{"id":"https://openalex.org/W3119439637","doi":"https://doi.org/10.1117/12.2587441","title":"Modelling the point source function for collimators employed in radio guided surgery and SPECT","display_name":"Modelling the point source function for collimators employed in radio guided surgery and SPECT","publication_year":2021,"publication_date":"2021-01-04","ids":{"openalex":"https://openalex.org/W3119439637","doi":"https://doi.org/10.1117/12.2587441","mag":"3119439637"},"language":"en","primary_location":{"id":"doi:10.1117/12.2587441","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2587441","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thirteenth International Conference on Machine Vision","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026100485","display_name":"Yana Shabelnikova","orcid":"https://orcid.org/0000-0002-9087-0901"},"institutions":[{"id":"https://openalex.org/I4210141450","display_name":"Institute of Microelectronics Technology and High Purity Materials","ror":"https://ror.org/034fqtg16","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210097085","https://openalex.org/I4210141450"]}],"countries":["RU"],"is_corresponding":true,"raw_author_name":"Yana Shabelnikova","raw_affiliation_strings":["Institute of Microelectronics Technology and High-Purity Materials RAS (Russian Federation)"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics Technology and High-Purity Materials RAS (Russian Federation)","institution_ids":["https://openalex.org/I4210141450"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080112580","display_name":"S. I. Zaitsev","orcid":"https://orcid.org/0000-0001-5120-8651"},"institutions":[{"id":"https://openalex.org/I4210141450","display_name":"Institute of Microelectronics Technology and High Purity Materials","ror":"https://ror.org/034fqtg16","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210097085","https://openalex.org/I4210141450"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Sergey i. Zaitsev","raw_affiliation_strings":["Institute of Microelectronics Technology and High-Purity Materials RAS (Russian Federation)"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics Technology and High-Purity Materials RAS (Russian Federation)","institution_ids":["https://openalex.org/I4210141450"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5098395037","display_name":"Vasiliy Obolenskiy","orcid":null},"institutions":[{"id":"https://openalex.org/I19880235","display_name":"Lomonosov Moscow State University","ror":"https://ror.org/010pmpe69","country_code":"RU","type":"education","lineage":["https://openalex.org/I19880235"]},{"id":"https://openalex.org/I4210141450","display_name":"Institute of Microelectronics Technology and High Purity Materials","ror":"https://ror.org/034fqtg16","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210097085","https://openalex.org/I4210141450"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Vasiliy Obolenskiy","raw_affiliation_strings":["Institute of Microelectronics Technology and High-Purity Materials RAS (Russian Federation)","Moscow State Univ. (Russian Federation)"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics Technology and High-Purity Materials RAS (Russian Federation)","institution_ids":["https://openalex.org/I4210141450"]},{"raw_affiliation_string":"Moscow State Univ. (Russian Federation)","institution_ids":["https://openalex.org/I19880235"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5026100485"],"corresponding_institution_ids":["https://openalex.org/I4210141450"],"apc_list":null,"apc_paid":null,"fwci":0.1375,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.43942266,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"60","last_page":"60"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},"topics":[{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10358","display_name":"Advanced Radiotherapy Techniques","score":0.9901000261306763,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/collimator","display_name":"Collimator","score":0.951237142086029},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.6271333694458008},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.626510500907898},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.602451741695404},{"id":"https://openalex.org/keywords/point-source","display_name":"Point source","score":0.5960802435874939},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.489795446395874},{"id":"https://openalex.org/keywords/imaging-phantom","display_name":"Imaging phantom","score":0.48406949639320374},{"id":"https://openalex.org/keywords/point-spread-function","display_name":"Point spread function","score":0.4724312722682953},{"id":"https://openalex.org/keywords/gamma-camera","display_name":"Gamma camera","score":0.4689844250679016},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.46366173028945923},{"id":"https://openalex.org/keywords/absorption","display_name":"Absorption (acoustics)","score":0.4505577087402344},{"id":"https://openalex.org/keywords/optical-transfer-function","display_name":"Optical transfer function","score":0.4322560131549835},{"id":"https://openalex.org/keywords/correction-for-attenuation","display_name":"Correction for attenuation","score":0.42096126079559326},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3751199543476105},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.21589508652687073},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14852800965309143},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12497025728225708},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.10211601853370667}],"concepts":[{"id":"https://openalex.org/C2779200277","wikidata":"https://www.wikidata.org/wiki/Q1164658","display_name":"Collimator","level":2,"score":0.951237142086029},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.6271333694458008},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.626510500907898},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.602451741695404},{"id":"https://openalex.org/C103783831","wikidata":"https://www.wikidata.org/wiki/Q2552709","display_name":"Point source","level":2,"score":0.5960802435874939},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.489795446395874},{"id":"https://openalex.org/C104293457","wikidata":"https://www.wikidata.org/wiki/Q28324852","display_name":"Imaging phantom","level":2,"score":0.48406949639320374},{"id":"https://openalex.org/C69179731","wikidata":"https://www.wikidata.org/wiki/Q510427","display_name":"Point spread function","level":2,"score":0.4724312722682953},{"id":"https://openalex.org/C2779610220","wikidata":"https://www.wikidata.org/wiki/Q612082","display_name":"Gamma camera","level":2,"score":0.4689844250679016},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.46366173028945923},{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.4505577087402344},{"id":"https://openalex.org/C175231954","wikidata":"https://www.wikidata.org/wiki/Q1942321","display_name":"Optical transfer function","level":2,"score":0.4322560131549835},{"id":"https://openalex.org/C123688308","wikidata":"https://www.wikidata.org/wiki/Q7309537","display_name":"Correction for attenuation","level":3,"score":0.42096126079559326},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3751199543476105},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.21589508652687073},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14852800965309143},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12497025728225708},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.10211601853370667}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.2587441","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.2587441","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thirteenth International Conference on Machine Vision","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2541033646","https://openalex.org/W1983478051","https://openalex.org/W2011448867","https://openalex.org/W2521685458","https://openalex.org/W2068577527","https://openalex.org/W1998091235","https://openalex.org/W2810472406","https://openalex.org/W2034346935","https://openalex.org/W2538366530","https://openalex.org/W838155394"],"abstract_inverted_index":{"For":[0],"the":[1,20,29,36,40,69,74,81,92,100,105,110,114,117],"multi-channel":[2],"collimators":[3],"employed":[4],"in":[5,9,48,80],"SPECT":[6],"measurements":[7],"and":[8,35,79,107,113],"gamma":[10,95],"probes":[11],"(for":[12],"radio":[13],"guided":[14],"surgery)":[15],"an":[16],"approach":[17,27],"to":[18,73,89],"modeling":[19],"functioning":[21],"of":[22,31,45,57,83,94,102,116],"collimator":[23,49,61,103],"is":[24,51],"developed.":[25],"This":[26],"involves":[28],"calculation":[30],"point":[32],"source":[33],"function":[34],"sensitivity":[37,106],"field":[38],"for":[39,59,68,109],"considering":[41],"device.":[42,118],"The":[43,55,64],"effect":[44,93],"finite":[46],"absorption":[47],"material":[50,112],"taken":[52],"into":[53],"account.":[54],"results":[56],"modelling":[58],"confocal":[60],"are":[62],"presented.":[63],"calculations":[65],"were":[66],"performed":[67],"attenuation":[70],"length":[71],"corresponding":[72],"device":[75],"3D-printed":[76],"from":[77],"metal":[78],"assumption":[82],"infinite":[84],"absorption.":[85],"It":[86],"makes":[87],"possible":[88],"estimate":[90],"quantitatively":[91],"photons":[96],"partial":[97],"propagation":[98],"through":[99],"matrix":[101],"on":[104],"resolution":[108],"specified":[111],"geometry":[115]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
