{"id":"https://openalex.org/W2022230218","doi":"https://doi.org/10.1142/s0218126611007918","title":"PARAMETRIC DEVIATION BASED ANALOG TEST AND DIAGNOSIS SYSTEM","display_name":"PARAMETRIC DEVIATION BASED ANALOG TEST AND DIAGNOSIS SYSTEM","publication_year":2011,"publication_date":"2011-11-01","ids":{"openalex":"https://openalex.org/W2022230218","doi":"https://doi.org/10.1142/s0218126611007918","mag":"2022230218"},"language":"en","primary_location":{"id":"doi:10.1142/s0218126611007918","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218126611007918","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102786486","display_name":"Kasturi Ghosh","orcid":"https://orcid.org/0000-0001-8173-496X"},"institutions":[{"id":"https://openalex.org/I98365261","display_name":"Indian Institute of Engineering Science and Technology, Shibpur","ror":"https://ror.org/02ytfzr55","country_code":"IN","type":"education","lineage":["https://openalex.org/I98365261"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"KASTURI GHOSH","raw_affiliation_strings":["Electronics and Tele-Communication Engineering Department, Bengal Engineering and Science University, Shibpur, Howrah 711103, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Tele-Communication Engineering Department, Bengal Engineering and Science University, Shibpur, Howrah 711103, India","institution_ids":["https://openalex.org/I98365261"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101181977","display_name":"Arabinda Roy","orcid":null},"institutions":[{"id":"https://openalex.org/I98365261","display_name":"Indian Institute of Engineering Science and Technology, Shibpur","ror":"https://ror.org/02ytfzr55","country_code":"IN","type":"education","lineage":["https://openalex.org/I98365261"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"ARABINDA ROY","raw_affiliation_strings":["Electronics and Tele-Communication Engineering Department, Bengal Engineering and Science University, Shibpur, Howrah 711103, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Tele-Communication Engineering Department, Bengal Engineering and Science University, Shibpur, Howrah 711103, India","institution_ids":["https://openalex.org/I98365261"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038454822","display_name":"Sekhar Mondal","orcid":null},"institutions":[{"id":"https://openalex.org/I98365261","display_name":"Indian Institute of Engineering Science and Technology, Shibpur","ror":"https://ror.org/02ytfzr55","country_code":"IN","type":"education","lineage":["https://openalex.org/I98365261"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"SEKHAR MONDAL","raw_affiliation_strings":["Electronics and Tele-Communication Engineering Department, Bengal Engineering and Science University, Shibpur, Howrah 711103, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Tele-Communication Engineering Department, Bengal Engineering and Science University, Shibpur, Howrah 711103, India","institution_ids":["https://openalex.org/I98365261"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102103819","display_name":"Baidyanath Ray","orcid":null},"institutions":[{"id":"https://openalex.org/I98365261","display_name":"Indian Institute of Engineering Science and Technology, Shibpur","ror":"https://ror.org/02ytfzr55","country_code":"IN","type":"education","lineage":["https://openalex.org/I98365261"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"BAIDYANATH RAY","raw_affiliation_strings":["Electronics and Tele-Communication Engineering Department, Bengal Engineering and Science University, Shibpur, Howrah 711103, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Tele-Communication Engineering Department, Bengal Engineering and Science University, Shibpur, Howrah 711103, India","institution_ids":["https://openalex.org/I98365261"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I98365261"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.10329429,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"20","issue":"07","first_page":"1323","last_page":"1340"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12162","display_name":"Cellular Automata and Applications","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12162","display_name":"Cellular Automata and Applications","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.7931877374649048},{"id":"https://openalex.org/keywords/signature","display_name":"Signature (topology)","score":0.5769959092140198},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5691214799880981},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.523000180721283},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.5111296772956848},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.4436858594417572},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37854278087615967},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3777047395706177},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.356296181678772},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.35199466347694397},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3455106019973755},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22308191657066345},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20480823516845703},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.19948580861091614}],"concepts":[{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.7931877374649048},{"id":"https://openalex.org/C2779696439","wikidata":"https://www.wikidata.org/wiki/Q7512811","display_name":"Signature (topology)","level":2,"score":0.5769959092140198},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5691214799880981},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.523000180721283},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.5111296772956848},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.4436858594417572},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37854278087615967},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3777047395706177},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.356296181678772},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.35199466347694397},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3455106019973755},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22308191657066345},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20480823516845703},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.19948580861091614},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1142/s0218126611007918","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218126611007918","pdf_url":null,"source":{"id":"https://openalex.org/S167602672","display_name":"Journal of Circuits Systems and Computers","issn_l":"0218-1266","issn":["0218-1266","1793-6454"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Circuits, Systems and Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W566598247","https://openalex.org/W1965081201","https://openalex.org/W2000331453","https://openalex.org/W2023993323","https://openalex.org/W2058870781","https://openalex.org/W2096304548","https://openalex.org/W2108704847","https://openalex.org/W2133952565"],"related_works":["https://openalex.org/W2131559056","https://openalex.org/W4254560580","https://openalex.org/W2127167802","https://openalex.org/W2080984854","https://openalex.org/W2323083271","https://openalex.org/W2019500818","https://openalex.org/W2110962837","https://openalex.org/W4235748303","https://openalex.org/W2385628479","https://openalex.org/W2375192119"],"abstract_inverted_index":{"This":[0],"paper":[1],"reports":[2],"a":[3,26],"comprehensive":[4],"solution":[5],"for":[6],"the":[7,20],"problem":[8],"of":[9,13,23,37],"test":[10,27],"and":[11,28],"diagnosis":[12,29],"OTA":[14],"based":[15,61],"analog":[16],"circuits.":[17],"Based":[18],"on":[19],"parametric":[21],"deviation":[22],"circuit":[24],"components,":[25],"methodology":[30],"are":[31],"proposed.":[32],"Compressed":[33],"signature":[34],"generated":[35],"out":[36],"multiple":[38],"performance":[39],"parameters":[40],"has":[41,54],"resulted":[42],"in":[43,46],"significant":[44],"enhancement":[45],"fault":[47],"diagnosing":[48],"capability.":[49],"The":[50],"voluminous":[51],"response":[52],"data":[53],"been":[55],"handled":[56],"with":[57],"Cellular":[58],"Automata":[59],"(CA)":[60],"classifier":[62],"to":[63],"achieve":[64],"excellent":[65],"diagnostic":[66],"resolution.":[67]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}