{"id":"https://openalex.org/W4213321428","doi":"https://doi.org/10.1142/s0218001422500124","title":"Module Against Power Consumption Attacks for Trustworthiness of Vehicular AI Chips in Wide Temperature Range","display_name":"Module Against Power Consumption Attacks for Trustworthiness of Vehicular AI Chips in Wide Temperature Range","publication_year":2022,"publication_date":"2022-02-21","ids":{"openalex":"https://openalex.org/W4213321428","doi":"https://doi.org/10.1142/s0218001422500124"},"language":"en","primary_location":{"id":"doi:10.1142/s0218001422500124","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218001422500124","pdf_url":null,"source":{"id":"https://openalex.org/S41486457","display_name":"International Journal of Pattern Recognition and Artificial Intelligence","issn_l":"0218-0014","issn":["0218-0014","1793-6381"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Pattern Recognition and Artificial Intelligence","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022299432","display_name":"Zongwei Zhu","orcid":"https://orcid.org/0000-0003-3607-2631"},"institutions":[{"id":"https://openalex.org/I308837","display_name":"Suzhou University of Science and Technology","ror":"https://ror.org/04en8wb91","country_code":"CN","type":"education","lineage":["https://openalex.org/I308837"]},{"id":"https://openalex.org/I4210125878","display_name":"Suzhou Research Institute","ror":"https://ror.org/03ebk0c60","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210125878"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zongwei Zhu","raw_affiliation_strings":["School of Software Engineering, Suzhou Research Institute for Advanced Study, University of Science and Technology of China, Suzhou 215000, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Software Engineering, Suzhou Research Institute for Advanced Study, University of Science and Technology of China, Suzhou 215000, P. R. China","institution_ids":["https://openalex.org/I308837","https://openalex.org/I4210125878"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101916933","display_name":"Jiawei Geng","orcid":"https://orcid.org/0000-0001-7405-9820"},"institutions":[{"id":"https://openalex.org/I308837","display_name":"Suzhou University of Science and Technology","ror":"https://ror.org/04en8wb91","country_code":"CN","type":"education","lineage":["https://openalex.org/I308837"]},{"id":"https://openalex.org/I4210125878","display_name":"Suzhou Research Institute","ror":"https://ror.org/03ebk0c60","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210125878"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiawei Geng","raw_affiliation_strings":["School of Software Engineering, Suzhou Research Institute for Advanced Study, University of Science and Technology of China, Suzhou 215000, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Software Engineering, Suzhou Research Institute for Advanced Study, University of Science and Technology of China, Suzhou 215000, P. R. China","institution_ids":["https://openalex.org/I308837","https://openalex.org/I4210125878"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107556956","display_name":"Mingliang Zhou","orcid":"https://orcid.org/0000-0002-1874-3641"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Mingliang Zhou","raw_affiliation_strings":["The School of Computer Science, Chongqing University, Chongqing 400044, P. R. China"],"raw_orcid":"https://orcid.org/0000-0002-1874-3641","affiliations":[{"raw_affiliation_string":"The School of Computer Science, Chongqing University, Chongqing 400044, P. R. China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046520540","display_name":"Bin Fang","orcid":"https://orcid.org/0000-0003-1955-6626"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Fang","raw_affiliation_strings":["The School of Computer Science, Chongqing University, Chongqing 400044, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The School of Computer Science, Chongqing University, Chongqing 400044, P. R. China","institution_ids":["https://openalex.org/I158842170"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5107556956"],"corresponding_institution_ids":["https://openalex.org/I158842170"],"apc_list":null,"apc_paid":null,"fwci":0.1847,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.45743999,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"36","issue":"03","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7049996256828308},{"id":"https://openalex.org/keywords/power-management","display_name":"Power management","score":0.5900921821594238},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5457009077072144},{"id":"https://openalex.org/keywords/frequency-scaling","display_name":"Frequency scaling","score":0.5307599902153015},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.4863279461860657},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.467207133769989},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4639524817466736},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.45438632369041443},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.42560291290283203},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.41884663701057434},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.39331403374671936},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2401096224784851},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19479405879974365},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14286261796951294}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7049996256828308},{"id":"https://openalex.org/C2778774385","wikidata":"https://www.wikidata.org/wiki/Q4437810","display_name":"Power management","level":3,"score":0.5900921821594238},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5457009077072144},{"id":"https://openalex.org/C157742956","wikidata":"https://www.wikidata.org/wiki/Q3237776","display_name":"Frequency scaling","level":3,"score":0.5307599902153015},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.4863279461860657},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.467207133769989},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4639524817466736},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.45438632369041443},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.42560291290283203},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.41884663701057434},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.39331403374671936},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2401096224784851},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19479405879974365},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14286261796951294},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1142/s0218001422500124","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218001422500124","pdf_url":null,"source":{"id":"https://openalex.org/S41486457","display_name":"International Journal of Pattern Recognition and Artificial Intelligence","issn_l":"0218-0014","issn":["0218-0014","1793-6381"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Pattern Recognition and Artificial Intelligence","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.550000011920929,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G3621641406","display_name":null,"funder_award_id":"cstc2020jcyj-msxmX0790","funder_id":"https://openalex.org/F4320315254","funder_display_name":"Innovative Research Group Project of the National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320315254","display_name":"Innovative Research Group Project of the National Natural Science Foundation of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1979979548","https://openalex.org/W1986800449","https://openalex.org/W2014149911","https://openalex.org/W2037227137","https://openalex.org/W2056370048","https://openalex.org/W2161125731","https://openalex.org/W2193145675","https://openalex.org/W2719445145","https://openalex.org/W2743978480","https://openalex.org/W2767247349","https://openalex.org/W2791393438","https://openalex.org/W2899746594","https://openalex.org/W2901408149","https://openalex.org/W2948962659","https://openalex.org/W2949198917","https://openalex.org/W2953735756","https://openalex.org/W2955907793","https://openalex.org/W2965003173","https://openalex.org/W2971544482","https://openalex.org/W2993362297","https://openalex.org/W2997622231","https://openalex.org/W3017135641","https://openalex.org/W3023865213","https://openalex.org/W3034176714","https://openalex.org/W3080622597","https://openalex.org/W3090069470","https://openalex.org/W3102120768","https://openalex.org/W3102905858","https://openalex.org/W3105886168","https://openalex.org/W3106250896","https://openalex.org/W3112586499","https://openalex.org/W3120281263","https://openalex.org/W3126385356","https://openalex.org/W3132823556","https://openalex.org/W3135014913"],"related_works":["https://openalex.org/W2560934260","https://openalex.org/W2185484302","https://openalex.org/W118540524","https://openalex.org/W1979022228","https://openalex.org/W2016557289","https://openalex.org/W2140373546","https://openalex.org/W2387198210","https://openalex.org/W4318253203","https://openalex.org/W2113883489","https://openalex.org/W2373216907"],"abstract_inverted_index":{"Power":[0],"consumption":[1,63,129,157],"attacks":[2,64],"monitoring":[3,23,48,85,100,154,168],"on":[4,28,56],"artificial":[5],"intelligence":[6],"(AI)":[7],"chips":[8,54],"play":[9],"a":[10,44,78,111,127],"critical":[11],"role":[12],"in":[13,67,110,159],"the":[14,21,29,41,72,94,103,107,116,142],"vehicular":[15,52],"AI":[16,53],"systems.":[17],"However,":[18],"most":[19],"of":[20,31,35,51,74,97,106,150],"current":[22],"and":[24,49,58,124,136,152,155,169],"management":[25,50,130],"methods":[26,149],"focus":[27],"trustworthiness":[30],"industrial":[32],"equipment":[33],"instead":[34],"resource-constrained":[36],"edge":[37],"devices.":[38],"To":[39],"address":[40,93],"above":[42],"problem,":[43],"closed-loop":[45],"module":[46],"for":[47,83],"based":[55],"fitting":[57],"filtering":[59],"to":[60,86,101,121],"resist":[61],"power":[62,84,89,128,151,156],"is":[65,119],"proposed":[66],"this":[68],"paper.":[69],"First,":[70],"considering":[71],"characteristics":[73],"power,":[75],"we":[76,92],"propose":[77],"raw":[79],"data":[80],"correction":[81],"approach":[82],"monitor":[87,102],"abnormal":[88,104],"consumption.":[90],"Second,":[91],"challenging":[95],"problem":[96,131],"precision":[98],"temperature":[99,105,113,153],"chip,":[108],"especially":[109],"wide":[112,160],"range.":[114],"Finally,":[115],"established":[117],"method":[118,163],"applied":[120],"attack":[122],"surveillance":[123],"transformed":[125],"into":[126],"solved":[132],"by":[133],"dynamic":[134],"voltage":[135],"frequency":[137],"scaling":[138],"(DVFS)":[139],"technology.":[140],"As":[141],"experimental":[143],"results":[144],"reveal,":[145],"compared":[146],"with":[147],"existing":[148],"control":[158],"temperature,":[161],"our":[162],"can":[164],"achieve":[165],"significantly":[166],"improved":[167],"managing":[170],"performance.":[171]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}