{"id":"https://openalex.org/W4400211265","doi":"https://doi.org/10.1137/23m1599458","title":"Identifying Active Anomalies in a Multilayered Medium by Passive Measurement in EIT","display_name":"Identifying Active Anomalies in a Multilayered Medium by Passive Measurement in EIT","publication_year":2024,"publication_date":"2024-07-01","ids":{"openalex":"https://openalex.org/W4400211265","doi":"https://doi.org/10.1137/23m1599458"},"language":"en","primary_location":{"id":"doi:10.1137/23m1599458","is_oa":false,"landing_page_url":"https://doi.org/10.1137/23m1599458","pdf_url":null,"source":{"id":"https://openalex.org/S77200987","display_name":"SIAM Journal on Applied Mathematics","issn_l":"0036-1399","issn":["0036-1399","1095-712X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320508","host_organization_name":"Society for Industrial and Applied Mathematics","host_organization_lineage":["https://openalex.org/P4310320508"],"host_organization_lineage_names":["Society for Industrial and Applied Mathematics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SIAM Journal on Applied Mathematics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062312270","display_name":"Youjun Deng","orcid":"https://orcid.org/0000-0001-8508-4773"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Youjun Deng","raw_affiliation_strings":["School of Mathematics and Statistics, HNP-LAMA, Central South University, Changsha, Hunan, 410017, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mathematics and Statistics, HNP-LAMA, Central South University, Changsha, Hunan, 410017, People\u2019s Republic of China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025082141","display_name":"Hongyu Liu","orcid":"https://orcid.org/0000-0002-2930-3510"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Hongyu Liu","raw_affiliation_strings":["Department of Mathematics, City University of Hong Kong, Kowloon Tong, Hong Kong SAR"],"raw_orcid":"https://orcid.org/0000-0002-2930-3510","affiliations":[{"raw_affiliation_string":"Department of Mathematics, City University of Hong Kong, Kowloon Tong, Hong Kong SAR","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101390340","display_name":"Yajuan Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yajuan Wang","raw_affiliation_strings":["School of Mathematics and Statistics, HNP-LAMA, Central South University, Changsha, Hunan, 410017, People\u2019s Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mathematics and Statistics, HNP-LAMA, Central South University, Changsha, Hunan, 410017, People\u2019s Republic of China","institution_ids":["https://openalex.org/I139660479"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5062312270"],"corresponding_institution_ids":["https://openalex.org/I139660479"],"apc_list":null,"apc_paid":null,"fwci":0.6009,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.6659957,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"84","issue":"4","first_page":"1362","last_page":"1384"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.45434141159057617},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3957664370536804},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3889940083026886},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.2686057686805725},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.21414875984191895}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.45434141159057617},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3957664370536804},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3889940083026886},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.2686057686805725},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.21414875984191895}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1137/23m1599458","is_oa":false,"landing_page_url":"https://doi.org/10.1137/23m1599458","pdf_url":null,"source":{"id":"https://openalex.org/S77200987","display_name":"SIAM Journal on Applied Mathematics","issn_l":"0036-1399","issn":["0036-1399","1095-712X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320508","host_organization_name":"Society for Industrial and Applied Mathematics","host_organization_lineage":["https://openalex.org/P4310320508"],"host_organization_lineage_names":["Society for Industrial and Applied Mathematics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SIAM Journal on Applied Mathematics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[{"id":"https://openalex.org/G1381424164","display_name":null,"funder_award_id":"11311122","funder_id":"https://openalex.org/F4320321592","funder_display_name":"Research Grants Council, University Grants Committee"},{"id":"https://openalex.org/G4280680118","display_name":null,"funder_award_id":"11971487","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6627247979","display_name":null,"funder_award_id":"11300821","funder_id":"https://openalex.org/F4320321592","funder_display_name":"Research Grants Council, University Grants Committee"},{"id":"https://openalex.org/G7330637839","display_name":null,"funder_award_id":"12301420","funder_id":"https://openalex.org/F4320321592","funder_display_name":"Research Grants Council, University Grants Committee"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321592","display_name":"Research Grants Council, University Grants Committee","ror":"https://ror.org/00djwmt25"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":45,"referenced_works":["https://openalex.org/W1728029979","https://openalex.org/W1944681707","https://openalex.org/W1966712815","https://openalex.org/W1970305995","https://openalex.org/W1994656261","https://openalex.org/W2003369666","https://openalex.org/W2005681075","https://openalex.org/W2018207223","https://openalex.org/W2021662804","https://openalex.org/W2023074414","https://openalex.org/W2027008808","https://openalex.org/W2028152868","https://openalex.org/W2049176462","https://openalex.org/W2052396592","https://openalex.org/W2053305303","https://openalex.org/W2053869448","https://openalex.org/W2059195581","https://openalex.org/W2065585720","https://openalex.org/W2070533846","https://openalex.org/W2080816062","https://openalex.org/W2082949320","https://openalex.org/W2086646840","https://openalex.org/W2093892008","https://openalex.org/W2134391795","https://openalex.org/W2142692584","https://openalex.org/W2434575905","https://openalex.org/W2792418855","https://openalex.org/W2795102297","https://openalex.org/W2911513639","https://openalex.org/W2924563423","https://openalex.org/W2950817339","https://openalex.org/W2962819179","https://openalex.org/W3036079693","https://openalex.org/W3036447239","https://openalex.org/W3043611433","https://openalex.org/W3046104424","https://openalex.org/W3098597979","https://openalex.org/W3101838484","https://openalex.org/W3102689695","https://openalex.org/W3105765086","https://openalex.org/W3123771376","https://openalex.org/W4229864936","https://openalex.org/W4239854018","https://openalex.org/W4384497828","https://openalex.org/W4389109994"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-26T23:08:49.675405","created_date":"2025-10-10T00:00:00"}