{"id":"https://openalex.org/W2942163927","doi":"https://doi.org/10.1142/s021812662050053x","title":"SeRA: Self-Repairing Architecture for Dark Silicon Era","display_name":"SeRA: Self-Repairing Architecture for Dark Silicon Era","publication_year":2019,"publication_date":"2019-04-22","ids":{"openalex":"https://openalex.org/W2942163927","doi":"https://doi.org/10.1142/s021812662050053x","mag":"2942163927"},"language":"en","primary_location":{"id":"doi:10.1142/s021812662050053x","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s021812662050053x","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052452554","display_name":"Harini Sriraman","orcid":"https://orcid.org/0000-0002-2192-8153"},"institutions":[{"id":"https://openalex.org/I876193797","display_name":"Vellore Institute of Technology University","ror":"https://ror.org/00qzypv28","country_code":"IN","type":"education","lineage":["https://openalex.org/I876193797"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Harini sriraman","raw_affiliation_strings":["School of Computing Science and Engineering, Vellore Institute of Technology, Chennai, Tamil Nadu, India"],"raw_orcid":"https://orcid.org/0000-0002-2192-8153","affiliations":[{"raw_affiliation_string":"School of Computing Science and Engineering, Vellore Institute of Technology, Chennai, Tamil Nadu, India","institution_ids":["https://openalex.org/I876193797"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049273744","display_name":"V. Pattabiraman","orcid":"https://orcid.org/0000-0001-8734-2203"},"institutions":[{"id":"https://openalex.org/I876193797","display_name":"Vellore Institute of Technology University","ror":"https://ror.org/00qzypv28","country_code":"IN","type":"education","lineage":["https://openalex.org/I876193797"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Pattabiraman Venkatasubbu","raw_affiliation_strings":["School of Computing Science and Engineering, Vellore Institute of Technology, Chennai, Tamil Nadu, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computing Science and Engineering, Vellore Institute of Technology, Chennai, Tamil Nadu, India","institution_ids":["https://openalex.org/I876193797"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5052452554"],"corresponding_institution_ids":["https://openalex.org/I876193797"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0283455,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"29","issue":"04","first_page":"2050053","last_page":"2050053"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7289107441902161},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.693652331829071},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5888057947158813},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5859725475311279},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5825745463371277},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.580086350440979},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.5321271419525146},{"id":"https://openalex.org/keywords/mechanism","display_name":"Mechanism (biology)","score":0.4632365107536316},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22421565651893616},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10257294774055481}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7289107441902161},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.693652331829071},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5888057947158813},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5859725475311279},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5825745463371277},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.580086350440979},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.5321271419525146},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.4632365107536316},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22421565651893616},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10257294774055481},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1142/s021812662050053x","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s021812662050053x","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W164004061","https://openalex.org/W604137612","https://openalex.org/W1967482738","https://openalex.org/W1980072970","https://openalex.org/W2010396115","https://openalex.org/W2031647443","https://openalex.org/W2043422726","https://openalex.org/W2049114603","https://openalex.org/W2053700189","https://openalex.org/W2062214305","https://openalex.org/W2072930853","https://openalex.org/W2076569496","https://openalex.org/W2099569658","https://openalex.org/W2114626867","https://openalex.org/W2128663511","https://openalex.org/W2157602829","https://openalex.org/W2259879138","https://openalex.org/W2509489609","https://openalex.org/W2552213351","https://openalex.org/W2725179571","https://openalex.org/W2745235995","https://openalex.org/W2747220212","https://openalex.org/W2783728688","https://openalex.org/W2797678940","https://openalex.org/W2890156445","https://openalex.org/W3149410719"],"related_works":["https://openalex.org/W3011443213","https://openalex.org/W298517545","https://openalex.org/W2111241003","https://openalex.org/W4312291060","https://openalex.org/W4200391368","https://openalex.org/W127342102","https://openalex.org/W2210979487","https://openalex.org/W2074043759","https://openalex.org/W3157359390","https://openalex.org/W2351616294"],"abstract_inverted_index":{"The":[0,109],"lifetime":[1],"reliability":[2,17],"of":[3,48,73,79,81,105,118],"processors":[4],"has":[5,125],"become":[6],"a":[7,74,86],"major":[8],"design":[9,23,28],"constraint":[10],"in":[11],"the":[12,45,58,82,103,106,116,119,131],"dark":[13],"silicon":[14],"era.":[15],"Processor":[16],"issues":[18],"are":[19],"mainly":[20],"due":[21],"to":[22,43,62,115],"defects":[24],"and":[25],"aging.":[26],"Unlike":[27],"defects,":[29],"however,":[30],"aging":[31],"faults":[32],"gradually":[33],"accumulate":[34],"over":[35,102],"time.":[36],"Many":[37],"methods":[38],"have":[39],"recently":[40],"been":[41],"proposed":[42,66,110],"monitor":[44],"performance":[46,69],"degradation":[47,72],"circuits.":[49],"In":[50],"this":[51],"study,":[52],"an":[53,94],"architectural":[54],"solution":[55],"that":[56],"extends":[57],"circuit-level":[59],"age":[60],"monitoring":[61,68],"processor":[63,120],"stages":[64,117],"is":[65,89,113],"for":[67],"degradation.":[70],"When":[71],"stage":[75],"quantified":[76],"as":[77],"delay":[78],"half":[80],"reference":[83],"clock":[84],"occurs,":[85],"self-repairing":[87,111],"mechanism":[88,92,112],"triggered.":[90],"This":[91,122],"configures":[93],"field":[95],"programmable":[96],"gate":[97],"array":[98],"(FPGA),":[99],"which":[100],"takes":[101],"functions":[104],"degraded":[107],"unit.":[108],"applied":[114],"data-path.":[121],"method":[123],"(SeRA)":[124],"lesser":[126],"area":[127],"overhead":[128],"compared":[129],"with":[130],"state-of-art":[132],"solutions.":[133]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}