{"id":"https://openalex.org/W1989974213","doi":"https://doi.org/10.1142/s0218126615500735","title":"Low Leakage and Highly Noise Immune FinFET-Based Wide Fan-In Dynamic Logic Design","display_name":"Low Leakage and Highly Noise Immune FinFET-Based Wide Fan-In Dynamic Logic Design","publication_year":2015,"publication_date":"2015-03-13","ids":{"openalex":"https://openalex.org/W1989974213","doi":"https://doi.org/10.1142/s0218126615500735","mag":"1989974213"},"language":"en","primary_location":{"id":"doi:10.1142/s0218126615500735","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218126615500735","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042431936","display_name":"Vikas Mahor","orcid":"https://orcid.org/0000-0002-1304-4964"},"institutions":[{"id":"https://openalex.org/I9747756","display_name":"Atal Bihari Vajpayee Indian Institute of Information Technology and Management","ror":"https://ror.org/008b3ap06","country_code":"IN","type":"education","lineage":["https://openalex.org/I9747756"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vikas Mahor","raw_affiliation_strings":["Department of Information Technology, ABV-Indian Institute of Information Technology and Management, Gwalior, Madhya Pradesh 474011, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Technology, ABV-Indian Institute of Information Technology and Management, Gwalior, Madhya Pradesh 474011, India","institution_ids":["https://openalex.org/I9747756"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038140573","display_name":"Manisha Pattanaik","orcid":"https://orcid.org/0000-0001-7842-0695"},"institutions":[{"id":"https://openalex.org/I9747756","display_name":"Atal Bihari Vajpayee Indian Institute of Information Technology and Management","ror":"https://ror.org/008b3ap06","country_code":"IN","type":"education","lineage":["https://openalex.org/I9747756"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manisha Pattanaik","raw_affiliation_strings":["Department of Information Technology, ABV-Indian Institute of Information Technology and Management, Gwalior, Madhya Pradesh 474011, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Technology, ABV-Indian Institute of Information Technology and Management, Gwalior, Madhya Pradesh 474011, India","institution_ids":["https://openalex.org/I9747756"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I9747756"],"apc_list":null,"apc_paid":null,"fwci":1.1662,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.81031585,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"24","issue":"05","first_page":"1550073","last_page":"1550073"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise-immunity","display_name":"Noise immunity","score":0.780731201171875},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.7316035032272339},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7217987179756165},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6430874466896057},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5920625925064087},{"id":"https://openalex.org/keywords/fan-in","display_name":"Fan-in","score":0.5744824409484863},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5083381533622742},{"id":"https://openalex.org/keywords/fan-out","display_name":"Fan-out","score":0.4780885875225067},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4637499451637268},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4411298334598541},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4341590404510498},{"id":"https://openalex.org/keywords/leakage-power","display_name":"Leakage power","score":0.42619168758392334},{"id":"https://openalex.org/keywords/dynamic-logic","display_name":"Dynamic logic (digital electronics)","score":0.41913172602653503},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4099569618701935},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4071798622608185},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.18661722540855408},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18137630820274353}],"concepts":[{"id":"https://openalex.org/C2988494973","wikidata":"https://www.wikidata.org/wiki/Q179448","display_name":"Noise immunity","level":3,"score":0.780731201171875},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.7316035032272339},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7217987179756165},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6430874466896057},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5920625925064087},{"id":"https://openalex.org/C179431463","wikidata":"https://www.wikidata.org/wiki/Q1760638","display_name":"Fan-in","level":2,"score":0.5744824409484863},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5083381533622742},{"id":"https://openalex.org/C68812741","wikidata":"https://www.wikidata.org/wiki/Q636609","display_name":"Fan-out","level":3,"score":0.4780885875225067},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4637499451637268},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4411298334598541},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4341590404510498},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.42619168758392334},{"id":"https://openalex.org/C2777796570","wikidata":"https://www.wikidata.org/wiki/Q2351326","display_name":"Dynamic logic (digital electronics)","level":4,"score":0.41913172602653503},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4099569618701935},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4071798622608185},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.18661722540855408},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18137630820274353},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1142/s0218126615500735","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218126615500735","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8399999737739563,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W142327980","https://openalex.org/W1509276103","https://openalex.org/W1963680138","https://openalex.org/W2031056140","https://openalex.org/W2043620677","https://openalex.org/W2087435674","https://openalex.org/W2093855145","https://openalex.org/W2105874609","https://openalex.org/W2106371376","https://openalex.org/W2110827799","https://openalex.org/W2123636681","https://openalex.org/W2131862714","https://openalex.org/W2135407913","https://openalex.org/W2137615442","https://openalex.org/W2139867416","https://openalex.org/W2140322178","https://openalex.org/W2149515435","https://openalex.org/W2160367182","https://openalex.org/W2167756350","https://openalex.org/W2168096959","https://openalex.org/W2498032793"],"related_works":["https://openalex.org/W3207923681","https://openalex.org/W4281481227","https://openalex.org/W1990729833","https://openalex.org/W4249880903","https://openalex.org/W3100631062","https://openalex.org/W2257968364","https://openalex.org/W2397758652","https://openalex.org/W2118900528","https://openalex.org/W2786401865","https://openalex.org/W1989974213"],"abstract_inverted_index":{"Wide":[0],"fan-in":[1,22,106,176],"dynamic":[2,23,42,107,144,177],"logic":[3,24],"OR":[4,43,108,145,178],"gate":[5,25,82,96,109,146],"has":[6,110],"always":[7,27],"been":[8,111],"an":[9,28],"integral":[10],"part":[11],"of":[12,20,30,161],"high":[13,34,59,118],"speed":[14],"microprocessors.":[15],"However,":[16],"low":[17,148],"noise":[18,35,60,119,138],"immunity":[19,61,139],"wide":[21,105,175],"is":[26],"issue":[29,73],"concern.":[31],"For":[32],"maintaining":[33,58,133],"immunity,":[36],"various":[37],"large":[38,53],"sized":[39],"PMOS":[40],"keeper-based":[41],"gates":[44],"are":[45,86],"proposed":[46,112],"in":[47,77,174],"the":[48,65,156],"literature.":[49],"These":[50],"designs":[51],"allow":[52],"leakage":[54,90,115,126,158],"through":[55,92],"them":[56,93],"for":[57,74],"which":[62],"unnecessarily":[63],"increases":[64],"power":[66,127],"dissipation.":[67],"This":[68,121,151],"can":[69],"be":[70],"a":[71,102,124],"critical":[72],"microprocessors":[75],"used":[76],"battery":[78],"operated":[79],"devices.":[80],"Independent":[81],"(IG)":[83],"FinFET":[84,162],"devices":[85],"known":[87],"to":[88,130,135,142,165],"reduce":[89],"current":[91],"using":[94],"back":[95],"biasing":[97],"technique.":[98],"In":[99],"this":[100],"paper,":[101],"novel":[103],"FinFET-based":[104],"with":[113],"effective":[114,157],"control":[116],"and":[117,167],"immunity.":[120],"work":[122,152],"reports":[123],"maximum":[125],"reduction":[128,159],"up":[129,134],"70%":[131],"while":[132],"90%":[136],"higher":[137],"as":[140,163],"compared":[141,164],"standard":[143],"at":[147],"keeper":[149],"size.":[150],"also":[153],"mathematically":[154],"illustrates":[155],"capability":[160],"CMOS":[166,173],"hence":[168],"proves":[169],"its":[170],"preference":[171],"over":[172],"gate.":[179]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}