{"id":"https://openalex.org/W2032530643","doi":"https://doi.org/10.1117/12.2036614","title":"Analysis of aberrations and pixel information in goniometric multispectral imaging","display_name":"Analysis of aberrations and pixel information in goniometric multispectral imaging","publication_year":2014,"publication_date":"2014-02-24","ids":{"openalex":"https://openalex.org/W2032530643","doi":"https://doi.org/10.1117/12.2036614","mag":"2032530643"},"language":"en","primary_location":{"id":"doi:10.1117/12.2036614","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2036614","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045393131","display_name":"Julie Klein","orcid":"https://orcid.org/0000-0002-3279-0559"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Julie Klein","raw_affiliation_strings":["RWTH Aachen Univ. (Germany)","RWTH-Aachen Univ. (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RWTH Aachen Univ. (Germany)","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"RWTH-Aachen Univ. (Germany)","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077813674","display_name":"Georg Schm\u00fccking","orcid":null},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Georg Schm\u00fccking","raw_affiliation_strings":["RWTH Aachen Univ. (Germany)","RWTH-Aachen Univ. (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RWTH Aachen Univ. (Germany)","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"RWTH-Aachen Univ. (Germany)","institution_ids":["https://openalex.org/I887968799"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I887968799"],"apc_list":null,"apc_paid":null,"fwci":0.1798,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.43581128,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"9018","issue":null,"first_page":"901806","last_page":"901806"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9840999841690063,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/goniometer","display_name":"Goniometer","score":0.9038322567939758},{"id":"https://openalex.org/keywords/multispectral-image","display_name":"Multispectral image","score":0.7596832513809204},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.7318386435508728},{"id":"https://openalex.org/keywords/bidirectional-reflectance-distribution-function","display_name":"Bidirectional reflectance distribution function","score":0.6392266154289246},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5526860952377319},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5260493755340576},{"id":"https://openalex.org/keywords/band-pass-filter","display_name":"Band-pass filter","score":0.4588308036327362},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4141082465648651},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.39362195134162903},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3538574278354645},{"id":"https://openalex.org/keywords/reflectivity","display_name":"Reflectivity","score":0.17938461899757385}],"concepts":[{"id":"https://openalex.org/C48806519","wikidata":"https://www.wikidata.org/wiki/Q1126161","display_name":"Goniometer","level":2,"score":0.9038322567939758},{"id":"https://openalex.org/C173163844","wikidata":"https://www.wikidata.org/wiki/Q1761440","display_name":"Multispectral image","level":2,"score":0.7596832513809204},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7318386435508728},{"id":"https://openalex.org/C151596937","wikidata":"https://www.wikidata.org/wiki/Q856980","display_name":"Bidirectional reflectance distribution function","level":3,"score":0.6392266154289246},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5526860952377319},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5260493755340576},{"id":"https://openalex.org/C147788027","wikidata":"https://www.wikidata.org/wiki/Q2718101","display_name":"Band-pass filter","level":2,"score":0.4588308036327362},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4141082465648651},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.39362195134162903},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3538574278354645},{"id":"https://openalex.org/C108597893","wikidata":"https://www.wikidata.org/wiki/Q663650","display_name":"Reflectivity","level":2,"score":0.17938461899757385}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1117/12.2036614","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2036614","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},{"id":"pmh:oai:publications.rwth-aachen.de:443363","is_oa":false,"landing_page_url":"https://publications.rwth-aachen.de/record/443363","pdf_url":null,"source":{"id":"https://openalex.org/S4306401362","display_name":"RWTH Publications (RWTH Aachen)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I887968799","host_organization_name":"RWTH Aachen University","host_organization_lineage":["https://openalex.org/I887968799"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Measuring, modeling, and reproducing material appearance : 3 - 4 February 2014, San Francisco, California, United States ; proceedings ; [part of] IS&T/SPIE electronic imaging, science and technology / sponsored by IS&T, the Society for Imaging Science and Technology; SPIE. Maria V. Ortiz Segovia ..., ed.<br/>Measuring, modeling, and reproducing material appearance, SPIE, San Francisco, CA, USA, 2014-02-03 - 2014-02-04","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1553349062","https://openalex.org/W1785673068","https://openalex.org/W1971846824","https://openalex.org/W1999033652","https://openalex.org/W2071504269","https://openalex.org/W2132779142","https://openalex.org/W2162531102","https://openalex.org/W2395528954","https://openalex.org/W2400858713","https://openalex.org/W2403042261","https://openalex.org/W2404700091","https://openalex.org/W4250680754","https://openalex.org/W4377837452","https://openalex.org/W6638108019","https://openalex.org/W6650251261","https://openalex.org/W6697632287","https://openalex.org/W6712217526","https://openalex.org/W6712997088","https://openalex.org/W6713518416","https://openalex.org/W6853311651","https://openalex.org/W6980833020","https://openalex.org/W6981069465"],"related_works":["https://openalex.org/W1996671438","https://openalex.org/W2063805703","https://openalex.org/W2611841783","https://openalex.org/W4382897192","https://openalex.org/W2158803563","https://openalex.org/W2114397205","https://openalex.org/W3200530415","https://openalex.org/W2183932634","https://openalex.org/W2134321642","https://openalex.org/W1563669765"],"abstract_inverted_index":{"In":[0],"goniometric":[1,86,133],"measurements,":[2],"the":[3,33,37,40,51,54,74,81,93,97,101,105,129,144,148,162,168],"acquisition":[4],"of":[5,32,57,114,121,132,141,147],"a":[6,30,111],"material":[7,34],"under":[8],"different":[9,139],"viewing":[10,106],"and":[11,125],"illumination":[12],"angles":[13,107,136],"gives":[14],"access":[15],"to":[16,72,110,161],"its":[17],"bidirectional":[18,41],"reflectance":[19],"distribution":[20],"function":[21,43],"(BRDF).":[22],"If":[23],"information":[24,59,102,166],"is":[25,69],"acquired":[26,58,123],"not":[27],"only":[28],"from":[29,36,103],"point":[31],"but":[35],"whole":[38,130],"object,":[39],"texture":[42],"(BTF)":[44],"can":[45,60,108,156],"even":[46],"be":[47],"measured.":[48],"Depending":[49],"on":[50],"camera":[52,64,145],"utilized,":[53],"color":[55],"accuracy":[56],"vary.":[61],"A":[62],"multispectral":[63,87],"with":[65],"19":[66],"bandpass":[67,94],"channels":[68],"utilized":[70],"here":[71],"sample":[73],"visible":[75],"wavelength":[76],"range.":[77],"We":[78,117,151],"first":[79],"measure":[80],"transversal":[82],"aberrations":[83,160],"appearing":[84],"in":[85,96,143],"imaging.":[88],"They":[89],"are":[90],"caused":[91],"by":[92],"filters":[95],"ray":[98],"path.":[99],"Utilizing":[100],"all":[104],"lead":[109],"better":[112],"correction":[113,120,127],"these":[115,153],"aberrations.":[116],"compare":[118],"separate":[119],"each":[122],"image":[124,142,149],"global":[126],"over":[128],"set":[131],"images.":[134],"Furthermore,":[135],"vary":[137],"for":[138],"points":[140],"because":[146],"optics.":[150],"analyze":[152],"variations":[154],"which":[155],"either":[157],"bring":[158],"additional":[159,165],"measurement":[163],"or":[164],"about":[167],"measured":[169],"material.":[170]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-08-01T09:00:35.917206","created_date":"2025-10-10T00:00:00"}