{"id":"https://openalex.org/W4393256808","doi":"https://doi.org/10.1142/s0218126624502645","title":"A Novel Bootstrapped CMOS Switch with Minimized Sampling and Holding Error Using Sampling Window Error Analysis","display_name":"A Novel Bootstrapped CMOS Switch with Minimized Sampling and Holding Error Using Sampling Window Error Analysis","publication_year":2024,"publication_date":"2024-03-28","ids":{"openalex":"https://openalex.org/W4393256808","doi":"https://doi.org/10.1142/s0218126624502645"},"language":"en","primary_location":{"id":"doi:10.1142/s0218126624502645","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218126624502645","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004556698","display_name":"Buddhi Prakash Sharma","orcid":"https://orcid.org/0000-0003-1192-9168"},"institutions":[{"id":"https://openalex.org/I74796645","display_name":"Birla Institute of Technology and Science, Pilani","ror":"https://ror.org/001p3jz28","country_code":"IN","type":"education","lineage":["https://openalex.org/I74796645"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Buddhi Prakash Sharma","raw_affiliation_strings":["Department of Electrical & Electronics Engineering, Birla Institute of Technology and Science, Pilani, Rajasthan 333031, India"],"raw_orcid":"https://orcid.org/0000-0003-1192-9168","affiliations":[{"raw_affiliation_string":"Department of Electrical & Electronics Engineering, Birla Institute of Technology and Science, Pilani, Rajasthan 333031, India","institution_ids":["https://openalex.org/I74796645"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058136404","display_name":"Guguloth Chandu","orcid":"https://orcid.org/0009-0009-0354-0014"},"institutions":[{"id":"https://openalex.org/I74796645","display_name":"Birla Institute of Technology and Science, Pilani","ror":"https://ror.org/001p3jz28","country_code":"IN","type":"education","lineage":["https://openalex.org/I74796645"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Chandu Mysakshi","raw_affiliation_strings":["Department of Electrical & Electronics Engineering, Birla Institute of Technology and Science, Pilani, Rajasthan 333031, India"],"raw_orcid":"https://orcid.org/0009-0009-0354-0014","affiliations":[{"raw_affiliation_string":"Department of Electrical & Electronics Engineering, Birla Institute of Technology and Science, Pilani, Rajasthan 333031, India","institution_ids":["https://openalex.org/I74796645"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101050534","display_name":"Shivam Kumar","orcid":null},"institutions":[{"id":"https://openalex.org/I74796645","display_name":"Birla Institute of Technology and Science, Pilani","ror":"https://ror.org/001p3jz28","country_code":"IN","type":"education","lineage":["https://openalex.org/I74796645"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Shivam Kumar","raw_affiliation_strings":["Department of Electrical & Electronics Engineering, Birla Institute of Technology and Science, Pilani, Rajasthan 333031, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical & Electronics Engineering, Birla Institute of Technology and Science, Pilani, Rajasthan 333031, India","institution_ids":["https://openalex.org/I74796645"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032103371","display_name":"Anu Gupta","orcid":"https://orcid.org/0000-0002-6320-556X"},"institutions":[{"id":"https://openalex.org/I74796645","display_name":"Birla Institute of Technology and Science, Pilani","ror":"https://ror.org/001p3jz28","country_code":"IN","type":"education","lineage":["https://openalex.org/I74796645"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anu Gupta","raw_affiliation_strings":["Department of Electrical & Electronics Engineering, Birla Institute of Technology and Science, Pilani, Rajasthan 333031, India"],"raw_orcid":"https://orcid.org/0000-0002-6320-556X","affiliations":[{"raw_affiliation_string":"Department of Electrical & Electronics Engineering, Birla Institute of Technology and Science, Pilani, Rajasthan 333031, India","institution_ids":["https://openalex.org/I74796645"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100712113","display_name":"Chandra Shekhar","orcid":"https://orcid.org/0000-0002-2114-9096"},"institutions":[{"id":"https://openalex.org/I74796645","display_name":"Birla Institute of Technology and Science, Pilani","ror":"https://ror.org/001p3jz28","country_code":"IN","type":"education","lineage":["https://openalex.org/I74796645"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Chandra Shekhar","raw_affiliation_strings":["Department of Electrical & Electronics Engineering, Birla Institute of Technology and Science, Pilani, Rajasthan 333031, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical & Electronics Engineering, Birla Institute of Technology and Science, Pilani, Rajasthan 333031, India","institution_ids":["https://openalex.org/I74796645"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5004556698"],"corresponding_institution_ids":["https://openalex.org/I74796645"],"apc_list":null,"apc_paid":null,"fwci":1.512,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.80292594,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"33","issue":"15","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6442980766296387},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.6031600832939148},{"id":"https://openalex.org/keywords/window","display_name":"Window (computing)","score":0.5713863968849182},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5268962383270264},{"id":"https://openalex.org/keywords/sampling-error","display_name":"Sampling error","score":0.49462243914604187},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4837096333503723},{"id":"https://openalex.org/keywords/error-analysis","display_name":"Error analysis","score":0.47945013642311096},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.43480321764945984},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.27914559841156006},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.27564334869384766},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2610149681568146},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2082163393497467},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.20670226216316223},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1681242287158966},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.07490909099578857}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6442980766296387},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.6031600832939148},{"id":"https://openalex.org/C2778751112","wikidata":"https://www.wikidata.org/wiki/Q835016","display_name":"Window (computing)","level":2,"score":0.5713863968849182},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5268962383270264},{"id":"https://openalex.org/C165473641","wikidata":"https://www.wikidata.org/wiki/Q3306280","display_name":"Sampling error","level":3,"score":0.49462243914604187},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4837096333503723},{"id":"https://openalex.org/C3018824978","wikidata":"https://www.wikidata.org/wiki/Q2894891","display_name":"Error analysis","level":2,"score":0.47945013642311096},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.43480321764945984},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.27914559841156006},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.27564334869384766},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2610149681568146},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2082163393497467},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.20670226216316223},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1681242287158966},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.07490909099578857},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1142/s0218126624502645","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218126624502645","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W2011882362","https://openalex.org/W2051763066","https://openalex.org/W2098132992","https://openalex.org/W2145851697","https://openalex.org/W2336539473","https://openalex.org/W2553370489","https://openalex.org/W2595500549","https://openalex.org/W2751381103","https://openalex.org/W2756191879","https://openalex.org/W2768400553","https://openalex.org/W2788550393","https://openalex.org/W2801373858","https://openalex.org/W2953825043","https://openalex.org/W2966627545","https://openalex.org/W2966844378","https://openalex.org/W2994696728","https://openalex.org/W3097426630","https://openalex.org/W3128551501","https://openalex.org/W4205594724","https://openalex.org/W4313224914","https://openalex.org/W4313908314","https://openalex.org/W4362571274"],"related_works":["https://openalex.org/W2380243770","https://openalex.org/W2377495875","https://openalex.org/W2390973415","https://openalex.org/W2074837817","https://openalex.org/W769669498","https://openalex.org/W2606582138","https://openalex.org/W4297808597","https://openalex.org/W2389320356","https://openalex.org/W2386520220","https://openalex.org/W2351824059"],"abstract_inverted_index":{"This":[0],"study":[1],"proposes":[2],"a":[3,61,92,103,158],"novel":[4],"6-transistor":[5],"bootstrapped":[6],"switch":[7,26,156,169],"with":[8,102],"minimized":[9],"sampling":[10,16,115],"and":[11,33,53,131,135,153],"holding":[12],"error":[13,18],"obtained":[14],"through":[15],"window":[17,116],"analysis":[19,73],"for":[20,184],"SAR":[21],"ADC":[22],"design.":[23],"The":[24,71],"proposed":[25,76,109,167,180],"design":[27],"strategically":[28],"mitigates":[29],"channel":[30,48],"charge":[31,49],"injection":[32],"minimizes":[34],"the":[35,65,75,81,108,148,166,179],"input":[36,100],"signal":[37,101],"dependency":[38],"of":[39,68,74,150,165],"on-resistance":[40],"by":[41],"optimizing":[42],"its":[43],"sizing":[44],"parameters.":[45],"To":[46],"counteract":[47],"effects,":[50],"dummy":[51],"NMOS":[52],"PMOS":[54],"components":[55],"are":[56],"judiciously":[57],"employed,":[58],"culminating":[59],"in":[60,64,172],"substantial":[62],"improvement":[63],"effective":[66],"number":[67],"bits":[69,145],"(ENOB).":[70],"complete":[72],"circuit":[77,110,181],"is":[78,170,182],"done":[79],"using":[80],"Cadence":[82],"Virtuoso":[83],"SCL":[84],"0.18":[85],"[Formula:":[86,119],"see":[87,120],"text]m":[88],"CMOS":[89],"process.":[90],"For":[91,147],"51.514":[93],"kHz":[94],"sinusoidal":[95],"1":[96,104],"V":[97],"peak-to-peak":[98],"differential":[99],"MSPs":[105],"clock":[106],"speed,":[107],"achieves":[111],"2.0141":[112],"mV":[113],"maximum":[114],"error,":[117],"0.131":[118],"text]W":[121],"power":[122],"consumption,":[123],"84.67":[124,129],"dB":[125,137],"signal-to-noise":[126,130],"ratio":[127,134],"(SNR),":[128],"distortion":[132],"(SINAD)":[133],"86.02":[136],"spurious-free":[138],"dynamic":[139],"range":[140],"(SFDR),":[141],"which":[142],"produces":[143],"13.77":[144],"ENOB.":[146],"impacts":[149],"process":[151],"variations":[152],"mismatch":[154],"on":[155],"performance,":[157],"comprehensive":[159],"500-point":[160],"Monte":[161],"Carlo":[162],"(MC)":[163],"simulation":[164],"bootstrap":[168],"conducted":[171],"this":[173],"study.":[174],"Post-layout":[175],"results":[176],"show":[177],"that":[178],"suitable":[183],"IoT":[185],"applications.":[186]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}