{"id":"https://openalex.org/W2100337189","doi":"https://doi.org/10.1142/s0218001401001052","title":"OFFLINE SIGNATURE VERIFICATION BY THE ANALYSIS OF CURSIVE STROKES","display_name":"OFFLINE SIGNATURE VERIFICATION BY THE ANALYSIS OF CURSIVE STROKES","publication_year":2001,"publication_date":"2001-06-01","ids":{"openalex":"https://openalex.org/W2100337189","doi":"https://doi.org/10.1142/s0218001401001052","mag":"2100337189"},"language":"en","primary_location":{"id":"doi:10.1142/s0218001401001052","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218001401001052","pdf_url":null,"source":{"id":"https://openalex.org/S41486457","display_name":"International Journal of Pattern Recognition and Artificial Intelligence","issn_l":"0218-0014","issn":["0218-0014","1793-6381"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Pattern Recognition and Artificial Intelligence","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035538125","display_name":"Bowen Fang","orcid":"https://orcid.org/0009-0006-0664-3498"},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"B. FANG","raw_affiliation_strings":["Department of Electrical &amp; Electronic Engineering, The University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical &amp; Electronic Engineering, The University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084645882","display_name":"Y. Y. WANG","orcid":null},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Y. Y. WANG","raw_affiliation_strings":["Department of Electrical &amp; Electronic Engineering, The University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical &amp; Electronic Engineering, The University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103534736","display_name":"C. H. LEUNG","orcid":null},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"C. H. LEUNG","raw_affiliation_strings":["Department of Electrical &amp; Electronic Engineering, The University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical &amp; Electronic Engineering, The University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075838839","display_name":"K.W. Tse","orcid":null},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"K. W. TSE","raw_affiliation_strings":["Department of Electrical &amp; Electronic Engineering, The University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical &amp; Electronic Engineering, The University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085140523","display_name":"Yuan Yan Tang","orcid":"https://orcid.org/0000-0002-6887-130X"},"institutions":[{"id":"https://openalex.org/I141568987","display_name":"Hong Kong Baptist University","ror":"https://ror.org/0145fw131","country_code":"HK","type":"education","lineage":["https://openalex.org/I141568987"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Y. Y. TANG","raw_affiliation_strings":["Department of Computer Science, Hong Kong Baptist University, Hong Kong, China","Department of Computer Science, Hong Kong Baptist University, Hong Kong (China)"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Hong Kong Baptist University, Hong Kong, China","institution_ids":["https://openalex.org/I141568987"]},{"raw_affiliation_string":"Department of Computer Science, Hong Kong Baptist University, Hong Kong (China)","institution_ids":["https://openalex.org/I141568987"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044313548","display_name":"P.C.K. Kwok","orcid":"https://orcid.org/0009-0004-1752-7156"},"institutions":[{"id":"https://openalex.org/I8679417","display_name":"Hong Kong Metropolitan University","ror":"https://ror.org/0349bsm71","country_code":"HK","type":"education","lineage":["https://openalex.org/I8679417"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"P. C. K. KWOK","raw_affiliation_strings":["School of Science &amp; Technology, The Open University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"School of Science &amp; Technology, The Open University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I8679417"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112926486","display_name":"Y.K. Wong","orcid":null},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Y. K. WONG","raw_affiliation_strings":["Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong, China","[Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong, China.]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong, China","institution_ids":["https://openalex.org/I14243506"]},{"raw_affiliation_string":"[Department of Electrical Engineering, The Hong Kong Polytechnic University, Hong Kong, China.]","institution_ids":["https://openalex.org/I14243506"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5035538125"],"corresponding_institution_ids":["https://openalex.org/I889458895"],"apc_list":null,"apc_paid":null,"fwci":0.7221,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.77422121,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"15","issue":"04","first_page":"659","last_page":"673"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10601","display_name":"Handwritten Text Recognition Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10601","display_name":"Handwritten Text Recognition Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14339","display_name":"Image Processing and 3D Reconstruction","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10181","display_name":"Natural Language Processing Techniques","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cursive","display_name":"Cursive","score":0.9207378625869751},{"id":"https://openalex.org/keywords/smoothness","display_name":"Smoothness","score":0.8049060106277466},{"id":"https://openalex.org/keywords/signature","display_name":"Signature (topology)","score":0.7936491966247559},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.630698025226593},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5938082337379456},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.553749680519104},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5324576497077942},{"id":"https://openalex.org/keywords/fractal-dimension","display_name":"Fractal dimension","score":0.4592788517475128},{"id":"https://openalex.org/keywords/biometrics","display_name":"Biometrics","score":0.4397767186164856},{"id":"https://openalex.org/keywords/dimension","display_name":"Dimension (graph theory)","score":0.42855170369148254},{"id":"https://openalex.org/keywords/fractal","display_name":"Fractal","score":0.3249399960041046},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2763170003890991}],"concepts":[{"id":"https://openalex.org/C2778943297","wikidata":"https://www.wikidata.org/wiki/Q1079418","display_name":"Cursive","level":2,"score":0.9207378625869751},{"id":"https://openalex.org/C102634674","wikidata":"https://www.wikidata.org/wiki/Q868473","display_name":"Smoothness","level":2,"score":0.8049060106277466},{"id":"https://openalex.org/C2779696439","wikidata":"https://www.wikidata.org/wiki/Q7512811","display_name":"Signature (topology)","level":2,"score":0.7936491966247559},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.630698025226593},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5938082337379456},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.553749680519104},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5324576497077942},{"id":"https://openalex.org/C26546657","wikidata":"https://www.wikidata.org/wiki/Q1412452","display_name":"Fractal dimension","level":3,"score":0.4592788517475128},{"id":"https://openalex.org/C184297639","wikidata":"https://www.wikidata.org/wiki/Q177765","display_name":"Biometrics","level":2,"score":0.4397767186164856},{"id":"https://openalex.org/C33676613","wikidata":"https://www.wikidata.org/wiki/Q13415176","display_name":"Dimension (graph theory)","level":2,"score":0.42855170369148254},{"id":"https://openalex.org/C40636538","wikidata":"https://www.wikidata.org/wiki/Q81392","display_name":"Fractal","level":2,"score":0.3249399960041046},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2763170003890991},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1142/s0218001401001052","is_oa":false,"landing_page_url":"https://doi.org/10.1142/s0218001401001052","pdf_url":null,"source":{"id":"https://openalex.org/S41486457","display_name":"International Journal of Pattern Recognition and Artificial Intelligence","issn_l":"0218-0014","issn":["0218-0014","1793-6381"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Pattern Recognition and Artificial Intelligence","raw_type":"journal-article"},{"id":"pmh:oai:hub.hku.hk:10722/155149","is_oa":false,"landing_page_url":"http://hdl.handle.net/10722/155149","pdf_url":null,"source":{"id":"https://openalex.org/S4377196271","display_name":"The HKU Scholars Hub (University of Hong Kong)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I889458895","host_organization_name":"University of Hong Kong","host_organization_lineage":["https://openalex.org/I889458895"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"},{"id":"pmh:oai:ira.lib.polyu.edu.hk:10397/10744","is_oa":false,"landing_page_url":"http://hdl.handle.net/10397/10744","pdf_url":null,"source":{"id":"https://openalex.org/S4306400205","display_name":"PolyU Institutional Research Archive (Hong Kong Polytechnic University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I14243506","host_organization_name":"Hong Kong Polytechnic University","host_organization_lineage":["https://openalex.org/I14243506"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Journal/Magazine Article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1821815814","https://openalex.org/W1966754847","https://openalex.org/W2010190925","https://openalex.org/W2060755870","https://openalex.org/W2062219129","https://openalex.org/W2067727875","https://openalex.org/W2080957671","https://openalex.org/W2091099075","https://openalex.org/W2111140386","https://openalex.org/W2161321820","https://openalex.org/W2170633497","https://openalex.org/W2477160486","https://openalex.org/W4245384533"],"related_works":["https://openalex.org/W2373698219","https://openalex.org/W2035729865","https://openalex.org/W4253008392","https://openalex.org/W2986912172","https://openalex.org/W3092020155","https://openalex.org/W2131709163","https://openalex.org/W2244034498","https://openalex.org/W3007170103","https://openalex.org/W2808384053","https://openalex.org/W1601070380"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,15,55,58,62],"method":[4,60],"is":[5,12,19,71],"proposed":[6,52,68],"for":[7,40,78],"offline":[8],"signature":[9,79],"verification.":[10],"It":[11,18],"based":[13],"on":[14],"smoothness":[16,56,69],"criterion.":[17],"observed":[20],"that":[21,43],"the":[22,36,67],"cursive":[23,46],"segments":[24],"of":[25,45],"forgery":[26],"signatures":[27,42],"are":[28,51,83],"generally":[29],"less":[30,33],"smooth":[31],"and":[32,61],"natural":[34],"than":[35],"genuine":[37],"ones,":[38],"especially":[39],"those":[41],"consist":[44],"graphic":[47],"patterns.":[48],"Two":[49],"approaches":[50],"to":[53],"extract":[54],"feature:":[57],"crossing":[59],"fractal":[63],"dimension":[64],"method.":[65],"When":[66],"feature":[70],"combined":[72],"with":[73],"other":[74],"global":[75],"shape":[76],"features":[77],"verification,":[80],"satisfactory":[81],"results":[82],"obtained.":[84]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
