{"id":"https://openalex.org/W4400056842","doi":"https://doi.org/10.1142/s0218488524400075","title":"A Computer Vision Engineering Management System for Automated Defect Detection in Electronic Components Manufacturing","display_name":"A Computer Vision Engineering Management System for Automated Defect Detection in Electronic Components Manufacturing","publication_year":2024,"publication_date":"2024-06-01","ids":{"openalex":"https://openalex.org/W4400056842","doi":"https://doi.org/10.1142/s0218488524400075"},"language":"en","primary_location":{"id":"doi:10.1142/s0218488524400075","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1142/s0218488524400075","pdf_url":null,"source":{"id":"https://openalex.org/S69518169","display_name":"International Journal of Uncertainty Fuzziness and Knowledge-Based Systems","issn_l":"0218-4885","issn":["0218-4885","1793-6411"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Uncertainty, Fuzziness and Knowledge-Based Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021742068","display_name":"Jianqi Wang","orcid":"https://orcid.org/0000-0002-0487-4923"},"institutions":[{"id":"https://openalex.org/I129604602","display_name":"The University of Sydney","ror":"https://ror.org/0384j8v12","country_code":"AU","type":"education","lineage":["https://openalex.org/I129604602"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Jianqi Wang","raw_affiliation_strings":["Faculty of Engineering, University of Sydney, Camperdown Sydney NSW 2008, Australia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, University of Sydney, Camperdown Sydney NSW 2008, Australia","institution_ids":["https://openalex.org/I129604602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100973643","display_name":"Jieni Yan","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jieni Yan","raw_affiliation_strings":["Viterbi School of Engineering, University of Southern California, Los Angeles 90007, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Viterbi School of Engineering, University of Southern California, Los Angeles 90007, USA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101292079","display_name":"Yinzhe Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I1328775524","display_name":"Zhejiang Sci-Tech University","ror":"https://ror.org/03893we55","country_code":"CN","type":"education","lineage":["https://openalex.org/I1328775524"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinzhe Xu","raw_affiliation_strings":["School of Mechanical Engineering, Zhejiang Sci-Tech University, Zhejiang 310018, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Zhejiang Sci-Tech University, Zhejiang 310018, P. R. China","institution_ids":["https://openalex.org/I1328775524"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010242765","display_name":"Jia Chen","orcid":"https://orcid.org/0000-0002-9896-1656"},"institutions":[{"id":"https://openalex.org/I98251732","display_name":"McMaster University","ror":"https://ror.org/02fa3aq29","country_code":"CA","type":"education","lineage":["https://openalex.org/I98251732"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Jia Chen","raw_affiliation_strings":["Faculty of Engineering, Department of Computing and Software, McMaster University, Ontario L8S 4L8, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Department of Computing and Software, McMaster University, Ontario L8S 4L8, Canada","institution_ids":["https://openalex.org/I98251732"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1171432,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"32","issue":"04","first_page":"515","last_page":"534"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9718999862670898,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45612847805023193},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.44481465220451355},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.4027380049228668},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.37368273735046387},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.35809940099716187},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3275092840194702},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.3202578127384186}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45612847805023193},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.44481465220451355},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.4027380049228668},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37368273735046387},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.35809940099716187},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3275092840194702},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3202578127384186}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1142/s0218488524400075","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1142/s0218488524400075","pdf_url":null,"source":{"id":"https://openalex.org/S69518169","display_name":"International Journal of Uncertainty Fuzziness and Knowledge-Based Systems","issn_l":"0218-4885","issn":["0218-4885","1793-6411"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Uncertainty, Fuzziness and Knowledge-Based Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.550000011920929,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W2598457882","https://openalex.org/W2760961335","https://openalex.org/W2765854388","https://openalex.org/W2825063406","https://openalex.org/W2884195426","https://openalex.org/W2888407265","https://openalex.org/W2899242765","https://openalex.org/W2926743806","https://openalex.org/W2941813310","https://openalex.org/W2953868242","https://openalex.org/W2966341653","https://openalex.org/W2969247748","https://openalex.org/W2970822152","https://openalex.org/W2974170420","https://openalex.org/W2993724341","https://openalex.org/W3126769568","https://openalex.org/W3129634582","https://openalex.org/W3132963652","https://openalex.org/W3139058665","https://openalex.org/W3153381206","https://openalex.org/W3157243312","https://openalex.org/W3164104137","https://openalex.org/W3195969653","https://openalex.org/W4221023724","https://openalex.org/W4226093122","https://openalex.org/W4285064070","https://openalex.org/W4288081727","https://openalex.org/W4288081739","https://openalex.org/W4289728238"],"related_works":["https://openalex.org/W3188962172","https://openalex.org/W2772917594","https://openalex.org/W4306742369","https://openalex.org/W4303457083","https://openalex.org/W2131146434","https://openalex.org/W2951359407","https://openalex.org/W4376623224","https://openalex.org/W3136979370","https://openalex.org/W2058170566","https://openalex.org/W2965396565"],"abstract_inverted_index":{"Traditional":[0],"digital":[1],"image":[2],"processing":[3],"techniques":[4],"face":[5],"problems":[6,92],"such":[7],"as":[8],"complex":[9],"feature":[10,127],"extraction":[11],"and":[12,80,93,131,150,164,187,192],"weak":[13],"robustness":[14],"when":[15],"dealing":[16],"with":[17],"surface":[18,67,185,198],"defects":[19,68,186],"of":[20,23,38,85,96,125,137,154,195],"multiple":[21],"categories":[22],"electronic":[24,39,65,183,196],"components.":[25],"Deep":[26],"learning":[27],"is":[28,110,129,144],"widely":[29],"used":[30,111,145],"in":[31,69,117],"industrial":[32],"defect":[33,41,54,60,166],"detection.":[34],"However,":[35],"the":[36,44,77,94,97,114,118,126,134,138,148,152,155,158,190],"performance":[37],"component":[40,66,184,197],"detection":[42,61,81,193],"at":[43],"pixel":[45],"segmentation":[46,78,180,191],"level":[47],"needs":[48,194],"to":[49,89,112,133,146],"be":[50],"improved.":[51],"For":[52],"pixel-level":[53],"detection,":[55],"this":[56],"paper":[57],"constructs":[58],"a":[59,102,122],"model":[62],"(ECSDDNet)":[63],"for":[64],"computer":[70],"vision":[71],"engineering":[72],"management":[73],"system.":[74],"To":[75],"improve":[76,151],"accuracy":[79],"effect,":[82],"three":[83],"stages":[84],"experiments":[86],"are":[87,169,171],"conducted":[88],"address":[90],"mis-segmentation":[91],"shortcomings":[95],"Unet":[98,119,139],"network":[99,104],"structure.":[100],"Firstly,":[101],"classification":[103],"that":[105,168,176],"can":[106,188],"perform":[107],"weight":[108],"transfer":[109],"replace":[113],"encoding":[115],"structure":[116],"network.":[120,140,156],"Secondly,":[121],"simplified":[123],"version":[124],"fusion":[128],"proposed":[130],"added":[132],"skip":[135],"connection":[136],"Finally,":[141],"label":[142],"smoothing":[143],"optimize":[147],"loss":[149],"generalization":[153],"After":[157],"optimization":[159],"experiment,":[160],"some":[161],"noisy":[162],"contours":[163,167],"small":[165],"mis-segmented":[170],"removed.":[172],"Experimental":[173],"results":[174],"show":[175],"ECSDDNet":[177],"has":[178],"good":[179],"effects":[181],"on":[182],"meet":[189],"defects.":[199]},"counts_by_year":[],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}