{"id":"https://openalex.org/W375820185","doi":"https://doi.org/10.1142/4011","title":"Contributions to Hardware and Software Reliability","display_name":"Contributions to Hardware and Software Reliability","publication_year":1999,"publication_date":"1999-04-01","ids":{"openalex":"https://openalex.org/W375820185","doi":"https://doi.org/10.1142/4011","mag":"375820185"},"language":"en","primary_location":{"id":"doi:10.1142/4011","is_oa":false,"landing_page_url":"https://doi.org/10.1142/4011","pdf_url":null,"source":{"id":"https://openalex.org/S4210189942","display_name":"Series on quality, reliability and engineering statistics","issn_l":"1793-0723","issn":["1793-0723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Series on Quality, Reliability and Engineering Statistics","raw_type":"monograph"},"type":"book","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013827274","display_name":"P. K. Kapur","orcid":"https://orcid.org/0000-0001-8006-5952"},"institutions":[{"id":"https://openalex.org/I110166357","display_name":"University of Delhi","ror":"https://ror.org/04gzb2213","country_code":"IN","type":"education","lineage":["https://openalex.org/I110166357"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"P K Kapur","raw_affiliation_strings":["University of DelhiIndia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of DelhiIndia","institution_ids":["https://openalex.org/I110166357"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030134245","display_name":"R. B. Garg","orcid":"https://orcid.org/0000-0002-2691-7963"},"institutions":[{"id":"https://openalex.org/I110166357","display_name":"University of Delhi","ror":"https://ror.org/04gzb2213","country_code":"IN","type":"education","lineage":["https://openalex.org/I110166357"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"R B Garg","raw_affiliation_strings":["University of DelhiIndia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of DelhiIndia","institution_ids":["https://openalex.org/I110166357"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101640886","display_name":"Sanjeev Kumar","orcid":"https://orcid.org/0000-0003-0941-3509"},"institutions":[{"id":"https://openalex.org/I312958679","display_name":"National University of Science and Technology","ror":"https://ror.org/02kesvt12","country_code":"ZW","type":"education","lineage":["https://openalex.org/I312958679"]}],"countries":["ZW"],"is_corresponding":false,"raw_author_name":"S Kumar","raw_affiliation_strings":["National University of Science & TechnologyZimbabwe"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National University of Science & TechnologyZimbabwe","institution_ids":["https://openalex.org/I312958679"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1456,"has_fulltext":false,"cited_by_count":232,"citation_normalized_percentile":{"value":0.72316384,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9790999889373779,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10974","display_name":"Advanced Queuing Theory Analysis","score":0.9273999929428101,"subfield":{"id":"https://openalex.org/subfields/1404","display_name":"Management Information Systems"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7175292372703552},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.714348316192627},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.6409703493118286},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6253071427345276},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5963172316551208},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5664209127426147},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.3669915199279785},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.26737210154533386},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.22343599796295166},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.16417434811592102},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15462404489517212}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7175292372703552},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.714348316192627},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.6409703493118286},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6253071427345276},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5963172316551208},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5664209127426147},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3669915199279785},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.26737210154533386},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.22343599796295166},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.16417434811592102},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15462404489517212},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1142/4011","is_oa":false,"landing_page_url":"https://doi.org/10.1142/4011","pdf_url":null,"source":{"id":"https://openalex.org/S4210189942","display_name":"Series on quality, reliability and engineering statistics","issn_l":"1793-0723","issn":["1793-0723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319815","host_organization_name":"World Scientific","host_organization_lineage":["https://openalex.org/P4310319815"],"host_organization_lineage_names":["World Scientific"],"type":"book series"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Series on Quality, Reliability and Engineering Statistics","raw_type":"monograph"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433"],"abstract_inverted_index":{"Preliminary":[0],"concepts":[1],"and":[2,28],"background":[3],"replacement":[4],"policies":[5,23],"with":[6,10],"minimal":[7],"repairs":[8],"problems":[9],"applications":[11],"to":[12],"computing":[13],"systems":[14],"software":[15],"reliability":[16,29],"growth":[17],"models":[18],"based":[19],"on":[20],"NHPP":[21],"release":[22],"numerical":[24],"computations":[25],"in":[26],"renewal":[27],"theory.":[30]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":13},{"year":2017,"cited_by_count":15},{"year":2016,"cited_by_count":16},{"year":2015,"cited_by_count":12},{"year":2014,"cited_by_count":23},{"year":2013,"cited_by_count":12},{"year":2012,"cited_by_count":21}],"updated_date":"2026-02-27T14:28:36.762950","created_date":"2025-10-10T00:00:00"}