{"id":"https://openalex.org/W4220968717","doi":"https://doi.org/10.1117/12.2623140","title":"Image-based damage detection on TiN-coated milling tools by using a multi-light scattering illumination technique","display_name":"Image-based damage detection on TiN-coated milling tools by using a multi-light scattering illumination technique","publication_year":2022,"publication_date":"2022-03-04","ids":{"openalex":"https://openalex.org/W4220968717","doi":"https://doi.org/10.1117/12.2623140"},"language":"en","primary_location":{"id":"doi:10.1117/12.2623140","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2623140","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourteenth International Conference on Machine Vision (ICMV 2021)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052553493","display_name":"Muehenad Bilal","orcid":null},"institutions":[{"id":"https://openalex.org/I4210106192","display_name":"Technische Hochschule Ingolstadt","ror":"https://ror.org/02bxzcy64","country_code":"DE","type":"education","lineage":["https://openalex.org/I4210106192"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Muehenad Bilal","raw_affiliation_strings":["Technische Hochschule Ingolstadt (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Hochschule Ingolstadt (Germany)","institution_ids":["https://openalex.org/I4210106192"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060516028","display_name":"Sunil Kancharana","orcid":"https://orcid.org/0000-0002-0718-6480"},"institutions":[{"id":"https://openalex.org/I4210106192","display_name":"Technische Hochschule Ingolstadt","ror":"https://ror.org/02bxzcy64","country_code":"DE","type":"education","lineage":["https://openalex.org/I4210106192"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sunil Kancharana","raw_affiliation_strings":["Technische Hochschule Ingolstadt (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Hochschule Ingolstadt (Germany)","institution_ids":["https://openalex.org/I4210106192"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053886596","display_name":"Christian Mayer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210106192","display_name":"Technische Hochschule Ingolstadt","ror":"https://ror.org/02bxzcy64","country_code":"DE","type":"education","lineage":["https://openalex.org/I4210106192"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christian Mayer","raw_affiliation_strings":["Technische Hochschule Ingolstadt (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Hochschule Ingolstadt (Germany)","institution_ids":["https://openalex.org/I4210106192"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031665867","display_name":"Markus Bregulla","orcid":null},"institutions":[{"id":"https://openalex.org/I4210106192","display_name":"Technische Hochschule Ingolstadt","ror":"https://ror.org/02bxzcy64","country_code":"DE","type":"education","lineage":["https://openalex.org/I4210106192"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Markus Bregulla","raw_affiliation_strings":["Technische Hochschule Ingolstadt  (Germany)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technische Hochschule Ingolstadt  (Germany)","institution_ids":["https://openalex.org/I4210106192"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052066397","display_name":"Adam Zi\u0119bi\u0144ski","orcid":"https://orcid.org/0000-0003-4554-6667"},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Adam Zi\u0119bi\u0144ski","raw_affiliation_strings":["Silesian Univ. of Technology (Poland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Silesian Univ. of Technology (Poland)","institution_ids":["https://openalex.org/I119004910"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033250616","display_name":"Rafa\u0142 Cupek","orcid":"https://orcid.org/0000-0001-8479-5725"},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Rafal Cupek","raw_affiliation_strings":["Silesian Univ. of Technology (Poland)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Silesian Univ. of Technology (Poland)","institution_ids":["https://openalex.org/I119004910"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.243,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.74627188,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"31","last_page":"31"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.571765661239624},{"id":"https://openalex.org/keywords/machining","display_name":"Machining","score":0.5309752225875854},{"id":"https://openalex.org/keywords/microscope","display_name":"Microscope","score":0.5200769305229187},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5171022415161133},{"id":"https://openalex.org/keywords/object-detection","display_name":"Object detection","score":0.46363064646720886},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4630216956138611},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.462529718875885},{"id":"https://openalex.org/keywords/optical-microscope","display_name":"Optical microscope","score":0.4618953466415405},{"id":"https://openalex.org/keywords/light-emitting-diode","display_name":"Light-emitting diode","score":0.4399489462375641},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.435009241104126},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.418521910905838},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.41463494300842285},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.20960506796836853},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.14348360896110535},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09439939260482788}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.571765661239624},{"id":"https://openalex.org/C523214423","wikidata":"https://www.wikidata.org/wiki/Q192047","display_name":"Machining","level":2,"score":0.5309752225875854},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.5200769305229187},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5171022415161133},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.46363064646720886},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4630216956138611},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.462529718875885},{"id":"https://openalex.org/C77017923","wikidata":"https://www.wikidata.org/wiki/Q912313","display_name":"Optical microscope","level":3,"score":0.4618953466415405},{"id":"https://openalex.org/C176666156","wikidata":"https://www.wikidata.org/wiki/Q25504","display_name":"Light-emitting diode","level":2,"score":0.4399489462375641},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.435009241104126},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.418521910905838},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.41463494300842285},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.20960506796836853},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.14348360896110535},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09439939260482788},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.2623140","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2623140","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourteenth International Conference on Machine Vision (ICMV 2021)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W1691183209","https://openalex.org/W1971874375","https://openalex.org/W1978158985","https://openalex.org/W1996231862","https://openalex.org/W1996972963","https://openalex.org/W2005178400","https://openalex.org/W2008493776","https://openalex.org/W2010717817","https://openalex.org/W2010724418","https://openalex.org/W2015690091","https://openalex.org/W2019099219","https://openalex.org/W2030708008","https://openalex.org/W2033849769","https://openalex.org/W2055779998","https://openalex.org/W2081768791","https://openalex.org/W2096263163","https://openalex.org/W2136704614","https://openalex.org/W2193325189","https://openalex.org/W2464400784","https://openalex.org/W2530177326","https://openalex.org/W2906533924","https://openalex.org/W2971100236","https://openalex.org/W2988017727","https://openalex.org/W3019407890","https://openalex.org/W3022965296","https://openalex.org/W3023179825","https://openalex.org/W3043110707","https://openalex.org/W3075483974","https://openalex.org/W3092012490","https://openalex.org/W3100816363","https://openalex.org/W3172123626","https://openalex.org/W4205496101","https://openalex.org/W4206659779","https://openalex.org/W4231295697","https://openalex.org/W4250614472","https://openalex.org/W4251400302","https://openalex.org/W4255225121","https://openalex.org/W4298364376","https://openalex.org/W6644898014","https://openalex.org/W6674204615","https://openalex.org/W6797085182","https://openalex.org/W7027716524"],"related_works":["https://openalex.org/W4386106354","https://openalex.org/W2080823790","https://openalex.org/W2517391003","https://openalex.org/W2385625896","https://openalex.org/W119975033","https://openalex.org/W2006802527","https://openalex.org/W1532628279","https://openalex.org/W2008350978","https://openalex.org/W2607350649","https://openalex.org/W2201509369"],"abstract_inverted_index":{"It":[0],"is":[1,58,91,147,205,216,236,265,269],"crucial":[2],"for":[3,40,51,227],"early":[4],"detection":[5,57,82,134,198,246,253],"of":[6,38,48,66,109,135,208],"damage":[7,56,72,81,118,133,197,228,245,252],"or":[8,31],"wears":[9],"on":[10,17,83,254],"tools,":[11],"to":[12,99,176,181,223,242,278],"perform":[13],"any":[14],"manufacturing":[15],"operation":[16],"a":[18,41,46,77,106,121,151,159,219,260,275,279],"work-piece":[19],"with":[20,63,164,185,238],"good":[21,188],"quality":[22],"and":[23,70,95,116,190,273],"precision.":[24],"If":[25],"tool":[26,86],"cutting":[27],"edges":[28],"are":[29,74],"worn":[30],"damaged,":[32],"they":[33],"can":[34,291],"be":[35],"reground":[36,75],"instead":[37],"opting":[39],"new":[42,152],"tool.":[43],"This":[44,267],"saves":[45],"lot":[47],"machining":[49],"costs":[50],"the":[52,55,64,71,113,202,206,231,233,239,244,283,287,294],"company.":[53],"Traditionally":[54],"done":[59,148],"by":[60,112,149,258],"manual":[61],"inspection":[62],"help":[65],"an":[67,88,212],"optical":[68,89,136,213],"microscope":[69,90],"locations":[73],"using":[76,87,150,259],"CNC":[78],"machine.":[79],"However,":[80],"coated":[84,144],"milling":[85,145],"time":[92],"taking":[93],"process":[94],"quite":[96],"challenging":[97],"due":[98],"factors":[100],"such":[101,139],"as":[102,140],"non-homogeneous":[103],"illumination":[104,156,221,263],"intensity,":[105],"huge":[107],"amount":[108],"reflections":[110],"captured":[111],"camera":[114],"system,":[115,286],"different":[117],"formations.":[119],"Therefore,":[120],"novel":[122],"approach":[123,241],"has":[124],"been":[125],"proposed":[126,234,284],"in":[127,195,218],"this":[128,249],"paper":[129,268],"where":[130,158,211],"automatic":[131],"image-based":[132],"critical":[137,214],"components":[138],"TiN":[141],"(Titanium":[142],"Nitride)":[143],"tools":[146,257],"lighting":[153],"source.":[154],"The":[155],"source":[157,222],"Cylindrical":[160],"Shaped":[161],"Enclosure":[162],"(CSE)":[163],"14":[165],"multi-spectral":[166],"Light":[167],"Emitting":[168],"Diodes":[169],"(LED)":[170],"distributed":[171],"uniformly":[172],"around":[173],"its":[174,209],"circumference":[175],"enhance":[177],"multi-light":[178,261],"scattering":[179,262],"allows":[180],"capture":[182,224],"high-quality":[183,225],"images":[184,226],"high":[186],"resolution,":[187],"contrast,":[189],"low":[191],"noise":[192],"which":[193],"helps":[194],"improving":[196],"tasks.":[199],"To":[200],"date,":[201],"current":[203],"work":[204,272],"first":[207],"kind,":[210],"object":[215],"inserted":[217],"cylindrical-shaped":[220],"detection.":[229],"In":[230,248],"end,":[232],"method":[235],"compared":[237],"traditional":[240],"compare":[243],"capability.":[247],"paper,":[250],"Image-based":[251],"TiN-coated":[255],"Milling":[256],"technique":[264],"proposed.":[266],"experimentally":[270],"oriented":[271],"presents":[274],"practical":[276],"solution":[277],"given":[280],"problem.":[281],"With":[282],"lightning":[285],"image":[288],"processing":[289],"algorithm":[290],"better":[292],"localize":[293],"damage.":[295]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}