{"id":"https://openalex.org/W4307714145","doi":"https://doi.org/10.1142/s0218126623501426","title":"Construction Technique and Evaluation of High Performance t-bit Burst Error Correcting Codes for Protecting MCUs","display_name":"Construction Technique and Evaluation of High Performance t-bit Burst Error Correcting Codes for Protecting MCUs","publication_year":2022,"publication_date":"2022-10-28","ids":{"openalex":"https://openalex.org/W4307714145","doi":"https://doi.org/10.1142/s0218126623501426"},"language":"en","primary_location":{"id":"doi:10.1142/s0218126623501426","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218126623501426","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103232027","display_name":"Raj Kumar Maity","orcid":"https://orcid.org/0000-0002-2676-3052"},"institutions":[{"id":"https://openalex.org/I175399479","display_name":"Haldia Institute of Technology","ror":"https://ror.org/0211bs523","country_code":"IN","type":"education","lineage":["https://openalex.org/I175399479"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Raj Kumar Maity","raw_affiliation_strings":["Department of ECE, Haldia Institute of Technology, Haldia, West Bengal, India"],"raw_orcid":"https://orcid.org/0000-0002-2676-3052","affiliations":[{"raw_affiliation_string":"Department of ECE, Haldia Institute of Technology, Haldia, West Bengal, India","institution_ids":["https://openalex.org/I175399479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002704029","display_name":"Jagannath Samanta","orcid":"https://orcid.org/0000-0003-1168-1166"},"institutions":[{"id":"https://openalex.org/I175399479","display_name":"Haldia Institute of Technology","ror":"https://ror.org/0211bs523","country_code":"IN","type":"education","lineage":["https://openalex.org/I175399479"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Jagannath Samanta","raw_affiliation_strings":["Department of ECE, Haldia Institute of Technology, Haldia, West Bengal, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, Haldia Institute of Technology, Haldia, West Bengal, India","institution_ids":["https://openalex.org/I175399479"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090384102","display_name":"Jaydeb Bhaumik","orcid":"https://orcid.org/0000-0001-5382-9128"},"institutions":[{"id":"https://openalex.org/I170979836","display_name":"Jadavpur University","ror":"https://ror.org/02af4h012","country_code":"IN","type":"education","lineage":["https://openalex.org/I170979836"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Jaydeb Bhaumik","raw_affiliation_strings":["Department of ETCE, Jadavpur University, Kolkata, West Bengal, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ETCE, Jadavpur University, Kolkata, West Bengal, India","institution_ids":["https://openalex.org/I170979836"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5103232027"],"corresponding_institution_ids":["https://openalex.org/I175399479"],"apc_list":null,"apc_paid":null,"fwci":0.3534,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.56146054,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"32","issue":"09","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7033393383026123},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5931886434555054},{"id":"https://openalex.org/keywords/codec","display_name":"Codec","score":0.5606684684753418},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.5352189540863037},{"id":"https://openalex.org/keywords/parity-bit","display_name":"Parity bit","score":0.5152507424354553},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.49271419644355774},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.4469453990459442},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.4461532235145569},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.43087732791900635},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.41750526428222656},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.40648552775382996},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35096561908721924},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1429201066493988},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12374740839004517}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7033393383026123},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5931886434555054},{"id":"https://openalex.org/C161765866","wikidata":"https://www.wikidata.org/wiki/Q184748","display_name":"Codec","level":2,"score":0.5606684684753418},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.5352189540863037},{"id":"https://openalex.org/C131521367","wikidata":"https://www.wikidata.org/wiki/Q625502","display_name":"Parity bit","level":2,"score":0.5152507424354553},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.49271419644355774},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.4469453990459442},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.4461532235145569},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.43087732791900635},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.41750526428222656},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40648552775382996},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35096561908721924},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1429201066493988},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12374740839004517},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1142/s0218126623501426","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218126623501426","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1980073965","https://openalex.org/W2021708499","https://openalex.org/W2025474944","https://openalex.org/W2050902046","https://openalex.org/W2059625562","https://openalex.org/W2075095510","https://openalex.org/W2093138466","https://openalex.org/W2097297781","https://openalex.org/W2099569658","https://openalex.org/W2121197955","https://openalex.org/W2138815251","https://openalex.org/W2747263721","https://openalex.org/W2806769967","https://openalex.org/W2943651316","https://openalex.org/W3020935962","https://openalex.org/W3092134587","https://openalex.org/W3154384612","https://openalex.org/W3191195764","https://openalex.org/W3194751858","https://openalex.org/W4213375449"],"related_works":["https://openalex.org/W2306469233","https://openalex.org/W2065356549","https://openalex.org/W2118844295","https://openalex.org/W2181665053","https://openalex.org/W2184233008","https://openalex.org/W4285816383","https://openalex.org/W2377071794","https://openalex.org/W44821633","https://openalex.org/W4312609455","https://openalex.org/W2171359119"],"abstract_inverted_index":{"The":[0,56,126,139],"occurrences":[1],"of":[2,20,54,59,81,110,168],"Multiple":[3],"Cell":[4],"Upset":[5],"(MCU)":[6],"are":[7,31,48,142,163],"more":[8],"liable":[9],"to":[10,25,35,154],"arise":[11],"in":[12,37,134,144,147,151,170,179],"modern":[13],"memory":[14,38],"systems":[15],"with":[16,44,107],"the":[17,52,60,166,173,185],"continuous":[18],"upgradation":[19],"microelectronics":[21],"technology":[22],"from":[23],"micron":[24],"deep":[26],"submicron":[27],"scales.":[28],"These":[29],"MCUs":[30],"mainly":[32],"induced":[33],"due":[34],"radiations":[36],"systems.":[39],"Error":[40,88],"Correcting":[41,89],"Codes":[42],"(ECCs)":[43],"lower":[45,160],"design":[46,161],"complexity":[47],"generally":[49],"preferred":[50],"for":[51,101,123,188],"mitigation":[53],"MCUs.":[55,197],"major":[57],"drawback":[58],"existing":[61,155],"ECC":[62],"is":[63,183],"requiring":[64],"higher":[65],"overheads":[66],"as":[67],"error":[68],"correction":[69],"capability":[70],"increases.":[71],"In":[72],"this":[73],"paper,":[74],"authors":[75],"have":[76,98,129],"proposed":[77,100,127,140,174],"a":[78,116],"new":[79],"class":[80],"high":[82],"performance":[83],"[Formula:":[84,190],"see":[85,96,191],"text]-bit":[86,192],"Burst":[87],"(BEC)":[90],"codes.":[91,125],"Parity":[92],"check":[93],"matrices":[94],"([Formula:":[95],"text])":[97],"been":[99,121,130],"3-bit":[102],"and":[103,113,132,136,149],"4-bit":[104],"BEC":[105],"codes":[106],"word":[108],"lengths":[109],"16-bit,":[111],"32-bit":[112],"64-bit.":[114],"Also":[115],"simplified":[117],"decoding":[118],"scheme":[119],"has":[120],"introduced":[122],"these":[124,159],"codecs":[128,141,175],"designed":[131],"implemented":[133],"FPGA":[135],"ASIC":[137],"platforms.":[138],"compact":[143],"area,":[145],"faster":[146],"speed":[148],"efficient":[150],"power":[152],"compared":[153],"related":[156],"schemes.":[157],"But":[158],"constrains":[162],"achieved":[164],"at":[165],"cost":[167],"increase":[169],"redundancy.":[171],"So,":[172],"can":[176],"be":[177],"employed":[178],"applications":[180],"where":[181],"redundancy":[182],"not":[184],"only":[186],"constrain":[187],"correcting":[189],"burst":[193],"errors":[194],"caused":[195],"by":[196]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}