{"id":"https://openalex.org/W4387405255","doi":"https://doi.org/10.1142/s0218126624501196","title":"Fast Detection Technology of Abnormal Out-of-Tolerance Meters Based on Fit Model Theory","display_name":"Fast Detection Technology of Abnormal Out-of-Tolerance Meters Based on Fit Model Theory","publication_year":2023,"publication_date":"2023-10-06","ids":{"openalex":"https://openalex.org/W4387405255","doi":"https://doi.org/10.1142/s0218126624501196"},"language":"en","primary_location":{"id":"doi:10.1142/s0218126624501196","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218126624501196","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018659842","display_name":"Hao Chen","orcid":"https://orcid.org/0009-0005-3689-6261"},"institutions":[{"id":"https://openalex.org/I4392738113","display_name":"China Electric Power Research Institute","ror":"https://ror.org/05ehpzy81","country_code":null,"type":"facility","lineage":["https://openalex.org/I17442442","https://openalex.org/I4392738113"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hao Chen","raw_affiliation_strings":["China Electric Power Research Institute Co., Ltd, Beijing, P. R. China"],"raw_orcid":"https://orcid.org/0009-0005-3689-6261","affiliations":[{"raw_affiliation_string":"China Electric Power Research Institute Co., Ltd, Beijing, P. R. China","institution_ids":["https://openalex.org/I4392738113"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003074330","display_name":"Xingang Du","orcid":"https://orcid.org/0009-0005-4256-4810"},"institutions":[{"id":"https://openalex.org/I17442442","display_name":"State Grid Corporation of China (China)","ror":"https://ror.org/05twwhs70","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xingang Du","raw_affiliation_strings":["State Grid Corporation of China Co., Ltd, Beijing, P. R. China"],"raw_orcid":"https://orcid.org/0009-0005-4256-4810","affiliations":[{"raw_affiliation_string":"State Grid Corporation of China Co., Ltd, Beijing, P. R. China","institution_ids":["https://openalex.org/I17442442"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000836278","display_name":"Chuning Peng","orcid":"https://orcid.org/0009-0005-8930-1911"},"institutions":[{"id":"https://openalex.org/I17442442","display_name":"State Grid Corporation of China (China)","ror":"https://ror.org/05twwhs70","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuning Peng","raw_affiliation_strings":["State Grid Corporation of China Co., Ltd, Beijing, P. R. China"],"raw_orcid":"https://orcid.org/0009-0005-8930-1911","affiliations":[{"raw_affiliation_string":"State Grid Corporation of China Co., Ltd, Beijing, P. R. China","institution_ids":["https://openalex.org/I17442442"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102061033","display_name":"Jing Liu","orcid":"https://orcid.org/0009-0005-5510-0396"},"institutions":[{"id":"https://openalex.org/I4392738113","display_name":"China Electric Power Research Institute","ror":"https://ror.org/05ehpzy81","country_code":null,"type":"facility","lineage":["https://openalex.org/I17442442","https://openalex.org/I4392738113"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Liu","raw_affiliation_strings":["China Electric Power Research Institute Co., Ltd, Beijing, P. R. China"],"raw_orcid":"https://orcid.org/0009-0005-5510-0396","affiliations":[{"raw_affiliation_string":"China Electric Power Research Institute Co., Ltd, Beijing, P. R. China","institution_ids":["https://openalex.org/I4392738113"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5018659842"],"corresponding_institution_ids":["https://openalex.org/I4392738113"],"apc_list":null,"apc_paid":null,"fwci":0.3832,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.68245319,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"33","issue":"11","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.8845000267028809,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.8845000267028809,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.8798999786376953,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.8203999996185303,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4508247375488281},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.366962730884552},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27843379974365234}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4508247375488281},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.366962730884552},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27843379974365234}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1142/s0218126624501196","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218126624501196","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1483874305","https://openalex.org/W3004059526","https://openalex.org/W4225278452","https://openalex.org/W4292245961","https://openalex.org/W4293198324","https://openalex.org/W4312864044","https://openalex.org/W4366492959","https://openalex.org/W4377235461","https://openalex.org/W4378194703","https://openalex.org/W4379382582","https://openalex.org/W4399261262"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2350741829","https://openalex.org/W2130043461","https://openalex.org/W2530322880","https://openalex.org/W1596801655"],"abstract_inverted_index":{"During":[0],"the":[1,17,67,71,80,88,111,116,131,142,146,155,159,172],"use":[2],"process":[3],"of":[4,19,115,158,176,191,204],"electricity":[5,20,28,34,56],"meters,":[6],"natural":[7],"aging":[8],"faults":[9],"or":[10],"human":[11],"factors":[12],"can":[13,170],"cause":[14],"abnormalities":[15],"in":[16,70,79,141],"metering":[18,73,83,92,148],"meters.":[21],"Some":[22],"existing":[23],"detection":[24,51,100,150,174],"algorithms":[25,105],"for":[26,53,90,98,110,206],"abnormal":[27,32,54],"meters":[29,35,57],"cannot":[30],"detect":[31,76],"out-of-tolerance":[33,55,197],"quickly":[36],"and":[37,77,118,126,139,145,185,194],"timely":[38],"due":[39],"to":[40,75,87,108,129,163,181],"their":[41],"slow":[42],"computing":[43],"speed.":[44],"To":[45],"address":[46],"this":[47,168],"issue,":[48],"a":[49,177,187,195],"rapid":[50],"technology":[52],"based":[58,123],"on":[59,124],"FIT":[60],"model":[61],"theory":[62],"is":[63,101,151],"proposed.":[64],"Firstly,":[65],"collect":[66],"power":[68,72,82,91,147],"data":[69,128,136],"device":[74],"fill":[78],"missing":[81],"data.":[84],"Secondly,":[85],"according":[86],"demand":[89],"error":[93,99,149],"detection,":[94],"an":[95,201],"objective":[96,160],"function":[97],"constructed.":[102],"Finally,":[103],"genetic":[104],"are":[106,121,137],"used":[107],"search":[109,132,143,166],"optimal":[112],"configuration":[113],"parameters":[114],"model,":[117],"filtering":[119],"strategies":[120],"formulated":[122],"residual":[125,135],"other":[127],"reduce":[130,171],"space.":[133],"The":[134],"smoothed":[138],"denoised":[140],"space,":[144],"completed":[152],"by":[153],"solving":[154],"extreme":[156],"value":[157],"function.":[161],"Compared":[162],"previous":[164],"fit":[165],"algorithms,":[167],"algorithm":[169],"average":[173],"time":[175],"single":[178],"substation":[179,208],"area":[180],"about":[182],"30":[183],"s":[184],"achieve":[186],"high":[188],"hit":[189],"rate":[190],"over":[192],"98%":[193],"high-precision":[196],"calculation":[198],"range":[199],"within":[200],"absolute":[202],"difference":[203],"0.005":[205],"computable":[207],"areas.":[209]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}