{"id":"https://openalex.org/W1991011518","doi":"https://doi.org/10.1117/12.765649","title":"An optimum design of the LOFIC CMOS image sensor for high sensitivity, low noise, and high full well capacity","display_name":"An optimum design of the LOFIC CMOS image sensor for high sensitivity, low noise, and high full well capacity","publication_year":2008,"publication_date":"2008-02-14","ids":{"openalex":"https://openalex.org/W1991011518","doi":"https://doi.org/10.1117/12.765649","mag":"1991011518"},"language":"en","primary_location":{"id":"doi:10.1117/12.765649","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.765649","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072642366","display_name":"Nana Akahane","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Nana Akahane","raw_affiliation_strings":["Tohoku Univ. (Japan)","Tohoku University, Japan"],"affiliations":[{"raw_affiliation_string":"Tohoku Univ. (Japan)","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Tohoku University, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100689739","display_name":"Woonghee Lee","orcid":"https://orcid.org/0000-0003-0856-6415"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Woonghee Lee","raw_affiliation_strings":["Tohoku Univ. (Japan)","Tohoku University, Japan"],"affiliations":[{"raw_affiliation_string":"Tohoku Univ. (Japan)","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Tohoku University, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110456758","display_name":"Shigetoshi Sugawa","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shigetoshi Sugawa","raw_affiliation_strings":["Tohoku Univ. (Japan)","Tohoku University, Japan"],"affiliations":[{"raw_affiliation_string":"Tohoku Univ. (Japan)","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"Tohoku University, Japan","institution_ids":["https://openalex.org/I201537933"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5072642366"],"corresponding_institution_ids":["https://openalex.org/I201537933"],"apc_list":null,"apc_paid":null,"fwci":0.3329,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.61462205,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"6817","issue":null,"first_page":"681702","last_page":"681702"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9836999773979187,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9485999941825867,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6937060356140137},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6611823439598083},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.6549425721168518},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6417519450187683},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5823395848274231},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5818141102790833},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.547653317451477},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5378265976905823},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4829256236553192},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.47104454040527344},{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"Low-noise amplifier","score":0.46491581201553345},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.4601143002510071},{"id":"https://openalex.org/keywords/image-noise","display_name":"Image noise","score":0.44911301136016846},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.44354182481765747},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.4380737543106079},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3946570158004761},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38003113865852356},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3071049153804779},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.21708491444587708},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.18059414625167847},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14256161451339722},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12372219562530518}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6937060356140137},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6611823439598083},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.6549425721168518},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6417519450187683},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5823395848274231},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5818141102790833},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.547653317451477},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5378265976905823},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4829256236553192},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.47104454040527344},{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.46491581201553345},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.4601143002510071},{"id":"https://openalex.org/C35772409","wikidata":"https://www.wikidata.org/wiki/Q1323086","display_name":"Image noise","level":3,"score":0.44911301136016846},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44354182481765747},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.4380737543106079},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3946570158004761},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38003113865852356},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3071049153804779},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.21708491444587708},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.18059414625167847},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14256161451339722},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12372219562530518},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.765649","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.765649","pdf_url":null,"source":{"id":"https://openalex.org/S183492911","display_name":"Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE","issn_l":"0277-786X","issn":["0277-786X","1996-756X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SPIE Proceedings","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8299999833106995,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4385733096","https://openalex.org/W2160828022","https://openalex.org/W2093540298","https://openalex.org/W1966119149","https://openalex.org/W2129163123","https://openalex.org/W2562583481","https://openalex.org/W7077903","https://openalex.org/W1966415111","https://openalex.org/W2094128133","https://openalex.org/W2136888551"],"abstract_inverted_index":{"It":[0,104],"is":[1,105,162],"indispensable":[2],"for":[3,125,152],"high":[4,12,16,101,135,153,158],"quality":[5,136],"image":[6,26,60,137,150,175],"sensors":[7],"to":[8,132],"have":[9,52],"performances":[10,39],"of":[11,41,56,66,70,146],"sensitivity,":[13,154],"low":[14,95,155],"noise,":[15],"full":[17,118,159],"well":[18,102,119,160],"capacity":[19,120,161],"and":[20,62,100,116,129,157,167],"good":[21,98],"linear":[22],"response.":[23],"The":[24],"CMOS":[25,59,149,174],"sensor":[27,61,151],"with":[28],"the":[29,54,57,64,82,87,108,111,114,117,122,126,130,142,147,171],"lateral":[30],"overflow":[31],"integration":[32],"capacitor":[33],"(LOFIC)":[34],"has":[35],"been":[36],"accomplishing":[37],"these":[38],"because":[40],"its":[42],"wide":[43],"dynamic":[44],"range":[45],"capability":[46],"in":[47,91],"one":[48],"exposure.":[49],"Recently,":[50],"we":[51],"improved":[53],"SNR":[55,115],"LOFIC":[58,131,148,173],"achieved":[63],"number":[65],"input-referred":[67],"noise":[68,156],"electrons":[69],"2":[71],"e-":[72],"or":[73],"below":[74],"without":[75],"any":[76],"column":[77],"amplifier":[78],"circuits":[79],"by":[80,169],"increasing":[81],"photo-electric":[83],"conversion":[84,112],"gain":[85],"at":[86],"floating":[88],"diffusion":[89],"(FD)":[90],"pixel":[92],"as":[93],"keeping":[94],"dark":[96],"current,":[97],"uniformity":[99],"capacity.":[103],"clear":[106],"that":[107],"relation":[109],"among":[110],"gain,":[113],"decides":[121],"optimum":[123,143],"design":[124,144],"FD":[127],"capacitance":[128],"realize":[133],"a":[134],"sensor.":[138,176],"In":[139],"this":[140],"paper,":[141],"method":[145],"discussed":[163],"through":[164],"theoretical":[165],"analysis":[166],"experiments":[168],"using":[170],"fabricated":[172]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}