https://openalex.org/C2776459999","wikidata":"https://www.wikidata.org/wiki/Q2119376","display_name":"Fidelity","level":2,"score":0.4834457337856293},{"id":"https://openalex.org/C167343916","wikidata":"https://www.wikidata.org/wiki/Q6888384","display_name":"Modeling and simulation","level":2,"score":0.44357970356941223},{"id":"https://openalex.org/C12426560","wikidata":"https://www.wikidata.org/wiki/Q189569","display_name":"Basis (linear algebra)","level":2,"score":0.44308170676231384},{"id":"https://openalex.org/C149808339","wikidata":"https://www.wikidata.org/wiki/Q5319019","display_name":"Dynamic simulation","level":2,"score":0.4275897443294525},{"id":"https://openalex.org/C113364801","wikidata":"https://www.wikidata.org/wiki/Q26674","display_name":"High fidelity","level":2,"score":0.4182271957397461},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3575778305530548},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.32001516222953796},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25634557008743286},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1827840805053711},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C175444787","wikidata":"https://www.wikidata.org/wiki/Q39072","display_name":"Microeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1142/s1793962318500095","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s1793962318500095","pdf_url":null,"source":{"id":"https://openalex.org/S107361000","display_name":"Advances in Complex Systems","issn_l":"0219-5259","issn":["0219-5259","1793-6802","1793-9615","1793-9623"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Modeling, Simulation, and Scientific Computing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2011980229","https://openalex.org/W2055873761","https://openalex.org/W2103221250","https://openalex.org/W2105934661","https://openalex.org/W2133747588","https://openalex.org/W2152270473","https://openalex.org/W2161764525","https://openalex.org/W4232929002"],"related_works":["https://openalex.org/W2188191905","https://openalex.org/W2356939368","https://openalex.org/W3208062498","https://openalex.org/W2111360858","https://openalex.org/W2376060232","https://openalex.org/W2064426819","https://openalex.org/W2887246461","https://openalex.org/W120587663","https://openalex.org/W2390909022","https://openalex.org/W2033553599"],"abstract_inverted_index":{"As":[0],"an":[1],"emerging":[2],"simulation":[3,16,72,93,124,143,146,152,184,190,223],"technology":[4],"in":[5,95],"the":[6,13,22,28,41,51,66,77,91,96,100,107,120,142,151,176,188,195,201,210,217],"field":[7,23],"of":[8,24,31,58,79,141,180,204,212,221],"system":[9],"modeling":[10,80],"and":[11,82,119,126,164,200,219],"simulation,":[12],"equipment":[14,25,32,59,67,103,156,168,196,205],"symbiotic":[15,71,189,222],"has":[17,49],"become":[18,50],"research":[19],"emphasis.":[20],"In":[21],"maintenance":[26],"support,":[27],"outstanding":[29],"problem":[30],"remaining":[33],"useful":[34],"life":[35],"(RUL)":[36],"prediction":[37,57,69,203,214],"is":[38,74,88,129,173,207],"analyzed,":[39],"i.e.,":[40],"stable":[42],"model":[43,86,94,108,147,163],"parameters":[44,109],"without":[45],"self-evolution":[46],"ability,":[47],"which":[48,149],"primary":[52],"factor":[53],"that":[54,187],"hinders":[55],"self-adaptive":[56,202],"RUL.":[60],"Combined":[61],"with":[62],"parallel":[63],"systems":[64],"theory,":[65],"RUL":[68,169,206],"oriented":[70],"framework":[73,172],"proposed":[75],"on":[76,209],"basis":[78,211],"analysis":[81],"Wiener":[83],"state":[84,159],"space":[85],"(SSM)":[87],"taken":[89],"as":[90,136],"basic":[92],"framework.":[97],"Driven":[98],"by":[99,113,131,175],"dynamic":[101,139],"injected":[102],"degradation":[104,158,178,198],"observation":[105,127],"data,":[106],"are":[110],"updated":[111],"online":[112],"using":[114,132],"expectation":[115],"maximum":[116],"(EM)":[117],"algorithm":[118],"data":[121,128,165,179],"assimilation":[122],"between":[123],"outputs":[125,153],"executed":[130],"Kalman":[133],"filter,":[134],"so":[135],"to":[137,155],"realize":[138],"evolution":[140,148],"model.":[144],"The":[145,171,183],"makes":[150],"close":[154],"real":[157],"provides":[160],"high":[161],"fidelity":[162],"for":[166],"predicting":[167],"accurately.":[170],"verified":[174],"performance":[177,197],"a":[181],"bearing.":[182],"results":[185],"show":[186],"method":[191],"can":[192],"accurately":[193],"simulate":[194],"process":[199],"realized":[208],"improving":[213],"accuracy,":[215],"proving":[216],"feasibility":[218],"effectiveness":[220],"method.":[224]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}