{"id":"https://openalex.org/W4408073950","doi":"https://doi.org/10.1142/s0218126625502767","title":"Robust Defect Detection Algorithm for Highly Reflective Surfaces Using SIFT Feature Points and Perceptual Hashing","display_name":"Robust Defect Detection Algorithm for Highly Reflective Surfaces Using SIFT Feature Points and Perceptual Hashing","publication_year":2025,"publication_date":"2025-03-01","ids":{"openalex":"https://openalex.org/W4408073950","doi":"https://doi.org/10.1142/s0218126625502767"},"language":"en","primary_location":{"id":"doi:10.1142/s0218126625502767","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218126625502767","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Jun Li","orcid":"https://orcid.org/0000-0002-7383-5864"},"institutions":[{"id":"https://openalex.org/I24201400","display_name":"Chengdu University of Information Technology","ror":"https://ror.org/01yxwrh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I24201400"]},{"id":"https://openalex.org/I31595395","display_name":"Chengdu University of Technology","ror":"https://ror.org/05pejbw21","country_code":"CN","type":"education","lineage":["https://openalex.org/I31595395"]},{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jun Li","raw_affiliation_strings":["Chengdu Technological University, Sichuan, Chengdu 611730, P.\u00a0R.\u00a0China"],"raw_orcid":"https://orcid.org/0000-0002-7383-5864","affiliations":[{"raw_affiliation_string":"Chengdu Technological University, Sichuan, Chengdu 611730, P.\u00a0R.\u00a0China","institution_ids":["https://openalex.org/I4210125143","https://openalex.org/I24201400","https://openalex.org/I31595395"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113672661","display_name":"Zhengjuan Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I24201400","display_name":"Chengdu University of Information Technology","ror":"https://ror.org/01yxwrh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I24201400"]},{"id":"https://openalex.org/I31595395","display_name":"Chengdu University of Technology","ror":"https://ror.org/05pejbw21","country_code":"CN","type":"education","lineage":["https://openalex.org/I31595395"]},{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengjuan Zhou","raw_affiliation_strings":["Chengdu Technological University, Sichuan, Chengdu 611730, P.\u00a0R.\u00a0China"],"raw_orcid":"https://orcid.org/0009-0007-6412-7747","affiliations":[{"raw_affiliation_string":"Chengdu Technological University, Sichuan, Chengdu 611730, P.\u00a0R.\u00a0China","institution_ids":["https://openalex.org/I4210125143","https://openalex.org/I24201400","https://openalex.org/I31595395"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Lei Zhang","orcid":"https://orcid.org/0009-0009-1077-9621"},"institutions":[{"id":"https://openalex.org/I4210155232","display_name":"Fiberhome Technology Group (China)","ror":"https://ror.org/04yv20134","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210155232"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Zhang","raw_affiliation_strings":["The Fifth Research Institute of Telecommunications Technology Co., Ltd., Chengdu 610062, P.\u00a0R.\u00a0China"],"raw_orcid":"https://orcid.org/0009-0009-1077-9621","affiliations":[{"raw_affiliation_string":"The Fifth Research Institute of Telecommunications Technology Co., Ltd., Chengdu 610062, P.\u00a0R.\u00a0China","institution_ids":["https://openalex.org/I4210155232"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020042106","display_name":"Guoming Song","orcid":null},"institutions":[{"id":"https://openalex.org/I24201400","display_name":"Chengdu University of Information Technology","ror":"https://ror.org/01yxwrh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I24201400"]},{"id":"https://openalex.org/I31595395","display_name":"Chengdu University of Technology","ror":"https://ror.org/05pejbw21","country_code":"CN","type":"education","lineage":["https://openalex.org/I31595395"]},{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guoming Song","raw_affiliation_strings":["Chengdu Technological University, Sichuan, Chengdu 611730, P.\u00a0R.\u00a0China"],"raw_orcid":"https://orcid.org/0009-0000-0941-6684","affiliations":[{"raw_affiliation_string":"Chengdu Technological University, Sichuan, Chengdu 611730, P.\u00a0R.\u00a0China","institution_ids":["https://openalex.org/I4210125143","https://openalex.org/I24201400","https://openalex.org/I31595395"]}]},{"author_position":"last","author":{"id":null,"display_name":"Xin Dong","orcid":"https://orcid.org/0000-0001-9060-0103"},"institutions":[{"id":"https://openalex.org/I24201400","display_name":"Chengdu University of Information Technology","ror":"https://ror.org/01yxwrh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I24201400"]},{"id":"https://openalex.org/I31595395","display_name":"Chengdu University of Technology","ror":"https://ror.org/05pejbw21","country_code":"CN","type":"education","lineage":["https://openalex.org/I31595395"]},{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Dong","raw_affiliation_strings":["Chengdu Technological University, Sichuan, Chengdu 611730, P.\u00a0R.\u00a0China"],"raw_orcid":"https://orcid.org/0000-0001-9060-0103","affiliations":[{"raw_affiliation_string":"Chengdu Technological University, Sichuan, Chengdu 611730, P.\u00a0R.\u00a0China","institution_ids":["https://openalex.org/I4210125143","https://openalex.org/I24201400","https://openalex.org/I31595395"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I24201400","https://openalex.org/I31595395","https://openalex.org/I4210125143"],"apc_list":null,"apc_paid":null,"fwci":1.0381,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.75511123,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"34","issue":"12","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.9386000037193298,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9269000291824341,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scale-invariant-feature-transform","display_name":"Scale-invariant feature transform","score":0.7958025932312012},{"id":"https://openalex.org/keywords/hash-function","display_name":"Hash function","score":0.6072556376457214},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6042908430099487},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5939671993255615},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5629558563232422},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5127642750740051},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4554855227470398},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4364531636238098},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.2995588481426239}],"concepts":[{"id":"https://openalex.org/C61265191","wikidata":"https://www.wikidata.org/wiki/Q767770","display_name":"Scale-invariant feature transform","level":3,"score":0.7958025932312012},{"id":"https://openalex.org/C99138194","wikidata":"https://www.wikidata.org/wiki/Q183427","display_name":"Hash function","level":2,"score":0.6072556376457214},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6042908430099487},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5939671993255615},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5629558563232422},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5127642750740051},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4554855227470398},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4364531636238098},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.2995588481426239},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1142/s0218126625502767","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218126625502767","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.44999998807907104}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W2889456682","https://openalex.org/W2899441389","https://openalex.org/W2948618171","https://openalex.org/W2953633367","https://openalex.org/W2973904489","https://openalex.org/W2980770700","https://openalex.org/W2981080116","https://openalex.org/W3003505585","https://openalex.org/W3033750148","https://openalex.org/W3041328379","https://openalex.org/W3098156937","https://openalex.org/W3197717492","https://openalex.org/W4207002435","https://openalex.org/W4224281237","https://openalex.org/W4298028301","https://openalex.org/W4309797620","https://openalex.org/W4312642903","https://openalex.org/W4366148868","https://openalex.org/W4386196447","https://openalex.org/W4388456523","https://openalex.org/W4390948737","https://openalex.org/W4394985008","https://openalex.org/W4396609011","https://openalex.org/W4399921348","https://openalex.org/W4400446367","https://openalex.org/W4400619983","https://openalex.org/W4400767222","https://openalex.org/W4404915394"],"related_works":["https://openalex.org/W3034955165","https://openalex.org/W2094920358","https://openalex.org/W2041448692","https://openalex.org/W2247121321","https://openalex.org/W2391926582","https://openalex.org/W2087391438","https://openalex.org/W1966831329","https://openalex.org/W2316074893","https://openalex.org/W2020188645","https://openalex.org/W2739923608"],"abstract_inverted_index":{"In":[0],"the":[1,69,105,138,141,146,155,159,179],"manufacturing":[2],"industry,":[3],"materials":[4],"are":[5,25],"widely":[6],"used":[7],"in":[8,38,81,112,154,184,198],"automobiles,":[9],"electronic":[10],"products":[11],"and":[12,62,71,88,158,203,209,213],"other":[13],"fields.":[14],"However,":[15],"due":[16],"to":[17,96,152,167],"its":[18],"reflective":[19,48,83,118,200],"characteristics,":[20],"traditional":[21,133,156],"visual":[22],"inspection":[23,40],"algorithms":[24],"often":[26],"interfered":[27],"with":[28,92,130,192],"by":[29],"reflected":[30],"light":[31],"when":[32],"detecting":[33],"such":[34],"surface":[35,49,84,99,201],"defects,":[36],"resulting":[37],"low":[39],"accuracy.":[41],"Therefore,":[42],"this":[43,108,185],"study":[44],"proposes":[45],"a":[46,170],"highly":[47,82,117,199],"defect":[50,113,180],"detection":[51,114,135,143,161,181,211],"algorithm":[52,76,95,109,147,182],"based":[53],"on":[54],"scale":[55],"invariant":[56],"feature":[57,60,79,190],"transformation":[58],"(SIFT)":[59],"points":[61,80,191],"perceptual":[63,93,193],"hash":[64,94],"method,":[65,157],"aiming":[66],"at":[67],"improving":[68],"robustness":[70],"accuracy":[72,106,212],"of":[73,107,115,132,145,173],"detection.":[74],"The":[75],"extracts":[77],"key":[78],"images":[85],"through":[86],"SIFT,":[87],"compares":[89],"image":[90],"similarity":[91],"accurately":[97],"identify":[98],"defects.":[100],"Experimental":[101],"data":[102],"show":[103],"that":[104,178],"reaches":[110],"96.5%":[111],"multiple":[116],"surfaces":[119],"(such":[120],"as":[121],"mirror":[122],"metal":[123],"plates),":[124],"which":[125,187],"is":[126,148,163,176],"significantly":[127],"improved":[128],"compared":[129],"83.7%":[131],"edge":[134],"algorithms.":[136],"At":[137],"same":[139],"time,":[140],"false":[142],"rate":[144,162],"reduced":[149,164],"from":[150,165],"15.3%":[151],"6.8%":[153],"missed":[160],"12.1%":[166],"4.5%.":[168],"Through":[169],"large":[171],"number":[172],"experiments,":[174],"it":[175],"verified":[177],"proposed":[183],"study,":[186],"combines":[188],"SIFT":[189],"hash,":[194],"has":[195],"significant":[196],"advantages":[197],"detection,":[202],"can":[204],"effectively":[205],"overcome":[206],"reflection":[207],"interference":[208],"ensure":[210],"robustness.":[214]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-05-12T08:28:47.272897","created_date":"2025-10-10T00:00:00"}