{"id":"https://openalex.org/W2005139021","doi":"https://doi.org/10.1137/08071925x","title":"A Nondestructive Evaluation Method for Concrete Voids: Frequency Differential Electrical Impedance Scanning","display_name":"A Nondestructive Evaluation Method for Concrete Voids: Frequency Differential Electrical Impedance Scanning","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W2005139021","doi":"https://doi.org/10.1137/08071925x","mag":"2005139021"},"language":"en","primary_location":{"id":"doi:10.1137/08071925x","is_oa":false,"landing_page_url":"https://doi.org/10.1137/08071925x","pdf_url":null,"source":{"id":"https://openalex.org/S77200987","display_name":"SIAM Journal on Applied Mathematics","issn_l":"0036-1399","issn":["0036-1399","1095-712X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320508","host_organization_name":"Society for Industrial and Applied Mathematics","host_organization_lineage":["https://openalex.org/P4310320508"],"host_organization_lineage_names":["Society for Industrial and Applied Mathematics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SIAM Journal on Applied Mathematics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Sungwhan Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I145808223","display_name":"Hanbat National University","ror":"https://ror.org/00x514t95","country_code":"KR","type":"education","lineage":["https://openalex.org/I145808223"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungwhan Kim","raw_affiliation_strings":["Hanbat National Univ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hanbat National Univ","institution_ids":["https://openalex.org/I145808223"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034037522","display_name":"Jin Keun Seo","orcid":"https://orcid.org/0000-0002-6275-4938"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jin Keun Seo","raw_affiliation_strings":["Department of Computational Science and Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computational Science and Engineering","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101901635","display_name":"Taeyoung Ha","orcid":"https://orcid.org/0000-0002-9440-1918"},"institutions":[{"id":"https://openalex.org/I4210158432","display_name":"National Institute for Mathematical Sciences","ror":"https://ror.org/04n7py080","country_code":"KR","type":"education","lineage":["https://openalex.org/I4210158432"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taeyoung Ha","raw_affiliation_strings":["National Institute for Mathematical Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute for Mathematical Sciences","institution_ids":["https://openalex.org/I4210158432"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5013,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.8282171,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"69","issue":"6","first_page":"1759","last_page":"1771"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/omega","display_name":"Omega","score":0.6675082445144653},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.6482861042022705},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5674207806587219},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.48641300201416016},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.45288681983947754},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.439815491437912},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3611299693584442},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.35404542088508606},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.34418100118637085},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.12297391891479492}],"concepts":[{"id":"https://openalex.org/C2779557605","wikidata":"https://www.wikidata.org/wiki/Q9890","display_name":"Omega","level":2,"score":0.6675082445144653},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.6482861042022705},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5674207806587219},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.48641300201416016},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.45288681983947754},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.439815491437912},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3611299693584442},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.35404542088508606},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.34418100118637085},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.12297391891479492},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1137/08071925x","is_oa":false,"landing_page_url":"https://doi.org/10.1137/08071925x","pdf_url":null,"source":{"id":"https://openalex.org/S77200987","display_name":"SIAM Journal on Applied Mathematics","issn_l":"0036-1399","issn":["0036-1399","1095-712X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320508","host_organization_name":"Society for Industrial and Applied Mathematics","host_organization_lineage":["https://openalex.org/P4310320508"],"host_organization_lineage_names":["Society for Industrial and Applied Mathematics"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SIAM Journal on Applied Mathematics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7200000286102295,"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1971508657","https://openalex.org/W1979581003","https://openalex.org/W1982327657","https://openalex.org/W1988789558","https://openalex.org/W2005681075","https://openalex.org/W2037534392","https://openalex.org/W2052396592","https://openalex.org/W2118817968","https://openalex.org/W2164659024","https://openalex.org/W2285357770","https://openalex.org/W2461803646","https://openalex.org/W2537195613"],"related_works":["https://openalex.org/W238609530","https://openalex.org/W2734192830","https://openalex.org/W3016395638","https://openalex.org/W1636163329","https://openalex.org/W4292947165","https://openalex.org/W3045121788","https://openalex.org/W3201655533","https://openalex.org/W3134442314","https://openalex.org/W2281248943","https://openalex.org/W3102538728"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,52,67,72,76],"new":[4],"nondestructive":[5,34],"evaluation":[6],"method":[7,142],"for":[8,129],"detecting":[9],"cracks,":[10],"voids,":[11],"and":[12,75,124],"other":[13],"hidden":[14],"defects":[15],"inside":[16],"concrete":[17,63],"structures,":[18],"called":[19],"\u201cfrequency":[20],"differential":[21],"electrical":[22,55],"impedance":[23],"scanning":[24],"(fdEIS).\u201d":[25],"The":[26],"primary":[27],"benefit":[28],"of":[29,45,54,85,96,119,133,140],"fdEIS":[30,115],"over":[31],"the":[32,43,46,61,86,89,93,104,111,117,120,131,134,138],"conventional":[33],"methods":[35],"is":[36,39],"that":[37],"it":[38],"possible":[40],"to":[41,103,122],"determine":[42],"thickness":[44,118,132],"voids.":[47,135],"In":[48],"fdEIS,":[49],"we":[50,91],"inject":[51],"sequence":[53],"currents":[56,98],"with":[57,101],"various":[58],"frequencies":[59],"through":[60],"tested":[62],"wall":[64],"by":[65],"applying":[66],"sinusoidal":[68],"voltage":[69],"difference":[70],"between":[71],"surface":[73],"electrode":[74],"scan":[77],"probe,":[78,90],"which":[79],"are":[80],"placed":[81],"on":[82],"opposite":[83],"surfaces":[84],"wall.":[87],"Through":[88],"measure":[92],"derivative":[94],"$\\frac{d}{d\\omega}g_{\\omega}$":[95,123],"exit":[97],"(Neumann":[99],"data)":[100],"respect":[102],"angular":[105],"frequency":[106],"variable":[107],"$\\omega$.":[108],"We":[109,136],"find":[110],"fundamental":[112],"concept":[113],"in":[114,143],"relating":[116],"voids":[121],"derive":[125],"an":[126],"approximation":[127],"formula":[128],"estimating":[130],"demonstrate":[137],"performance":[139],"our":[141],"numerical":[144],"simulations.":[145]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}